Journal of Applied Crystallography
Volume 3, Part 2 (March 1970)
research papers

J. Appl. Cryst. (1970). 3, 45-49 [doi:10.1107/S0021889870005630]
On the representation of crystal structure results
C. A. Beevers

J. Appl. Cryst. (1970). 3, 49-59 [doi:10.1107/S0021889870005642]
High-voltage transmission scanning electron microscopy
J. M. Cowley

J. Appl. Cryst. (1970). 3, 59-65 [doi:10.1107/S0021889870005654]
Corrections for intensity measurements from glass samples
B. E. Warren and R. L. Mozzi

J. Appl. Cryst. (1970). 3, 66-71 [doi:10.1107/S0021889870005666]
An X-ray multiple diffraction study of crystals of arsenic-doped germanium
B. J. Isherwood and C. A. Wallace

J. Appl. Cryst. (1970). 3, 71-73 [doi:10.1107/S0021889870005678]
Limitations on the additivity of moments in line-profile analysis
A. J. C. Wilson

J. Appl. Cryst. (1970). 3, 74-89 [doi:10.1107/S002188987000568X]
X-ray diffraction phenomena in elastically distorted crystals
Y. Ando and N. Kato

J. Appl. Cryst. (1970). 3, 90-91 [doi:10.1107/S0021889870005691]
Comparison of small angle X-ray scattering data obtained under different collimation conditions
C. G. Weil, P. W. Schmidt, A. Janosi, A. Sekora and O. Kratky

J. Appl. Cryst. (1970). 3, 92-93 [doi:10.1107/S0021889870005708]
The reliability of the interpretation of powder photographs
K. M. Lester and H. Lipson

J. Appl. Cryst. (1970). 3, 94-96 [doi:10.1107/S002188987000571X]
The phase transition in
-U3O8 at 210°C
B. O. Loopstra
short communications

J. Appl. Cryst. (1970). 3, 97-98 [doi:10.1107/S0021889870005721]
X-ray single crystal structure analysis technique for high temperatures
F. Hanic, Z. Kucera, F. Medved and E. Pluhár

J. Appl. Cryst. (1970). 3, 99 [doi:10.1107/S0021889870005733]
Limiting crystallite size or lattice strain?
T. Ll. Richards
international union of crystallography

J. Appl. Cryst. (1970). 3, 100 [doi:10.1107/S0021889870005745]
Opening of new Union office
laboratory notes

J. Appl. Cryst. (1970). 3, 100 [doi:10.1107/S0021889870005757]
A monochromator for single-crystal X-ray crystallography
S. E. Rasmussen and K. Hendriksen

J. Appl. Cryst. (1970). 3, 101-102 [doi:10.1107/S0021889870099983]
Centring equipment for X-ray diffractometers and X-ray cameras used with monochromators
S. E. Rasmussen and K. Henriksen

J. Appl. Cryst. (1970). 3, 102-103 [doi:10.1107/S0021889870099971]
A laboratory and teaching aid in indexing of diffraction films
C. Kowala
forthcoming meetings and short courses

J. Appl. Cryst. (1970). 3, 103-104 [doi:10.1107/S0021889870005769]
Meetings
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