Journal of Applied Crystallography

Volume 2, Part 6 (December 1969)

research papers
short communications
crystal data
laboratory notes
book reviews
notes and news
international union of crystallography

research papers

J. Appl. Cryst. (1969). 2, 237-240 [doi:10.1107/S0021889869007126]

The identification of the crystal systems by the method of `constant parameters'

G. V. Davydov and V. M. Kharin

J. Appl. Cryst. (1969). 2, 240-246 [doi:10.1107/S0021889869007138]

The intensity distribution and variance of the iron K multiplet

H. J. Edwards and K. Toman

J. Appl. Cryst. (1969). 2, 247-248 [doi:10.1107/S002188986900714X]

Errors in the bond method of lattice parameter determinations - further considerations

J. Burke and M. V. Tomkeieff

J. Appl. Cryst. (1969). 2, 249-252 [doi:10.1107/S0021889869007151]

Plastic deformation in tungsten carbide

D. Lewis and L. J. Porter

J. Appl. Cryst. (1969). 2, 252-254 [doi:10.1107/S0021889869007163]

The crystal structure of Ca₃TeO₆ and Ca₃WO₆

J. A. Baglio and S. Natansohn

J. Appl. Cryst. (1969). 2, 254-259 [doi:10.1107/S0021889869007175]

Electronic measurement of electron microscope intensities and energies

G. R. Bradbury

J. Appl. Cryst. (1969). 2, 259-261 [doi:10.1107/S0021889869007187]

Cathode ray tube display of automatically recorded pole figure data

A. Segmüller

J. Appl. Cryst. (1969). 2, 262-273 [doi:10.1107/S0021889869007199]

Quantitative investigation of domain structures by Berg-Barrett X-ray diffraction microscopy. II. Identification of domains

K. Kranjc

J. Appl. Cryst. (1969). 2, 273-281 [doi:10.1107/S0021889869007205]

The nickel-rich portion of the nickel-cadmium system

H. J. Goldschmidt and M. J. Walker

J. Appl. Cryst. (1969). 2, 281-288 [doi:10.1107/S0021889869007217]

Axial thermal expansion of ZrO₂ and HfO₂ in the range room temperature to 1400°C

R. N. Patil and E. C. Subbarao

J. Appl. Cryst. (1969). 2, 289-295 [doi:10.1107/S0021889869007229]

Slit smearing effects in the Bonse-Hart small-angle X-ray diffractometer

C. C. Gravatt and G. W. Brady

J. Appl. Cryst. (1969). 2, 295-297 [doi:10.1107/S0021889869007230]

A method for determination of the rhombohedral angle of SbSn

C. A. MacKay

J. Appl. Cryst. (1969). 2, 297-300 [doi:10.1107/S0021889869007242]

Tests of a Hankel transform method of determining electron densities of long cylinders from small-angle X-ray scattering data

R. D. Carlson and P. W. Schmidt

short communications

J. Appl. Cryst. (1969). 2, 301-303 [doi:10.1107/S0021889869007254]

The lattice parameter and X-ray powder pattern of U₂C₃

J. F. A. Hennecke and C. J. Toussaint

crystal data

J. Appl. Cryst. (1969). 2, 303-304 [doi:10.1107/S0021889869007266]

Crystal data on two polymorphs of europium disilicate, Eu₂Si₂O₇

J. Felsche

J. Appl. Cryst. (1969). 2, 305-306 [doi:10.1107/S0021889869007278]

Crystallography of (NH₄)₃SiF₆NO₃

G. H. McClellan, K. R. Waerstad and A. W. Frazier

J. Appl. Cryst. (1969). 2, 306-307 [doi:10.1107/S002188986900728X]

X-ray data for triammonium tetrametaphosphate monohydrate

K. R. Waerstad, G. H. McClellan, A. W. Frazier and R. C. Sheridan

laboratory notes

J. Appl. Cryst. (1969). 2, 307-308 [doi:10.1107/S0021889869007291]

Increasing the versatility of the Picker X-ray diffractometer

A. Kidron

J. Appl. Cryst. (1969). 2, 308-309 [doi:10.1107/S0021889869099985]

Flat film Weissenberg attachment for the Polaroid XR-7 cassette

H. Hope

book reviews

J. Appl. Cryst. (1969). 2, 310 [doi:10.1107/S0021889869007308]

Liquid crystals. Proceedings of the International Conference on Liquid Crystals, Kent State University, August 16-20, 1965 edited by G. H. Brown, G. J. Dienes and M. M. Labes

J. Appl. Cryst. (1969). 2, 310-311 [doi:10.1107/S002188986900731X]

The monthly American journal of geology and natural science edited by G. W. Featherstonhaugh

J. Appl. Cryst. (1969). 2, 311 [doi:10.1107/S0021889869007321]

Optical properties of solids edited by S. Nudelmann and S. S. Mitra

notes and news

J. Appl. Cryst. (1969). 2, 311-312 [doi:10.1107/S0021889869007333]

Notes and News

international union of crystallography

J. Appl. Cryst. (1969). 2, 312 [doi:10.1107/S0021889869007345]