Journal of Applied Crystallography

Volume 4, Part 6 (December 1971)



research papers



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J. Appl. Cryst. (1971). 4, 427-434    [doi:10.1107/S0021889871007428]

Precipitation phenomena in Al-Ag-Zn alloys

S. Popovic and D. E. Passoja



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J. Appl. Cryst. (1971). 4, 434-440    [doi:10.1107/S002188987100743X]

Calculation of the effect of twinning on (101) on the effective particle sizes determined from X-ray line profiles for the L10 superlattice

B. E. Smith



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J. Appl. Cryst. (1971). 4, 440-443    [doi:10.1107/S0021889871007441]

Some further considerations in particle-size broadening

A. J. C. Wilson



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J. Appl. Cryst. (1971). 4, 444-451    [doi:10.1107/S0021889871007453]

The evaluation of multiple X-ray small-angle scattering

R. Perret and W. Ruland



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J. Appl. Cryst. (1971). 4, 452-461    [doi:10.1107/S0021889871007465]

Influence of precipitation hardening and reversible martensite reactions on recrystallization textures of 17%Ni-8%Co-4%Mo steel

M. J. Dickson and S. D. Gray



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J. Appl. Cryst. (1971). 4, 461-472    [doi:10.1107/S0021889871007477]

Phénomène de défocalisation lié à la géométrie de la chambre de texture de Schulz et incidence sur l'intensité mesurée

J. C. Couterne et G. Cizeron



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J. Appl. Cryst. (1971). 4, 472-478    [doi:10.1107/S0021889871007489]

An X-ray line-broadening study of twelve powders using the variance method

H. J. Edwards and K. Toman



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J. Appl. Cryst. (1971). 4, 479-481    [doi:10.1107/S0021889871007490]

A method of correlating dislocations and etch pits: application to cyclotrimethylene trinitramine

I. T. McDermott and P. P. Phakey



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J. Appl. Cryst. (1971). 4, 482-487    [doi:10.1107/S0021889871007507]

Line patterns in wide-angle convergent beam electron diffraction

D. J. Smith and J. M. Cowley



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J. Appl. Cryst. (1971). 4, 488-494    [doi:10.1107/S0021889871007519]

Measurement of disorder in turbostratic carbons by small-angle X-ray scattering

C. N. Tyson and J. R. Marjoram



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J. Appl. Cryst. (1971). 4, 494-497    [doi:10.1107/S0021889871007520]

A computer program for the construction of pole figures

M. A. Rothwell



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J. Appl. Cryst. (1971). 4, 498-506    [doi:10.1107/S0021889871007532]

Centroid shifts due to axial divergence and other geometrical factors in Seemann-Bohlin diffractometry

C. J. Gillham



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J. Appl. Cryst. (1971). 4, 506-511    [doi:10.1107/S0021889871007544]

Vacuum sublimation and crystallography of quinacridones

F. H. Chung and R. W. Scott



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J. Appl. Cryst. (1971). 4, 511-516    [doi:10.1107/S0021889871007556]

A study of pre-precipitation in Al-Zn alloys with X-rays and neutrons

J. M. Raynal, J. Schelten and W. Schmatz



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J. Appl. Cryst. (1971). 4, 516-521    [doi:10.1107/S0021889871007568]

On the correlation between stacking-fault energy and atomic structures of polytypes

R. Prasad and O. N. Srivastava



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J. Appl. Cryst. (1971). 4, 521-523    [doi:10.1107/S002188987100757X]

The orientation of high-order growth twins in diamond-type crystals

F. Wilhelm


short communications



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J. Appl. Cryst. (1971). 4, 524-527    [doi:10.1107/S0021889871007581]

An inexpensive computer control for an X-ray diffraction laboratory

M. Richesson, L. Morrison, J. B. Cohen and K. Paavola



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J. Appl. Cryst. (1971). 4, 527-528    [doi:10.1107/S0021889871007593]

Ein einfaches Verfahren zur Bestimmung der höchsten durch Röntgenlinien-Verbreiterung erfassbaren Kristallitengrössen

S. Malcic



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J. Appl. Cryst. (1971). 4, 528-530    [doi:10.1107/S002188987100760X]

A trial of neutron diffraction topography

K. Doi, N. Minakawa, H. Motohashi and N. Masaki


crystal data



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J. Appl. Cryst. (1971). 4, 530-531    [doi:10.1107/S0021889871007611]

Crystal data on paratacamite, [bold gamma]-Cu2(OH)3Cl

H. R. Oswald and J. R. Guenter


laboratory notes



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J. Appl. Cryst. (1971). 4, 531-532    [doi:10.1107/S0021889871007623]

Light-base nuclear plate useful for monitoring in X-ray topography

M. Ando and S. Hosoya



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J. Appl. Cryst. (1971). 4, 532-533    [doi:10.1107/S0021889871099990]

A goniometer adaptor providing subsidiary translational and rotational adjustments

W. C. Lister, J. C. Coppola and O. Kennard


book reviews



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J. Appl. Cryst. (1971). 4, 534    [doi:10.1107/S0021889871007635]

Phase diagrams, Vol. 1. edited by A. M. Alper



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J. Appl. Cryst. (1971). 4, 534    [doi:10.1107/S0021889871007647]

The science of engineering materials by C. O. Smith


meeting reports



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J. Appl. Cryst. (1971). 4, 534    [doi:10.1107/S0021889871007659]

Meeting Report


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