Journal of Applied Crystallography

Volume 4, Part 6 (December 1971)

research papers
short communications
crystal data
laboratory notes
book reviews
meeting reports

research papers

J. Appl. Cryst. (1971). 4, 427-434 [doi:10.1107/S0021889871007428]

Precipitation phenomena in Al-Ag-Zn alloys

S. Popovic and D. E. Passoja

J. Appl. Cryst. (1971). 4, 434-440 [doi:10.1107/S002188987100743X]

Calculation of the effect of twinning on (101) on the effective particle sizes determined from X-ray line profiles for the L1₀ superlattice

B. E. Smith

J. Appl. Cryst. (1971). 4, 440-443 [doi:10.1107/S0021889871007441]

Some further considerations in particle-size broadening

A. J. C. Wilson

J. Appl. Cryst. (1971). 4, 444-451 [doi:10.1107/S0021889871007453]

The evaluation of multiple X-ray small-angle scattering

R. Perret and W. Ruland

J. Appl. Cryst. (1971). 4, 452-461 [doi:10.1107/S0021889871007465]

Influence of precipitation hardening and reversible martensite reactions on recrystallization textures of 17%Ni-8%Co-4%Mo steel

M. J. Dickson and S. D. Gray

J. Appl. Cryst. (1971). 4, 461-472 [doi:10.1107/S0021889871007477]

Phénomène de défocalisation lié à la géométrie de la chambre de texture de Schulz et incidence sur l'intensité mesurée

J. C. Couterne et G. Cizeron

J. Appl. Cryst. (1971). 4, 472-478 [doi:10.1107/S0021889871007489]

An X-ray line-broadening study of twelve powders using the variance method

H. J. Edwards and K. Toman

J. Appl. Cryst. (1971). 4, 479-481 [doi:10.1107/S0021889871007490]

A method of correlating dislocations and etch pits: application to cyclotrimethylene trinitramine

I. T. McDermott and P. P. Phakey

J. Appl. Cryst. (1971). 4, 482-487 [doi:10.1107/S0021889871007507]

Line patterns in wide-angle convergent beam electron diffraction

D. J. Smith and J. M. Cowley

J. Appl. Cryst. (1971). 4, 488-494 [doi:10.1107/S0021889871007519]

Measurement of disorder in turbostratic carbons by small-angle X-ray scattering

C. N. Tyson and J. R. Marjoram

J. Appl. Cryst. (1971). 4, 494-497 [doi:10.1107/S0021889871007520]

A computer program for the construction of pole figures

M. A. Rothwell

J. Appl. Cryst. (1971). 4, 498-506 [doi:10.1107/S0021889871007532]

Centroid shifts due to axial divergence and other geometrical factors in Seemann-Bohlin diffractometry

C. J. Gillham

J. Appl. Cryst. (1971). 4, 506-511 [doi:10.1107/S0021889871007544]

Vacuum sublimation and crystallography of quinacridones

F. H. Chung and R. W. Scott

J. Appl. Cryst. (1971). 4, 511-516 [doi:10.1107/S0021889871007556]

A study of pre-precipitation in Al-Zn alloys with X-rays and neutrons

J. M. Raynal, J. Schelten and W. Schmatz

J. Appl. Cryst. (1971). 4, 516-521 [doi:10.1107/S0021889871007568]

On the correlation between stacking-fault energy and atomic structures of polytypes

R. Prasad and O. N. Srivastava

J. Appl. Cryst. (1971). 4, 521-523 [doi:10.1107/S002188987100757X]

The orientation of high-order growth twins in diamond-type crystals

F. Wilhelm

short communications

J. Appl. Cryst. (1971). 4, 524-527 [doi:10.1107/S0021889871007581]

An inexpensive computer control for an X-ray diffraction laboratory

M. Richesson, L. Morrison, J. B. Cohen and K. Paavola

J. Appl. Cryst. (1971). 4, 527-528 [doi:10.1107/S0021889871007593]

Ein einfaches Verfahren zur Bestimmung der höchsten durch Röntgenlinien-Verbreiterung erfassbaren Kristallitengrössen

S. Malcic

J. Appl. Cryst. (1971). 4, 528-530 [doi:10.1107/S002188987100760X]

A trial of neutron diffraction topography

K. Doi, N. Minakawa, H. Motohashi and N. Masaki

crystal data

J. Appl. Cryst. (1971). 4, 530-531 [doi:10.1107/S0021889871007611]

Crystal data on paratacamite, -Cu₂(OH)₃Cl

H. R. Oswald and J. R. Guenter

laboratory notes

J. Appl. Cryst. (1971). 4, 531-532 [doi:10.1107/S0021889871007623]

Light-base nuclear plate useful for monitoring in X-ray topography

M. Ando and S. Hosoya

J. Appl. Cryst. (1971). 4, 532-533 [doi:10.1107/S0021889871099990]

A goniometer adaptor providing subsidiary translational and rotational adjustments

W. C. Lister, J. C. Coppola and O. Kennard

book reviews

J. Appl. Cryst. (1971). 4, 534 [doi:10.1107/S0021889871007635]

Phase diagrams, Vol. 1. edited by A. M. Alper

J. Appl. Cryst. (1971). 4, 534 [doi:10.1107/S0021889871007647]

The science of engineering materials by C. O. Smith

meeting reports

J. Appl. Cryst. (1971). 4, 534 [doi:10.1107/S0021889871007659]