Journal of Applied Crystallography
Volume 5, Part 5 (October 1972)
research papers
J. Appl. Cryst. (1972). 5, 313-315 [doi:10.1107/S0021889872009689]
A method for aligning crystals in precession photography using monochromated radiation
S. Deganello
J. Appl. Cryst. (1972). 5, 315-324 [doi:10.1107/S0021889872009690]
A unified theory of absolute intensity measurements in small-angle X-ray scattering
R. W. Hendricks
J. Appl. Cryst. (1972). 5, 325-331 [doi:10.1107/S0021889872009707]
Effects of porosity and surface roughness on the X-ray intensity reflected from a powder specimen
P. Suortti
J. Appl. Cryst. (1972). 5, 332-338 [doi:10.1107/S0021889872009719]
Precession photography: general transformation equations and a new alignment method
J. J. Millar
J. Appl. Cryst. (1972). 5, 338-342 [doi:10.1107/S0021889872009720]
Guinier camera for single crystal investigation
H. Dachs and K. Knorr
J. Appl. Cryst. (1972). 5, 343-347 [doi:10.1107/S0021889872009732]
Quantitative analysis of phase composition using X-ray diffraction methods
A. J. Majumdar, L. S. Vallance and C. G. G. Born
J. Appl. Cryst. (1972). 5, 347-352 [doi:10.1107/S0021889872009744]
On the phase transformation in cadmium iodide polytypic crystals
R. S. Tiwari and O. N. Srivastava
J. Appl. Cryst. (1972). 5, 353-359 [doi:10.1107/S0021889872009756]
Etude des profils de raies de diffraction des rayons X d'une poudre d'hydroxyde de nickel
D. Louër, D. Weigel et J. I. Langford
J. Appl. Cryst. (1972). 5, 360-365 [doi:10.1107/S0021889872009768]
The relation of physical properties to the symmetry of potassium iodate
G. R. Crane
J. Appl. Cryst. (1972). 5, 365-370 [doi:10.1107/S002188987200977X]
The use of standard deviation of X-ray diffraction lines as a measure of broadening in the Scherrer equation: a curve fitting method
R. McGehee and J. Renault
J. Appl. Cryst. (1972). 5, 370-371 [doi:10.1107/S0021889872009781]
K vivodu formuli dlya krivoy profilya istinnogo raspredeleniya intensivnosti po uglam rasseyaniya, obuslovlennoy faktorami razmera i formi oblastey kogerentnogo rasseyaniya
G. V. Davydov
short communications
J. Appl. Cryst. (1972). 5, 372-373 [doi:10.1107/S0021889872009793]
On the enhanced small-angle X-ray scattering from polished surfaces of aluminum
B. A. Parker
J. Appl. Cryst. (1972). 5, 373-374 [doi:10.1107/S002188987200980X]
Production of sensitive converter screens for thermal neutron diffraction patterns
P. Thomas
J. Appl. Cryst. (1972). 5, 375-376 [doi:10.1107/S0021889872009811]
Radiation hazards from X-ray diffraction equipment
C. Faloci, A. Susanna and F. Zampini
crystal data
J. Appl. Cryst. (1972). 5, 377-378 [doi:10.1107/S0021889872009823]
Crystal data for samarium, holmium and lutetium iron garnets
G. J. McCarthy, R. Botdorf and G. G. Johnson Jnr
J. Appl. Cryst. (1972). 5, 378-379 [doi:10.1107/S0021889872009835]
Crystal data for potassium sodium silicofluoride, K2SiF6.Na2SiF6
D. R. Howlett
J. Appl. Cryst. (1972). 5, 379-380 [doi:10.1107/S0021889872009847]
Crystal data on mercury picramate, Hg[C6H2(NO2)2(NH2)O]2.H2O
S. P. Agrawal and B. D. Agrawal
computer programs
J. Appl. Cryst. (1972). 5, 380-381 [doi:10.1107/S0021889872009859]
A computer program for the separation of linearly sloping backgrounds in X-ray line broadening analysis
D. R. Lundy and E. D. Eanes
laboratory notes
J. Appl. Cryst. (1972). 5, 381-382 [doi:10.1107/S0021889872009860]
A method of preparation of powder samples for Debye-Scherrer-Hull X-ray diffraction
R. L. Barns
J. Appl. Cryst. (1972). 5, 382 [doi:10.1107/S0021889872009872]
Practical experiments in crystallography. Structure solution using `Patterson' heavy-atom technique
C. H. L. Kennard
J. Appl. Cryst. (1972). 5, 382 [doi:10.1107/S0021889872009884]
Practical experiments in crystallography: simulation of structure-factor and one-dimensional electron-density calculations
C. H. L. Kennard
international union of crystallography
J. Appl. Cryst. (1972). 5, 383 [doi:10.1107/S0021889872009896]
Commission on Neutron Diffraction
notes and news
J. Appl. Cryst. (1972). 5, 383 [doi:10.1107/S0021889872009902]
Notes and News
crystallographers
J. Appl. Cryst. (1972). 5, 383-384 [doi:10.1107/S0021889872009914]
Crystallographers
book reviews
J. Appl. Cryst. (1972). 5, 384 [doi:10.1107/S0021889872009926]
Landolt-Börnstein. Numerical data and functional relationships in science and technology. Group III. Vol. 6. Structure data of elements and intermetallic phases edited by K.-H. Hellwege
J. Appl. Cryst. (1972). 5, 384-385 [doi:10.1107/S0021889872009938]
The Physics of Metals and Metallography edited by S. V. Vonsovsky
J. Appl. Cryst. (1972). 5, 385 [doi:10.1107/S002188987200994X]
Hydrothermal synthesis of crystals edited by A. N. Lobachev
J. Appl. Cryst. (1972). 5, 385-386 [doi:10.1107/S0021889872009951]
Tables for microscopic identification of ore materials by W. Uytenbogaardt and E. A. J. Burke
J. Appl. Cryst. (1972). 5, 387 [doi:10.1107/S0021889872009963]
Polarization interferometers: applications in microscopy and macroscopy by M. Françon and S. Mallick
J. Appl. Cryst. (1972). 5, 387-388 [doi:10.1107/S0021889872009975]
Principles and Practice of X-ray Spectrometric Analysis by E. P. Bertin
books received
J. Appl. Cryst. (1972). 5, 388 [doi:10.1107/S0021889872009987]
Optical microscopy for the materials sciences by J. H. Richardson
J. Appl. Cryst. (1972). 5, 388 [doi:10.1107/S0021889872009999]
Handbook of electronic materials. Vol. 6. Silicon nitride for microelectronic applications, Part 2 by J. T. Milek
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