Journal of Applied Crystallography

Volume 3, Part 5 (October 1970)

• research papers
• short communications
• reference information
• laboratory notes
• international union of crystallography
• notes and news
• crystallographers
• forthcoming meetings and short courses
• calendar of events
• book reviews

research papers

J. Appl. Cryst. (1970). 3, 289-294    [doi:10.1107/S0021889870006313]

Neutron diffraction cryo-orienter

L. Heaton, M. H. Mueller, M. F. Adam and R. L. Hitterman

J. Appl. Cryst. (1970). 3, 294-296    [doi:10.1107/S0021889870006325]

X-ray diffraction studies of the Hg-In alloy system

Y. P. Mascarenhas

J. Appl. Cryst. (1970). 3, 297-305    [doi:10.1107/S0021889870006337]

Short-range order in a gold-40.0 atomic per cent palladium alloy

W. Lin, J. E. Spruiell and R. O. Williams

J. Appl. Cryst. (1970). 3, 305-313    [doi:10.1107/S0021889870006349]

A computer program for the calculation of lattice spacings from Kossel diffraction patterns

D. G. Fisher and N. Harris

J. Appl. Cryst. (1970). 3, 313-318    [doi:10.1107/S0021889870006350]

Correction of integrated X-ray intensities for preferred orientation in cubic powders

M. Järvinen, M. Merisalo, A. Pesonen and O. Inkinen

J. Appl. Cryst. (1970). 3, 319-328    [doi:10.1107/S0021889870006362]

Long-period stacking order of oxygen atoms dissolved in -zirconium near the composition ZrO_1/3

S. Yamaguchi and M. Hirabayashi

J. Appl. Cryst. (1970). 3, 328-332    [doi:10.1107/S0021889870006374]

An X-ray test of the polarity of silicon carbide crystals

C. A. Wallace

J. Appl. Cryst. (1970). 3, 332-341    [doi:10.1107/S0021889870006386]

Mechanische, geometrische und elektronische Fehler bei Messungen mit Einkristalldiffraktometern

J. Eck und L. Riechert

J. Appl. Cryst. (1970). 3, 342-348    [doi:10.1107/S0021889870006398]

The simultaneous determination of the Burgers vectors of dislocations in twin related or coincidence site related crystals

M. Bevis and D. I. Tomsett

J. Appl. Cryst. (1970). 3, 348-353    [doi:10.1107/S0021889870006404]

Two modifications of the Kratky small-angle X-ray camera

R. W. Hendricks

J. Appl. Cryst. (1970). 3, 354-357    [doi:10.1107/S0021889870006416]

Analysis of the axial misalignment error in precision lattice parameter measurement by the Bond technique

E. E. Gruber and R. E. Black

J. Appl. Cryst. (1970). 3, 357-360    [doi:10.1107/S0021889870006428]

Dilation of the -Fe lattice by manganese

L. Zwell, J. T. Michalak and H. A. Wriedt

J. Appl. Cryst. (1970). 3, 361-371    [doi:10.1107/S002188987000643X]

Neutron monochromator response based on the secondary extinction Green's function for Bragg geometry

J. S. Desjardins

J. Appl. Cryst. (1970). 3, 372-379    [doi:10.1107/S0021889870006441]

Seeman-Bohlin X-ray diffractometer for thin films

R. Feder and B. S. Berry

J. Appl. Cryst. (1970). 3, 379-384    [doi:10.1107/S0021889870006453]

Absolute power measurements in small angle X-ray scattering with gas scattering calibration

L. B. Shaffer and W. W. Beeman

J. Appl. Cryst. (1970). 3, 385-388    [doi:10.1107/S0021889870006465]

X-ray scattering effects of ionic size in solid solutions KCl-KBr

P. Luova, P. Tuominen and P. Vanha-Kämppä

J. Appl. Cryst. (1970). 3, 389-392    [doi:10.1107/S0021889870006477]

Structure types of potassium and rubidium molybdate and tungstate at elevated temperatures

A. W. M. van den Akker, A. S. Koster and G. D. Rieck

J. Appl. Cryst. (1970). 3, 392-395    [doi:10.1107/S0021889870006489]

Three-dimensional graphical models of molecules and a time-slicing computer

E. Meyer

J. Appl. Cryst. (1970). 3, 395-399    [doi:10.1107/S0021889870006490]

Lithium tantalate single crystal stoichiometry

R. L. Barns and J. R. Carruthers

J. Appl. Cryst. (1970). 3, 399-400    [doi:10.1107/S0021889870006507]

Unit-cell refinement by the solution of an overdetermined system of linear equations

