Journal of Applied Crystallography
Volume 4, Part 5 (October 1971)
research papers
J. Appl. Cryst. (1971). 4, 337-339 [doi:10.1107/S0021889871007167]
The elimination of specimen and beam tilt errors in the Bond method of precision lattice parameter determinations
V. Walder and J. Burke
J. Appl. Cryst. (1971). 4, 340-342 [doi:10.1107/S0021889871007179]
A procedure for desmearing X-ray small-angle scattering curves
C. G. Vonk
J. Appl. Cryst. (1971). 4, 343-347 [doi:10.1107/S0021889871007180]
Crystallographic investigations of the phase transition of VO2
I. Kawada, N. Kimizuka and M. Nakahira
J. Appl. Cryst. (1971). 4, 347-351 [doi:10.1107/S0021889871007192]
Scattering from a multiphase system
J. Goodisman and H. Brumberger
J. Appl. Cryst. (1971). 4, 352-356 [doi:10.1107/S0021889871007209]
A hemispherical furnace for high-temperature single crystal X-ray diffraction studies
R. W. Lynch and B. Morosin
J. Appl. Cryst. (1971). 4, 356-370 [doi:10.1107/S0021889871007210]
Generation and applications of computer drawn Kikuchi maps
J. L. Bomback and L. E. Thomas
J. Appl. Cryst. (1971). 4, 370-375 [doi:10.1107/S0021889871007222]
A study of the strain field of grown-in dislocations in a silicon X-ray interferometer
G. Christiansen, L. Gerward and A. L. Andersen
J. Appl. Cryst. (1971). 4, 376-379 [doi:10.1107/S0021889871007234]
X-ray study of tetragonal PbO electrolytically deposited on rolled Pb substrate
S. B. Brody and M. P. Seitelman
J. Appl. Cryst. (1971). 4, 379-383 [doi:10.1107/S0021889871007246]
Evaporation and solution morphologies of ZnO single crystals
G. A. Wolff, B. N. Das and F. H. Cocks
J. Appl. Cryst. (1971). 4, 383-387 [doi:10.1107/S0021889871007258]
Etude de comportement de chalcogènes pulverulents sous irradiation par un faisceau d'electrons rapides
E. Belin, C. Bonnelle and E. Delafosse
J. Appl. Cryst. (1971). 4, 387-395 [doi:10.1107/S002188987100726X]
Diagramme de transformation dans l'état solide des alliages cadmium-magnésium. Etude quantitative de l'ordre à grande et à courte distance
C. Frantz et M. Gantois
short communications
J. Appl. Cryst. (1971). 4, 396-397 [doi:10.1107/S0021889871007271]
Small angle X-ray diffraction study of metastable precipitates in an Al-5 at.% Ag-5 at.% Zn alloy
H. A. Kähkönen
J. Appl. Cryst. (1971). 4, 397-398 [doi:10.1107/S0021889871007283]
Approximations in refinement of elastic constant values from thermal diffuse scattering measurements
B. W. Lucas
crystal data
J. Appl. Cryst. (1971). 4, 399-400 [doi:10.1107/S0021889871007295]
Crystal data on C-type terbium sesquioxide (Tb2O3)
G. J. McCarthy
laboratory notes
J. Appl. Cryst. (1971). 4, 400 [doi:10.1107/S0021889871007301]
A technique for the rigid mounting of crystals in X-ray diffractometry
W. A. Denne
J. Appl. Cryst. (1971). 4, 400-401 [doi:10.1107/S0021889871099989]
Absorption correction: determining the external geometry and dimensions of a single crystal
D. L. Ward and C. N. Caughlan
international union of crystallography
J. Appl. Cryst. (1971). 4, 401 [doi:10.1107/S0021889871007313]
Ninth General Assembly and International Congress of Crystallography
crystallographers
J. Appl. Cryst. (1971). 4, 401 [doi:10.1107/S0021889871007325]
Crystallographers
book reviews
J. Appl. Cryst. (1971). 4, 402 [doi:10.1107/S0021889871007337]
Crystal geometry. A set of tranparencies for an overhead projector with notes for lecturers
J. Appl. Cryst. (1971). 4, 402-403 [doi:10.1107/S0021889871007349]
Martensite: fundamentals and technology edited by E. R. Petty
J. Appl. Cryst. (1971). 4, 403 [doi:10.1107/S0021889871007350]
Experimental crystal physics by W. A. Wooster and A. Breton
J. Appl. Cryst. (1971). 4, 403-404 [doi:10.1107/S0021889871007362]
experimental and natural rock deformation, Proceedings of the International Symposium, Darmstadt, February 17-18 1969 edited by P. Paulitsch
books received
J. Appl. Cryst. (1971). 4, 405 [doi:10.1107/S0021889871007374]
Diffusion data edited by F. H. Wöhlbier
J. Appl. Cryst. (1971). 4, 405 [doi:10.1107/S0021889871007386]
Stereographic projections of the cubic and close-packed hexagonal lattices by A. T. Davenport and A. R. Booth
meeting reports
J. Appl. Cryst. (1971). 4, 405-407 [doi:10.1107/S0021889871007398]
Meeting Report
J. Appl. Cryst. (1971). 4, 408 [doi:10.1107/S0021889871007404]
Second International Small-Angle X-ray Scattering Conference
J. Appl. Cryst. (1971). 4, 408-425 [doi:10.1107/S0021889871007416]
Abstracts
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