Journal of Applied Crystallography

Volume 4, Part 4 (August 1971)



research papers



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J. Appl. Cryst. (1971). 4, 277-283    [doi:10.1107/S0021889871006976]

Influence of neglected small-angle scattering in radial distribution function analysis

G. S. Cargill III



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J. Appl. Cryst. (1971). 4, 284-290    [doi:10.1107/S0021889871006988]

Application of normal probability plot analysis to lutetium orthoborate factors and parameters

S. C. Abrahams, J. L. Bernstein and E. T. Keve



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J. Appl. Cryst. (1971). 4, 290-293    [doi:10.1107/S002188987100699X]

Small-angle X-ray scattering from helical macromolecules

O. A. Pringle and P. W. Schmidt



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J. Appl. Cryst. (1971). 4, 293-297    [doi:10.1107/S0021889871007003]

A high-temperature X-ray diffraction study of the NiO-Li2O system

C. J. Toussaint



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J. Appl. Cryst. (1971). 4, 297-302    [doi:10.1107/S0021889871007015]

A new film instrument for the exploration of reciprocal space

E. R. Wölfel



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J. Appl. Cryst. (1971). 4, 303-310    [doi:10.1107/S0021889871007027]

The development of the rolling texture in copper measured by neutron diffraction

H. J. Bunge, J. Tobisch and W. Sonntag



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J. Appl. Cryst. (1971). 4, 311-316    [doi:10.1107/S0021889871007039]

Analysis of powder diffraction patterns of monoclinic and triclinic crystals

T. Ishida and Y. Watanabe



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J. Appl. Cryst. (1971). 4, 317-318    [doi:10.1107/S0021889871007040]

Determination of small alterations in the radius of gyration by small-angle X-ray scattering

I. Simon


short communications



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J. Appl. Cryst. (1971). 4, 319-321    [doi:10.1107/S0021889871007052]

The non-additivity and curvature corrections in the variance method of X-ray line-broadening analysis

H. J. Edwards and K. Toman



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J. Appl. Cryst. (1971). 4, 321-324    [doi:10.1107/S0021889871007064]

Réalisation de canevas stéréographiques pour l'interprétation de figures de pôles

D. Ruer et R. Baro



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J. Appl. Cryst. (1971). 4, 324-326    [doi:10.1107/S0021889871007076]

A multi-wavelength neutron monochromator system

M. J. Cooper and J. B. Forsyth



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J. Appl. Cryst. (1971). 4, 326-328    [doi:10.1107/S0021889871007088]

X-ray diffraction data on U3Si

R. R. Boucher



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J. Appl. Cryst. (1971). 4, 328-329    [doi:10.1107/S002188987100709X]

The convergence of the van Cittert method of deconvolution

W. Ruland



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J. Appl. Cryst. (1971). 4, 329-330    [doi:10.1107/S0021889871007106]

Stacking disorder in martensite with 3R close-packed structure

S. Kajiwara



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J. Appl. Cryst. (1971). 4, 331-332    [doi:10.1107/S0021889871007118]

A device for in situ [alpha]-irradiation of diffractometer mounted single crystals

W. A. Denne, S. Janky and R. Venn


computer programs



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J. Appl. Cryst. (1971). 4, 332-333    [doi:10.1107/S002188987100712X]

Profile-analysis computer program

H. J. Edwards and K. Toman


laboratory notes



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J. Appl. Cryst. (1971). 4, 333    [doi:10.1107/S0021889871007131]

Apparatus for growth of crystals for X-ray diffraction study

H. Hope



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J. Appl. Cryst. (1971). 4, 334    [doi:10.1107/S0021889871099977]

Optical properties of thiourea

J. W. Jeffery



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J. Appl. Cryst. (1971). 4, 334-335    [doi:10.1107/S0021889871099965]

A modified design of a metal ribbon furnace for high temperature X-ray diffraction

K. Jenssen and J. Krogh-Moe



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J. Appl. Cryst. (1971). 4, 335    [doi:10.1107/S0021889871099953]

A method for encapsulating specimens of Yb and Ca-Yb alloys for X-ray diffraction examination

F. X. Kayser and G. L. Stowe


international union of crystallography



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J. Appl. Cryst. (1971). 4, 336    [doi:10.1107/S0021889871007143]

Acta Crystallographica and Journals of Applied Crystallography


crystallographers



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J. Appl. Cryst. (1971). 4, 336    [doi:10.1107/S0021889871007155]

Crystallographers


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