G. H. Cheesman and A. J. T. Finney

J. Appl. Cryst. (1970). 3, 400-403    [doi:10.1107/S0021889870006519]

Orientation of microcrystals for X-ray diffraction studies

G. J. L. Griffin and D. K. Majumdar

short communications

J. Appl. Cryst. (1970). 3, 404-405    [doi:10.1107/S0021889870006520]

An anomalous beam observed in X-ray diffraction topographs

Y. Ando

J. Appl. Cryst. (1970). 3, 405-406    [doi:10.1107/S0021889870006532]

Bragg's law and energy sensitive detectors

H. Cole

J. Appl. Cryst. (1970). 3, 407    [doi:10.1107/S0021889870006556]

On the possibility of a parabolic parallelizing monochromator

A. J. C. Wilson

J. Appl. Cryst. (1970). 3, 407-409    [doi:10.1107/S0021889870006544]

Correlation of measured and theoretically calculated microstrains in deformed f.c.c. metals

F.-W. Ling and E. A. Starke

J. Appl. Cryst. (1970). 3, 409-410    [doi:10.1107/S0021889870006568]

High-speed X-ray diffraction photography

C. T. Prewitt, E. P. Moore and L. F. Lardear

J. Appl. Cryst. (1970). 3, 410-412    [doi:10.1107/S002188987000657X]

On the occurrence of extrinsic stacking faults in some copper-base and silver-base alloys

S. P. Sen Gupta and M. De

J. Appl. Cryst. (1970). 3, 413-417    [doi:10.1107/S0021889870006581]

Phase in Ti-30% V alloy

E. U. Lee

J. Appl. Cryst. (1970). 3, 417    [doi:10.1107/S0021889870006593]

Crystal growth and dimorphism of lithium iodate LiIO₃

T. Unezawa, Y. Ninomiya and S. Tatuoka

J. Appl. Cryst. (1970). 3, 418-419    [doi:10.1107/S002188987000660X]

Measurement of specimen tilt and beam tilt in the Bond method

M. A. G. Halliwell

J. Appl. Cryst. (1970). 3, 419-421    [doi:10.1107/S0021889870006611]

Computerized gnomonic projection chart for determining orientations of single crystals from Kossel patterns

G. Ferran and R. A. Wood

reference information

J. Appl. Cryst. (1970). 3, 421    [doi:10.1107/S0021889870006623]

Generation of -SiC stacking sequences

R. B. Roof Jnr and R. L. Bivins

laboratory notes

J. Appl. Cryst. (1970). 3, 422    [doi:10.1107/S0021889870006635]

A method of enclosing highly deliquescent or subliming specimens for X-ray single-crystal data collection

R. J. Nelmes

J. Appl. Cryst. (1970). 3, 422    [doi:10.1107/S0021889870099995]

Marking a direction on a crystal

R. Barton Jr

international union of crystallography

J. Appl. Cryst. (1970). 3, 423    [doi:10.1107/S0021889870006647]

Commission on Crystallographic Apparatus

J. Appl. Cryst. (1970). 3, 423    [doi:10.1107/S0021889870006957]

International Tables for X-ray Crystallography

notes and news

J. Appl. Cryst. (1970). 3, 424    [doi:10.1107/S0021889870006659]

Notes and News

crystallographers

J. Appl. Cryst. (1970). 3, 424-425    [doi:10.1107/S0021889870006660]

Crystallographers

forthcoming meetings and short courses

J. Appl. Cryst. (1970). 3, 425    [doi:10.1107/S0021889870006672]

Meetings and Short Courses

calendar of events

J. Appl. Cryst. (1970). 3, 425    [doi:10.1107/S0021889870006684]

Calendar of Events

book reviews

J. Appl. Cryst. (1970). 3, 426    [doi:10.1107/S0021889870006696]

Handbook of Geochemistry. Vols. I and II/1 edited by K. H. Wedepohl

J. Appl. Cryst. (1970). 3, 426-428    [doi:10.1107/S0021889870006702]

An introduction to rock forming minerals. Vols. I-V by W. A. Deer, R. A. Howie and J. Zussman

J. Appl. Cryst. (1970). 3, 428    [doi:10.1107/S0021889870006969]

X-ray diffraction methods in polymer science by L. E. Alexander

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