Journal of Applied Crystallography

Volume 3, Part 3 (June 1970)

• research papers
• short communications
• crystal data
• notes and news
• book reviews

research papers

J. Appl. Cryst. (1970). 3, 105-110    [doi:10.1107/S0021889870005770]

Graphitation partielle de quelques carbones durs. Etude en microscopie et microdiffraction electronique

A. Oberlin et F. Rousseaux

J. Appl. Cryst. (1970). 3, 110-112    [doi:10.1107/S0021889870005782]

X-ray diffraction method for measurement of elastic strain

M. Hnilicka and R. Fiedler

J. Appl. Cryst. (1970). 3, 112-120    [doi:10.1107/S0021889870005794]

A qualitative X-ray diffraction study of the 205°K and 151°K phase transformations in praseodymium aluminate (PrAlO₃)

R. D. Burbank

J. Appl. Cryst. (1970). 3, 120-123    [doi:10.1107/S0021889870005800]

A computer program for X-ray line broadening analysis

M. S. Rashid and C. J. Altstetter

J. Appl. Cryst. (1970). 3, 123-137    [doi:10.1107/S0021889870005812]

Détermination des coefficients d'ordre à courte distance de solutions solides polycristallines. Comparaison de deux techniques d'analyse mathématique du profil d'intensité des rayons X diffusés

C. Frantz, G. Le Caer et M. Gantois

J. Appl. Cryst. (1970). 3, 137-145    [doi:10.1107/S0021889870005824]

Comparison of two methods for calculating slit-length collimation corrections in small angle X-ray scattering

P. W. Schmidt

J. Appl. Cryst. (1970). 3, 145-153    [doi:10.1107/S0021889870005836]

Collimation corrections in small angle scattering of neutrons

M. Antonini, A. Daneri and G. Toselli

J. Appl. Cryst. (1970). 3, 153-156    [doi:10.1107/S0021889870005848]

Calculation of profiles of two-dimensional X-ray reflections from layered structures

S. Ergun

J. Appl. Cryst. (1970). 3, 157-164    [doi:10.1107/S002188987000585X]

Correction for the satellite group in the variance method of profile analysis

H. J. Edwards and K. Toman

J. Appl. Cryst. (1970). 3, 165-171    [doi:10.1107/S0021889870005861]

The additivity of variances in powder diffraction profile analysis

H. J. Edwards and K. Toman

J. Appl. Cryst. (1970). 3, 172-174    [doi:10.1107/S0021889870005873]

Growth of -silicon carbide on silicon

A. S. Brown and B. E. Watts

short communications

J. Appl. Cryst. (1970). 3, 175-178    [doi:10.1107/S0021889870005885]

Crystal data of new basic alkali cobalt(II) sulphates

E. Dubler and H. R. Oswald

J. Appl. Cryst. (1970). 3, 179-180    [doi:10.1107/S0021889870005897]

On refinement of the crystal orientation matrix and lattice constants with diffractometer data. II

D. P. Schoemaker

J. Appl. Cryst. (1970). 3, 180-181    [doi:10.1107/S0021889870005903]

Elimination of spot doubling in precession photography without layer-line screens

J. R. Einstein

J. Appl. Cryst. (1970). 3, 182-183    [doi:10.1107/S0021889870005915]

Comparison of some small-angle X-ray collimation correction programs

P. Kent and H. Brumberger

J. Appl. Cryst. (1970). 3, 183-185    [doi:10.1107/S0021889870005927]

Radial distribution functions in X-ray diffraction studies of liquid water

C. Dejak, G. Licheri and G. Piccaluga

J. Appl. Cryst. (1970). 3, 185-187    [doi:10.1107/S0021889870005939]

The construction of atomic projections by computer

J. C. Minor and D. J. Dyson

J. Appl. Cryst. (1970). 3, 187-188    [doi:10.1107/S0021889870005940]

An alignment procedure for the Kratky small-angle X-ray camera

J. W. Anderegg, P. G. Mardon and R. W. Hendricks

J. Appl. Cryst. (1970). 3, 188-191    [doi:10.1107/S0021889870005952]

X-ray powder diffraction data for calcium monoaluminate and calcium dialuminate

P. J. Baldock, A. Parker and I. Sladdin

J. Appl. Cryst. (1970). 3, 191-193    [doi:10.1107/S0021889870005964]

The equation of pseudo-Kossel curves

B. A. Newman

crystal data

J. Appl. Cryst. (1970). 3, 193    [doi:10.1107/S0021889870005976]

Crystal data on cubic ytterbium(II) iodide, YbI₂

J. K. Howell and L. L. Pytlewski

J. Appl. Cryst. (1970). 3, 194-195    [doi:10.1107/S0021889870005988]

Crystal data on n-eicosane (C₂₀H₄₂)

J. M. Crissman, E. Passaglia, R. K. Eby and J. P. Colson

notes and news

J. Appl. Cryst. (1970). 3, 195    [doi:10.1107/S002188987000599X]

Notes and News

book reviews

J. Appl. Cryst. (1970). 3, 195    [doi:10.1107/S0021889870006003]

Principles of X-ray metallurgy by T. Kovacs

J. Appl. Cryst. (1970). 3, 196    [doi:10.1107/S0021889870006015]

Growing crystals from solutions by T. G. Petrov, E. B. Treivus and A. P. Kasatkin

J. Appl. Cryst. (1970). 3, 196    [doi:10.1107/S0021889870006027]

Modern geology. Vol. 1. No. 1 edited by L. B. Ronca

Copyright © International Union of Crystallography
IUCr Webmaster