Journal of Applied Crystallography

Volume 4, Part 4 (August 1971)

• research papers
• short communications
• computer programs
• laboratory notes
• international union of crystallography
• crystallographers

research papers

J. Appl. Cryst. (1971). 4, 277-283    [doi:10.1107/S0021889871006976]

Influence of neglected small-angle scattering in radial distribution function analysis

G. S. Cargill III

J. Appl. Cryst. (1971). 4, 284-290    [doi:10.1107/S0021889871006988]

Application of normal probability plot analysis to lutetium orthoborate factors and parameters

S. C. Abrahams, J. L. Bernstein and E. T. Keve

J. Appl. Cryst. (1971). 4, 290-293    [doi:10.1107/S002188987100699X]

Small-angle X-ray scattering from helical macromolecules

O. A. Pringle and P. W. Schmidt

J. Appl. Cryst. (1971). 4, 293-297    [doi:10.1107/S0021889871007003]

A high-temperature X-ray diffraction study of the NiO-Li₂O system

C. J. Toussaint

J. Appl. Cryst. (1971). 4, 297-302    [doi:10.1107/S0021889871007015]

A new film instrument for the exploration of reciprocal space

E. R. Wölfel

J. Appl. Cryst. (1971). 4, 303-310    [doi:10.1107/S0021889871007027]

The development of the rolling texture in copper measured by neutron diffraction

H. J. Bunge, J. Tobisch and W. Sonntag

J. Appl. Cryst. (1971). 4, 311-316    [doi:10.1107/S0021889871007039]

Analysis of powder diffraction patterns of monoclinic and triclinic crystals

T. Ishida and Y. Watanabe

J. Appl. Cryst. (1971). 4, 317-318    [doi:10.1107/S0021889871007040]

Determination of small alterations in the radius of gyration by small-angle X-ray scattering

I. Simon

short communications

J. Appl. Cryst. (1971). 4, 319-321    [doi:10.1107/S0021889871007052]

The non-additivity and curvature corrections in the variance method of X-ray line-broadening analysis

H. J. Edwards and K. Toman

J. Appl. Cryst. (1971). 4, 321-324    [doi:10.1107/S0021889871007064]

Réalisation de canevas stéréographiques pour l'interprétation de figures de pôles

D. Ruer et R. Baro

J. Appl. Cryst. (1971). 4, 324-326    [doi:10.1107/S0021889871007076]

A multi-wavelength neutron monochromator system

M. J. Cooper and J. B. Forsyth

J. Appl. Cryst. (1971). 4, 326-328    [doi:10.1107/S0021889871007088]

X-ray diffraction data on U₃Si

R. R. Boucher

J. Appl. Cryst. (1971). 4, 328-329    [doi:10.1107/S002188987100709X]

The convergence of the van Cittert method of deconvolution

W. Ruland

J. Appl. Cryst. (1971). 4, 329-330    [doi:10.1107/S0021889871007106]

Stacking disorder in martensite with 3R close-packed structure

S. Kajiwara

J. Appl. Cryst. (1971). 4, 331-332    [doi:10.1107/S0021889871007118]

A device for in situ -irradiation of diffractometer mounted single crystals

W. A. Denne, S. Janky and R. Venn

computer programs

J. Appl. Cryst. (1971). 4, 332-333    [doi:10.1107/S002188987100712X]

Profile-analysis computer program

H. J. Edwards and K. Toman

laboratory notes

J. Appl. Cryst. (1971). 4, 333    [doi:10.1107/S0021889871007131]

Apparatus for growth of crystals for X-ray diffraction study

H. Hope

J. Appl. Cryst. (1971). 4, 334    [doi:10.1107/S0021889871099977]

Optical properties of thiourea

J. W. Jeffery

J. Appl. Cryst. (1971). 4, 334-335    [doi:10.1107/S0021889871099965]

A modified design of a metal ribbon furnace for high temperature X-ray diffraction

K. Jenssen and J. Krogh-Moe

J. Appl. Cryst. (1971). 4, 335    [doi:10.1107/S0021889871099953]

A method for encapsulating specimens of Yb and Ca-Yb alloys for X-ray diffraction examination

F. X. Kayser and G. L. Stowe

international union of crystallography

J. Appl. Cryst. (1971). 4, 336    [doi:10.1107/S0021889871007143]

Acta Crystallographica and Journals of Applied Crystallography

crystallographers

J. Appl. Cryst. (1971). 4, 336    [doi:10.1107/S0021889871007155]

Crystallographers

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