Journal of Applied Crystallography

Volume 3, Part 2 (March 1970)



research papers



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J. Appl. Cryst. (1970). 3, 45-49    [doi:10.1107/S0021889870005630]

On the representation of crystal structure results

C. A. Beevers



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J. Appl. Cryst. (1970). 3, 49-59    [doi:10.1107/S0021889870005642]

High-voltage transmission scanning electron microscopy

J. M. Cowley



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J. Appl. Cryst. (1970). 3, 59-65    [doi:10.1107/S0021889870005654]

Corrections for intensity measurements from glass samples

B. E. Warren and R. L. Mozzi



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J. Appl. Cryst. (1970). 3, 66-71    [doi:10.1107/S0021889870005666]

An X-ray multiple diffraction study of crystals of arsenic-doped germanium

B. J. Isherwood and C. A. Wallace



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J. Appl. Cryst. (1970). 3, 71-73    [doi:10.1107/S0021889870005678]

Limitations on the additivity of moments in line-profile analysis

A. J. C. Wilson



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J. Appl. Cryst. (1970). 3, 74-89    [doi:10.1107/S002188987000568X]

X-ray diffraction phenomena in elastically distorted crystals

Y. Ando and N. Kato



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J. Appl. Cryst. (1970). 3, 90-91    [doi:10.1107/S0021889870005691]

Comparison of small angle X-ray scattering data obtained under different collimation conditions

C. G. Weil, P. W. Schmidt, A. Janosi, A. Sekora and O. Kratky



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J. Appl. Cryst. (1970). 3, 92-93    [doi:10.1107/S0021889870005708]

The reliability of the interpretation of powder photographs

K. M. Lester and H. Lipson



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J. Appl. Cryst. (1970). 3, 94-96    [doi:10.1107/S002188987000571X]

The phase transition in [alpha]-U3O8 at 210°C

B. O. Loopstra


short communications



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J. Appl. Cryst. (1970). 3, 97-98    [doi:10.1107/S0021889870005721]

X-ray single crystal structure analysis technique for high temperatures

F. Hanic, Z. Kucera, F. Medved and E. Pluhár



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J. Appl. Cryst. (1970). 3, 99    [doi:10.1107/S0021889870005733]

Limiting crystallite size or lattice strain?

T. Ll. Richards


international union of crystallography



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J. Appl. Cryst. (1970). 3, 100    [doi:10.1107/S0021889870005745]

Opening of new Union office


laboratory notes



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J. Appl. Cryst. (1970). 3, 100    [doi:10.1107/S0021889870005757]

A monochromator for single-crystal X-ray crystallography

S. E. Rasmussen and K. Hendriksen



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J. Appl. Cryst. (1970). 3, 101-102    [doi:10.1107/S0021889870099983]

Centring equipment for X-ray diffractometers and X-ray cameras used with monochromators

S. E. Rasmussen and K. Henriksen



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J. Appl. Cryst. (1970). 3, 102-103    [doi:10.1107/S0021889870099971]

A laboratory and teaching aid in indexing of diffraction films

C. Kowala


forthcoming meetings and short courses



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J. Appl. Cryst. (1970). 3, 103-104    [doi:10.1107/S0021889870005769]

Meetings

News and Meetings Editor


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