Journal of Applied Crystallography

Volume 4, Part 3 (June 1971)



research papers



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J. Appl. Cryst. (1971). 4, 185-190    [doi:10.1107/S0021889871006666]

Measurements of absolute reflectivities of mosaic crystals and their wavelength dependence

B. Dorner



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J. Appl. Cryst. (1971). 4, 190-193    [doi:10.1107/S0021889871006678]

X-ray line broadening by porous crystals

W. G. Spencer



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J. Appl. Cryst. (1971). 4, 193-196    [doi:10.1107/S002188987100668X]

Charts for analysing crystallite orientation distribution function plots for hexagonal materials

G. J. Davies, D. J. Goodwill and J. S. Kallend



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J. Appl. Cryst. (1971). 4, 196-201    [doi:10.1107/S0021889871006691]

A graphic display program for crystal structure illustrations

A. G. Nord



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J. Appl. Cryst. (1971). 4, 201-204    [doi:10.1107/S0021889871006708]

Precision determination of lattice parameters at low temperatures without the use of liquid gases

C. L. Woodard and M. E. Straumanis



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J. Appl. Cryst. (1971). 4, 204-207    [doi:10.1107/S002188987100671X]

A masked film cassette for utilization of the multiple film technique in precession photography

B. J. Wuensch and R. L. Thomas Jnr



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J. Appl. Cryst. (1971). 4, 207-209    [doi:10.1107/S0021889871006721]

Production of pits and hillocks on (111) faces of synthetic diamond by etching

A. R. Patel and T. C. Patel



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J. Appl. Cryst. (1971). 4, 210-223    [doi:10.1107/S0021889871006733]

Application of spline functions to the correction of resolution errors in small-angle scattering

J. Schelten and F. Hossfeld



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J. Appl. Cryst. (1971). 4, 224-231    [doi:10.1107/S0021889871006745]

Intersect distributions and small-angle X-ray scattering theory

H.-I. Wu and P. W. Schmidt



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J. Appl. Cryst. (1971). 4, 232-240    [doi:10.1107/S0021889871006757]

A single-exposure method for the determination of lattice spacings and crystal orientation from Kossel diffraction patterns

N. Harris and A. J. Kirkham



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J. Appl. Cryst. (1971). 4, 240-241    [doi:10.1107/S0021889871006769]

An X-ray diffraction method for lattice parameter measurements from corresponding K[alpha] and K[beta] reflexions

S. Popovic



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J. Appl. Cryst. (1971). 4, 242-250    [doi:10.1107/S0021889871006770]

The precise determination of the lattice parameter of [alpha]-iron and some of its alloys

A. Lutts and P. Gielen


short communications



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J. Appl. Cryst. (1971). 4, 251-252    [doi:10.1107/S0021889871006782]

Scanning source X-ray topography

A. D. Milne



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J. Appl. Cryst. (1971). 4, 252-254    [doi:10.1107/S0021889871006794]

Double diffraction between Bragg reflections and planes of diffuse intensity observed with high energy electron diffraction

S. L. Sass



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J. Appl. Cryst. (1971). 4, 254-255    [doi:10.1107/S0021889871006800]

A self-regulating mini-cooler for three-dimensional single-crystal neutron-diffraction measurements

F. R. Ebdon and D. A. Wheeler



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J. Appl. Cryst. (1971). 4, 256    [doi:10.1107/S0021889871006812]

Crystallographic data for an orthorhombic form of rubrene

D. E. Henn, W. G. Williams and D. J. Gibbons



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J. Appl. Cryst. (1971). 4, 257-259    [doi:10.1107/S0021889871006824]

A metastable phase TiCu3(m)

B. C. Giessen and D. Szymanski


computer programs



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J. Appl. Cryst. (1971). 4, 259-260    [doi:10.1107/S0021889871006836]

Powder pattern programs

J. I. Langford



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J. Appl. Cryst. (1971). 4, 260-261    [doi:10.1107/S0021889871006848]

A computer program for inverse pole figure statistics

W. Dubroff


crystal data



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J. Appl. Cryst. (1971). 4, 261-262    [doi:10.1107/S002188987100685X]

New crystal data on dioxygenyl tetrafluoroborate, O2BF4

J. N. Wilson, R. M. Curtis and C. T. Goetschel


laboratory notes



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J. Appl. Cryst. (1971). 4, 263    [doi:10.1107/S0021889871006861]

A fast and efficient technique for fixing specimens to electron microscope grids

C. J. Ryan



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J. Appl. Cryst. (1971). 4, 263-264    [doi:10.1107/S0021889871099941]

Cooling apparatus for a single-crystal X-ray diffractometer

F. van Bolhuis


international union of crystallography



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J. Appl. Cryst. (1971). 4, 264-268    [doi:10.1107/S0021889871006873]

Commission on Crystallographic Computing



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J. Appl. Cryst. (1971). 4, 268-269    [doi:10.1107/S0021889871007660]

Commission on Crystallographic Apparatus


notes and news



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J. Appl. Cryst. (1971). 4, 269    [doi:10.1107/S0021889871006885]

Notes and News


crystallographers



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J. Appl. Cryst. (1971). 4, 269    [doi:10.1107/S0021889871006897]

Crystallographers


book reviews



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J. Appl. Cryst. (1971). 4, 270    [doi:10.1107/S0021889871006903]

Crystal growth in gels by H. K. Henisch



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J. Appl. Cryst. (1971). 4, 270    [doi:10.1107/S0021889871006915]

Diffusion processes in iron alloys by M. A. Krishtal



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J. Appl. Cryst. (1971). 4, 270-271    [doi:10.1107/S0021889871006927]

Diffusion processes in metals edited by V. N. Svechnikov



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J. Appl. Cryst. (1971). 4, 271    [doi:10.1107/S0021889871006939]

Micron - The International Journal of Electron Microscopy, Electon Probe Micro-analysis and Associated Techniques



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J. Appl. Cryst. (1971). 4, 271    [doi:10.1107/S0021889871006940]

Principles of structural metallurgy by B. Harcopos



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J. Appl. Cryst. (1971). 4, 271-272    [doi:10.1107/S0021889871006952]

An outline of crystal morphology by A. C. Bishop


meeting reports



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J. Appl. Cryst. (1971). 4, 272-276    [doi:10.1107/S0021889871006964]

Meeting Reports


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