Journal of Applied Crystallography
Volume 5, Part 2 (April 1972)
research papers
J. Appl. Cryst. (1972). 5, 57-63 [doi:10.1107/S0021889872008775]
The application of truncated integrated intensity to the analysis of broadened X-ray diffraction lines
R. W. Cheary and N. W. Grimes
J. Appl. Cryst. (1972). 5, 63-66 [doi:10.1107/S0021889872008787]
The measurement of the lattice parameters of molybdenum ditelluride
M. K. Agarwal and M. J. Capers
J. Appl. Cryst. (1972). 5, 66-71 [doi:10.1107/S0021889872008799]
FIGATOM: a new graphic program for stereoscopic crystal structure illustrations
G. A. Langlet
J. Appl. Cryst. (1972). 5, 72-78 [doi:10.1107/S0021889872008805]
Crystal perfection and silver electromigration in ![[alpha]](/logos/entities/alpha_rmgif.gif)
-quartz
S. Keerti and A. R. Lang
J. Appl. Cryst. (1972). 5, 78-83 [doi:10.1107/S0021889872008817]
Eigenschaften und Herstellung gebogener Kupfermonochromatoren für thermische Neutronen
P. Thomas
J. Appl. Cryst. (1972). 5, 83-88 [doi:10.1107/S0021889872008829]
Modifizierte Laue-Methode für thermische Neutronen
P. Thomas
J. Appl. Cryst. (1972). 5, 88-90 [doi:10.1107/S0021889872008830]
A simple globe and cap method for orienting cubic-symmetry crystals using Laue photographs
S. Hart
J. Appl. Cryst. (1972). 5, 90-92 [doi:10.1107/S0021889872008842]
K vivodu formuli dlya krivoy profilya istinnogo raspredeleniya intensivnost po uglam rasseyaniya, obuslovlennoy faktorami dispernosti i formi oblastey kogerentnogo rasseyaniya
G. V. Davydov and G. M. Bartenev
J. Appl. Cryst. (1972). 5, 92-95 [doi:10.1107/S0021889872008854]
K voprosu o kharakternikh tochkakh profilya dubletnikh K liniu pri rentgenostrukturom analyze polykristallov
G. V. Davydov, N. A. Erokhov und V. M. Erofeev
J. Appl. Cryst. (1972). 5, 96-102 [doi:10.1107/S0021889872008866]
A theory of sublattices and superlattices
R. Bucksch
J. Appl. Cryst. (1972). 5, 102-106 [doi:10.1107/S0021889872008878]
A cryogenic attachment for single crystal X-ray studies
J. O. Thomas
J. Appl. Cryst. (1972). 5, 107-116 [doi:10.1107/S002188987200888X]
Development of primary recrystallization textures in metastable austenitic steels
M. J. Dickson and R. P. Stratton
J. Appl. Cryst. (1972). 5, 116-119 [doi:10.1107/S0021889872008891]
Glassy carbon as standard for the normalization of small-angle scattering intensities
R. Perret and W. Ruland
J. Appl. Cryst. (1972). 5, 119-124 [doi:10.1107/S0021889872008908]
Interstratified layer structure of the organo-montmorillonites as revealed by electron microscopy
T. Yoshida and E. Suito
J. Appl. Cryst. (1972). 5, 125-127 [doi:10.1107/S002188987200891X]
A correlation of the short range order in Ni3Fe with certain physical properties of this alloy
W. L. Wilson and R. W. Gould
J. Appl. Cryst. (1972). 5, 127-130 [doi:10.1107/S0021889872008921]
Crystallite sizes and surface areas of catalysts
W. L. Smith
short communications
J. Appl. Cryst. (1972). 5, 131-132 [doi:10.1107/S0021889872008933]
A possible error in a measurement of critical voltage in a high voltage electron microscope
D. G. Martin
J. Appl. Cryst. (1972). 5, 132 [doi:10.1107/S0021889872008945]
Influence of precipitation hardening and reversible martensite reactions on recrystallization textures of 17%Ni-8%Co-4%Mo steel
M. J. Dickson and S. D. Gray
J. Appl. Cryst. (1972). 5, 133-134 [doi:10.1107/S0021889872008957]
A method of producing optical diffraction masks representing static disorder in crystals using computer-generated patterns
T. R. Welberry, C. A. Taylor and H. J. Milledge
J. Appl. Cryst. (1972). 5, 135 [doi:10.1107/S0021889872008970]
On the convergence of the van Cittert method of deconvolution. Erratum
W. Ruland
J. Appl. Cryst. (1972). 5, 135-136 [doi:10.1107/S0021889872008969]
Computer-generated stereographic projections
R. A. Ploc and P. C. Barnett
J. Appl. Cryst. (1972). 5, 137-138 [doi:10.1107/S0021889872008982]
Compressibilities of some layer dichalcogenides
H. D. Flack
J. Appl. Cryst. (1972). 5, 138-140 [doi:10.1107/S0021889872008994]
The variance as a criterion for defocusing in powder diffractometry
A. K. Singh and C. Balasingh
crystal data
J. Appl. Cryst. (1972). 5, 140-141 [doi:10.1107/S0021889872009008]
Crystal data on thyroxine and thyroxine derivatives
V. Cody, M. Greiner and E. DeJarnette
J. Appl. Cryst. (1972). 5, 141 [doi:10.1107/S002188987200901X]
Neubestimmung der Elementarzelle von -Natriummetavanadat
E. Erdoes
J. Appl. Cryst. (1972). 5, 142 [doi:10.1107/S0021889872009021]
Crystal data on Gd3Ga2
R. M. Gupta, M. L. Shepard, H. Hacker Jnr and H. H. Stadelmaier
laboratory notes
J. Appl. Cryst. (1972). 5, 143 [doi:10.1107/S0021889872009033]
Mechanically refrigerated gas streams for studies to -70°C
R. Rudman
letters to the editor
J. Appl. Cryst. (1972). 5, 143 [doi:10.1107/S0021889872009045]
Letter to the Editor
S. C. Abrahams
notes and news
J. Appl. Cryst. (1972). 5, 144 [doi:10.1107/S0021889872009057]
Notes and News
crystallographers
J. Appl. Cryst. (1972). 5, 144 [doi:10.1107/S0021889872009069]
Crystallographers
international union of crystallography
J. Appl. Cryst. (1972). 5, 145-146 [doi:10.1107/S0021889872009070]
Prices of publications of the Union
book reviews
J. Appl. Cryst. (1972). 5, 146-147 [doi:10.1107/S0021889872009082]
Interpretation of X-ray powder diffraction patterns by H. Lipson and H. Steeple
J. Appl. Cryst. (1972). 5, 147 [doi:10.1107/S0021889872009094]
Physics of p-n junctions and semiconductor devices edited by S. M. Ryvkin and Yu. V. Shmartsev
J. Appl. Cryst. (1972). 5, 147 [doi:10.1107/S0021889872009100]
Structural characteristics of materials edited by H. M. Finniston
J. Appl. Cryst. (1972). 5, 147 [doi:10.1107/S0021889872009112]
The physics of opto-electronic material edited by Albers Jr W. A. Albers Jr W. A.
international union of crystallography
J. Appl. Cryst. (1972). 5, 148-162 [doi:10.1107/S0021889872009124]
Second Supplement to the Crystallographic Book List
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