Journal of Applied Crystallography

Volume 5, Part 3 (June 1972)



research papers



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J. Appl. Cryst. (1972). 5, 163-169    [doi:10.1107/S0021889872009136]

X-ray topographic studies on the lattice distortions of single crystals of silicon due to scratching

M. Renninger



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J. Appl. Cryst. (1972). 5, 169-177    [doi:10.1107/S0021889872009148]

Vergleichende Untersuchung über die röntgentopographischen Verfahren der Abbildung von Kristalldefekten

U. Wattenberg



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J. Appl. Cryst. (1972). 5, 177-183    [doi:10.1107/S002188987200915X]

Adaption d'un ensemble de détection Si(Li) à un diffractometre X

J. P. Lauriat et P. Pério



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J. Appl. Cryst. (1972). 5, 183-187    [doi:10.1107/S0021889872009161]

X-ray small-angle scattering of glassy carbon

R. Perret and W. Ruland



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J. Appl. Cryst. (1972). 5, 187-191    [doi:10.1107/S0021889872009173]

The precision determination of the lattice parameters and the coefficients of thermal expansion of BiFeO3

J. D. Bucci, B. K. Robertson and W. J. James



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J. Appl. Cryst. (1972). 5, 191-194    [doi:10.1107/S0021889872009185]

The identification of twins from intensity statistics

E. Stanley



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J. Appl. Cryst. (1972). 5, 194-200    [doi:10.1107/S0021889872009197]

Examination of the solid phases in the system AgI-NaI-H2O

L. R. Johnson and B. L. Davis



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J. Appl. Cryst. (1972). 5, 201-209    [doi:10.1107/S0021889872009203]

Further studies on the nickel-aluminium system. I. [beta]-NiAl and [bold delta]-Ni2Al3 phase fields

A. Taylor and N. J. Doyle



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J. Appl. Cryst. (1972). 5, 210-215    [doi:10.1107/S0021889872009215]

Further studies on the nickel-aluminum system. II. Vacancy filling in [beta] and [bold delta]-phase alloys by compression at high temperatures

A. Taylor and N. J. Doyle



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J. Appl. Cryst. (1972). 5, 216-221    [doi:10.1107/S0021889872009227]

Small-angle X-ray scattering study of glassy GeO2

A. Pierre, D. R. Uhlmann and F. N. Molea



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J. Appl. Cryst. (1972). 5, 221-224    [doi:10.1107/S0021889872009239]

The cell dimensions of W1xTaxSe2

A. A. Al-Hilli and B. L. Evans



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J. Appl. Cryst. (1972). 5, 225-230    [doi:10.1107/S0021889872009240]

The influence of preferred orientation on the line width and peak shift of (hk) interferences

W. Ruland and H. Tompa



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J. Appl. Cryst. (1972). 5, 230-233    [doi:10.1107/S0021889872009252]

Langage algorithmique de mesure d'intensités

G. C. Bassi, J.-C. Guitel et M. Geynet



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J. Appl. Cryst. (1972). 5, 234-235    [doi:10.1107/S0021889872009264]

A comparison of the fast Fourier and trigonometric Fourier algorithms

C. R. Hubbard, C. O. Quicksall and R. A. Jacobson


short communications



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J. Appl. Cryst. (1972). 5, 236-238    [doi:10.1107/S0021889872009276]

The symmetry of the structure of the \def\lambdabar{\ifvmode\noindent\fi{\hbox{$\lambda$}\kern-0.35em\raise0.7ex\hbox{-}\kern0.2em}}\lambdabar phase in Zr and Ti alloys

S. L. Sass and B. Borie



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J. Appl. Cryst. (1972). 5, 239-240    [doi:10.1107/S0021889872009288]

The effect of multiple diffraction on the electron-microscope image

H. Lipson and S. G. Lipson



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J. Appl. Cryst. (1972). 5, 240-241    [doi:10.1107/S002188987200929X]

Precise measurement of lattice parameters of single crystals in conjunction with a hot stage

M. A. G. Halliwell



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J. Appl. Cryst. (1972). 5, 241-242    [doi:10.1107/S0021889872009306]

Zur Elementarzelle von Ca3TeO6

M. Trömel



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J. Appl. Cryst. (1972). 5, 243    [doi:10.1107/S002188987200932X]

The definition of the indexing figure of merit M20

P. M. de Wolff



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J. Appl. Cryst. (1972). 5, 243-244    [doi:10.1107/S0021889872009318]

A technique for the preparation of metal samples for Debye-Scherrer cameras

B. J. Beaudry and O. D. McMasters



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J. Appl. Cryst. (1972). 5, 244-247    [doi:10.1107/S0021889872009331]

Computer-generated transmission electron diffraction patterns

R. A. Ploc and G. H. Keech



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J. Appl. Cryst. (1972). 5, 247-248    [doi:10.1107/S0021889872009343]

Etude radiocristallographique du bicarbonate de césium

C. Caranoni, R. Favier et L. Carbonnel


crystal data



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J. Appl. Cryst. (1972). 5, 248-249    [doi:10.1107/S0021889872009355]

Crystal data on tin(II) phosphate chloride, Sn2PO4Cl

A. F. Berndt, J. M. Sylvester, T. H. Jordan and T. F. Spenader


laboratory notes



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J. Appl. Cryst. (1972). 5, 249-250    [doi:10.1107/S0021889872009367]

A device for aligning a Weissenberg X-ray diffractometer to a monochromator

W. F. Cole and C. J. Lancucki



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J. Appl. Cryst. (1972). 5, 250    [doi:10.1107/S0021889872099996]

A simple small-scale recrystallization apparatus

D. J. Watkin


international union of crystallography



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J. Appl. Cryst. (1972). 5, 251-252    [doi:10.1107/S0021889872009379]

IUCr-UNESCO Project on the Teaching of Crystallography


book reviews



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J. Appl. Cryst. (1972). 5, 252    [doi:10.1107/S0021889872009380]

Preparation and properties of solid state material. Vol. 1 edited by R. A. Lefever



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J. Appl. Cryst. (1972). 5, 252-253    [doi:10.1107/S0021889872009392]

Physics of thin films. Volume 6 edited by M. H. Francome


books received



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J. Appl. Cryst. (1972). 5, 253    [doi:10.1107/S0021889872009409]

X-ray Spectrometry - an International Journal edited by R. Jenkins



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J. Appl. Cryst. (1972). 5, 253    [doi:10.1107/S0021889872009410]

Instrumental and radiochemical activation analysis by J. Hoste, J. Op. de Beeck, R. Gijbels, F. Adams, P. Van den Winkel and D. de Soete



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J. Appl. Cryst. (1972). 5, 253    [doi:10.1107/S0021889872009422]

Handbook of electronic materials. Volume 5. Group IV semiconducting materials by M. Neuberger



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J. Appl. Cryst. (1972). 5, 253    [doi:10.1107/S0021889872009434]

Advances in X-ray analysis edited by C. S. Barrett and C. Ruud


international union of crystallography



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J. Appl. Cryst. (1972). 5, 254    [doi:10.1107/S0021889872009446]

Key to the Second Supplement to the Crystallographic Book List


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