Journal of Applied Crystallography

Volume 5, Part 5 (October 1972)



research papers



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J. Appl. Cryst. (1972). 5, 313-315    [doi:10.1107/S0021889872009689]

A method for aligning crystals in precession photography using monochromated radiation

S. Deganello



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J. Appl. Cryst. (1972). 5, 315-324    [doi:10.1107/S0021889872009690]

A unified theory of absolute intensity measurements in small-angle X-ray scattering

R. W. Hendricks



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J. Appl. Cryst. (1972). 5, 325-331    [doi:10.1107/S0021889872009707]

Effects of porosity and surface roughness on the X-ray intensity reflected from a powder specimen

P. Suortti



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J. Appl. Cryst. (1972). 5, 332-338    [doi:10.1107/S0021889872009719]

Precession photography: general transformation equations and a new alignment method

J. J. Millar



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J. Appl. Cryst. (1972). 5, 338-342    [doi:10.1107/S0021889872009720]

Guinier camera for single crystal investigation

H. Dachs and K. Knorr



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J. Appl. Cryst. (1972). 5, 343-347    [doi:10.1107/S0021889872009732]

Quantitative analysis of phase composition using X-ray diffraction methods

A. J. Majumdar, L. S. Vallance and C. G. G. Born



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J. Appl. Cryst. (1972). 5, 347-352    [doi:10.1107/S0021889872009744]

On the phase transformation in cadmium iodide polytypic crystals

R. S. Tiwari and O. N. Srivastava



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J. Appl. Cryst. (1972). 5, 353-359    [doi:10.1107/S0021889872009756]

Etude des profils de raies de diffraction des rayons X d'une poudre d'hydroxyde de nickel

D. Louër, D. Weigel et J. I. Langford



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J. Appl. Cryst. (1972). 5, 360-365    [doi:10.1107/S0021889872009768]

The relation of physical properties to the symmetry of potassium iodate

G. R. Crane



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J. Appl. Cryst. (1972). 5, 365-370    [doi:10.1107/S002188987200977X]

The use of standard deviation of X-ray diffraction lines as a measure of broadening in the Scherrer equation: a curve fitting method

R. McGehee and J. Renault



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J. Appl. Cryst. (1972). 5, 370-371    [doi:10.1107/S0021889872009781]

K vivodu formuli dlya krivoy profilya istinnogo raspredeleniya intensivnosti po uglam rasseyaniya, obuslovlennoy faktorami razmera i formi oblastey kogerentnogo rasseyaniya

G. V. Davydov


short communications



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J. Appl. Cryst. (1972). 5, 372-373    [doi:10.1107/S0021889872009793]

On the enhanced small-angle X-ray scattering from polished surfaces of aluminum

B. A. Parker



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J. Appl. Cryst. (1972). 5, 373-374    [doi:10.1107/S002188987200980X]

Production of sensitive converter screens for thermal neutron diffraction patterns

P. Thomas



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J. Appl. Cryst. (1972). 5, 375-376    [doi:10.1107/S0021889872009811]

Radiation hazards from X-ray diffraction equipment

C. Faloci, A. Susanna and F. Zampini


crystal data



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J. Appl. Cryst. (1972). 5, 377-378    [doi:10.1107/S0021889872009823]

Crystal data for samarium, holmium and lutetium iron garnets

G. J. McCarthy, R. Botdorf and G. G. Johnson Jnr



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J. Appl. Cryst. (1972). 5, 378-379    [doi:10.1107/S0021889872009835]

Crystal data for potassium sodium silicofluoride, K2SiF6.Na2SiF6

D. R. Howlett



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J. Appl. Cryst. (1972). 5, 379-380    [doi:10.1107/S0021889872009847]

Crystal data on mercury picramate, Hg[C6H2(NO2)2(NH2)O]2.H2O

S. P. Agrawal and B. D. Agrawal


computer programs



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J. Appl. Cryst. (1972). 5, 380-381    [doi:10.1107/S0021889872009859]

A computer program for the separation of linearly sloping backgrounds in X-ray line broadening analysis

D. R. Lundy and E. D. Eanes


laboratory notes



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J. Appl. Cryst. (1972). 5, 381-382    [doi:10.1107/S0021889872009860]

A method of preparation of powder samples for Debye-Scherrer-Hull X-ray diffraction

R. L. Barns



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J. Appl. Cryst. (1972). 5, 382    [doi:10.1107/S0021889872009872]

Practical experiments in crystallography. Structure solution using `Patterson' heavy-atom technique

C. H. L. Kennard



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J. Appl. Cryst. (1972). 5, 382    [doi:10.1107/S0021889872009884]

Practical experiments in crystallography: simulation of structure-factor and one-dimensional electron-density calculations

C. H. L. Kennard


international union of crystallography



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J. Appl. Cryst. (1972). 5, 383    [doi:10.1107/S0021889872009896]

Commission on Neutron Diffraction


notes and news



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J. Appl. Cryst. (1972). 5, 383    [doi:10.1107/S0021889872009902]

Notes and News


crystallographers



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J. Appl. Cryst. (1972). 5, 383-384    [doi:10.1107/S0021889872009914]

Crystallographers


book reviews



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J. Appl. Cryst. (1972). 5, 384    [doi:10.1107/S0021889872009926]

Landolt-Börnstein. Numerical data and functional relationships in science and technology. Group III. Vol. 6. Structure data of elements and intermetallic phases edited by K.-H. Hellwege



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J. Appl. Cryst. (1972). 5, 384-385    [doi:10.1107/S0021889872009938]

The Physics of Metals and Metallography edited by S. V. Vonsovsky



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J. Appl. Cryst. (1972). 5, 385    [doi:10.1107/S002188987200994X]

Hydrothermal synthesis of crystals edited by A. N. Lobachev



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J. Appl. Cryst. (1972). 5, 385-386    [doi:10.1107/S0021889872009951]

Tables for microscopic identification of ore materials by W. Uytenbogaardt and E. A. J. Burke



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J. Appl. Cryst. (1972). 5, 387    [doi:10.1107/S0021889872009963]

Polarization interferometers: applications in microscopy and macroscopy by M. Françon and S. Mallick



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J. Appl. Cryst. (1972). 5, 387-388    [doi:10.1107/S0021889872009975]

Principles and Practice of X-ray Spectrometric Analysis by E. P. Bertin


books received



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J. Appl. Cryst. (1972). 5, 388    [doi:10.1107/S0021889872009987]

Optical microscopy for the materials sciences by J. H. Richardson



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J. Appl. Cryst. (1972). 5, 388    [doi:10.1107/S0021889872009999]

Handbook of electronic materials. Vol. 6. Silicon nitride for microelectronic applications, Part 2 by J. T. Milek


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