Journal of Applied Crystallography

Volume 2, Part 2 (June 1969)

research papers
short communications
laboratory notes

research papers

J. Appl. Cryst. (1969). 2, 45-48 [doi:10.1107/S0021889869006510]

Revised X-ray diffraction line intensities for silicon carbide polytypes

A. L. Hannam and P. T. B. Shaffer

J. Appl. Cryst. (1969). 2, 48-52 [doi:10.1107/S0021889869006522]

Quantitative Zuordnung von röntgenographisch und mittels chemischer Ätzgruben erfassten Versetzungen bei einer Siliziumprobe

M. Renninger und W. Theis

J. Appl. Cryst. (1969). 2, 52-55 [doi:10.1107/S0021889869006534]

Refraction X par les trichites de cuivre

H. J. Latiere

J. Appl. Cryst. (1969). 2, 55-64 [doi:10.1107/S0021889869006546]

Un nouvel aspect du calcul des distributions de tailles de particules en diffusion centrale des rayons X

H. Brusset et J. R. Donati

J. Appl. Cryst. (1969). 2, 65-71 [doi:10.1107/S0021889869006558]

A profile refinement method for nuclear and magnetic structures

H. M. Rietveld

J. Appl. Cryst. (1969). 2, 72-76 [doi:10.1107/S002188986900656X]

An X-ray method for the determination of domain size from the tails of diffraction profiles

I. S. Szántó and L. Varga

J. Appl. Cryst. (1969). 2, 76-80 [doi:10.1107/S0021889869006571]

Automatic pole figure evaluation

A. Segmüller and J. Angilello

short communications

J. Appl. Cryst. (1969). 2, 81 [doi:10.1107/S0021889869006583]

A small set of reference crystals for double-crystal topography

R. D. Deslattes and B. Paretzkin

J. Appl. Cryst. (1969). 2, 81-82 [doi:10.1107/S0021889869006595]

Crystallographic indexing with a computer program modified for use with the IBM 360 O/S

H. J. Holland and J. A. Gawthrop

J. Appl. Cryst. (1969). 2, 82-84 [doi:10.1107/S0021889869006601]

X-ray study of the effect of palladium on stacking fault densities of Ag-base alloys

M. De

J. Appl. Cryst. (1969). 2, 84-85 [doi:10.1107/S0021889869006613]

Some comments on the methodology of line-broadening analyses

R. L. Rothman and J. B. Cohen

J. Appl. Cryst. (1969). 2, 86-88 [doi:10.1107/S0021889869006625]

Thermal expansion of yttrium and gadolinium iron, gallium and aluminum garnets

S. Geller, G. P. Espinosa and P. B. Crandall

laboratory notes

J. Appl. Cryst. (1969). 2, 88 [doi:10.1107/S0021889869006637]