Journal of Applied Crystallography

Volume 4, Part 3 (June 1971)

research papers
short communications
computer programs
crystal data
laboratory notes
international union of crystallography
notes and news
crystallographers
book reviews
meeting reports

research papers

J. Appl. Cryst. (1971). 4, 185-190 [doi:10.1107/S0021889871006666]

Measurements of absolute reflectivities of mosaic crystals and their wavelength dependence

B. Dorner

J. Appl. Cryst. (1971). 4, 190-193 [doi:10.1107/S0021889871006678]

X-ray line broadening by porous crystals

W. G. Spencer

J. Appl. Cryst. (1971). 4, 193-196 [doi:10.1107/S002188987100668X]

Charts for analysing crystallite orientation distribution function plots for hexagonal materials

G. J. Davies, D. J. Goodwill and J. S. Kallend

J. Appl. Cryst. (1971). 4, 196-201 [doi:10.1107/S0021889871006691]

A graphic display program for crystal structure illustrations

A. G. Nord

J. Appl. Cryst. (1971). 4, 201-204 [doi:10.1107/S0021889871006708]

Precision determination of lattice parameters at low temperatures without the use of liquid gases

C. L. Woodard and M. E. Straumanis

J. Appl. Cryst. (1971). 4, 204-207 [doi:10.1107/S002188987100671X]

A masked film cassette for utilization of the multiple film technique in precession photography

B. J. Wuensch and R. L. Thomas Jnr

J. Appl. Cryst. (1971). 4, 207-209 [doi:10.1107/S0021889871006721]

Production of pits and hillocks on (111) faces of synthetic diamond by etching

A. R. Patel and T. C. Patel

J. Appl. Cryst. (1971). 4, 210-223 [doi:10.1107/S0021889871006733]

Application of spline functions to the correction of resolution errors in small-angle scattering

J. Schelten and F. Hossfeld

J. Appl. Cryst. (1971). 4, 224-231 [doi:10.1107/S0021889871006745]

Intersect distributions and small-angle X-ray scattering theory

H.-I. Wu and P. W. Schmidt

J. Appl. Cryst. (1971). 4, 232-240 [doi:10.1107/S0021889871006757]

A single-exposure method for the determination of lattice spacings and crystal orientation from Kossel diffraction patterns

N. Harris and A. J. Kirkham

J. Appl. Cryst. (1971). 4, 240-241 [doi:10.1107/S0021889871006769]

An X-ray diffraction method for lattice parameter measurements from corresponding K and K reflexions

S. Popovic

J. Appl. Cryst. (1971). 4, 242-250 [doi:10.1107/S0021889871006770]

The precise determination of the lattice parameter of -iron and some of its alloys

A. Lutts and P. Gielen

short communications

J. Appl. Cryst. (1971). 4, 251-252 [doi:10.1107/S0021889871006782]

Scanning source X-ray topography

A. D. Milne

J. Appl. Cryst. (1971). 4, 252-254 [doi:10.1107/S0021889871006794]

Double diffraction between Bragg reflections and planes of diffuse intensity observed with high energy electron diffraction

S. L. Sass

J. Appl. Cryst. (1971). 4, 254-255 [doi:10.1107/S0021889871006800]

A self-regulating mini-cooler for three-dimensional single-crystal neutron-diffraction measurements

F. R. Ebdon and D. A. Wheeler

J. Appl. Cryst. (1971). 4, 256 [doi:10.1107/S0021889871006812]

Crystallographic data for an orthorhombic form of rubrene

D. E. Henn, W. G. Williams and D. J. Gibbons

J. Appl. Cryst. (1971). 4, 257-259 [doi:10.1107/S0021889871006824]

A metastable phase TiCu₃(m)

B. C. Giessen and D. Szymanski

computer programs

J. Appl. Cryst. (1971). 4, 259-260 [doi:10.1107/S0021889871006836]

Powder pattern programs

J. I. Langford

J. Appl. Cryst. (1971). 4, 260-261 [doi:10.1107/S0021889871006848]

A computer program for inverse pole figure statistics

W. Dubroff

crystal data

J. Appl. Cryst. (1971). 4, 261-262 [doi:10.1107/S002188987100685X]

New crystal data on dioxygenyl tetrafluoroborate, O₂BF₄

J. N. Wilson, R. M. Curtis and C. T. Goetschel

laboratory notes

J. Appl. Cryst. (1971). 4, 263 [doi:10.1107/S0021889871006861]

A fast and efficient technique for fixing specimens to electron microscope grids

C. J. Ryan

J. Appl. Cryst. (1971). 4, 263-264 [doi:10.1107/S0021889871099941]

Cooling apparatus for a single-crystal X-ray diffractometer

F. van Bolhuis

international union of crystallography

J. Appl. Cryst. (1971). 4, 264-268 [doi:10.1107/S0021889871006873]

Commission on Crystallographic Computing

J. Appl. Cryst. (1971). 4, 268-269 [doi:10.1107/S0021889871007660]

Commission on Crystallographic Apparatus

notes and news

J. Appl. Cryst. (1971). 4, 269 [doi:10.1107/S0021889871006885]

Notes and News

crystallographers

J. Appl. Cryst. (1971). 4, 269 [doi:10.1107/S0021889871006897]

Crystallographers

book reviews

J. Appl. Cryst. (1971). 4, 270 [doi:10.1107/S0021889871006903]

Crystal growth in gels by H. K. Henisch

J. Appl. Cryst. (1971). 4, 270 [doi:10.1107/S0021889871006915]

Diffusion processes in iron alloys by M. A. Krishtal

J. Appl. Cryst. (1971). 4, 270-271 [doi:10.1107/S0021889871006927]

Diffusion processes in metals edited by V. N. Svechnikov

J. Appl. Cryst. (1971). 4, 271 [doi:10.1107/S0021889871006939]

Micron - The International Journal of Electron Microscopy, Electon Probe Micro-analysis and Associated Techniques

J. Appl. Cryst. (1971). 4, 271 [doi:10.1107/S0021889871006940]

Principles of structural metallurgy by B. Harcopos

J. Appl. Cryst. (1971). 4, 271-272 [doi:10.1107/S0021889871006952]

An outline of crystal morphology by A. C. Bishop

meeting reports

J. Appl. Cryst. (1971). 4, 272-276 [doi:10.1107/S0021889871006964]