Journal of Applied Crystallography

Volume 6, Part 2 (April 1973)



research papers



pdf version buy article online

J. Appl. Cryst. (1973). 6, 59-66    [doi:10.1107/S0021889873008162]

Errors in quantitative analysis of diffuse scattering from alloys

J. E. Gragg Jnr, M. Hayakawa and J. B. Cohen



pdf version buy article online

J. Appl. Cryst. (1973). 6, 66-72    [doi:10.1107/S0021889873008174]

Intersect distributions and small-angle X-ray scattering theory. III. The intersect distribution for an ellipsoid

H.-I. Wu and P. W. Schmidt



pdf version buy article online

J. Appl. Cryst. (1973). 6, 73-75    [doi:10.1107/S0021889873008186]

Orientation factors for fiber X-ray diffraction data obtained by the precession method

D. P. Miller and V. G. Murphy



pdf version buy article online

J. Appl. Cryst. (1973). 6, 76-80    [doi:10.1107/S0021889873008198]

A low-temperature device for protein crystallography

D. J. Marsh and G. A. Petsko



pdf version buy article online

J. Appl. Cryst. (1973). 6, 81-86    [doi:10.1107/S0021889873008204]

Investigation of non-ideal two-phase polymer structures by small-angle X-ray scattering

C. G. Vonk



pdf version buy article online

J. Appl. Cryst. (1973). 6, 87-96    [doi:10.1107/S0021889873008216]

A two-dimensional model of crystal-growth disorder

T. R. Welberry and R. Galbraith



pdf version buy article online

J. Appl. Cryst. (1973). 6, 97-98    [doi:10.1107/S0021889873008228]

Observation of Pendellösung fringes in a melt-grown lithium niobate single crystal

K. Sugh and H. Iwasaki



pdf version buy article online

J. Appl. Cryst. (1973). 6, 98-104    [doi:10.1107/S002188987300823X]

Methode d'analyse qualitative de la texture. Application à la description de la texture idéale de laminage du cuivre pur polycristallin

D. Ruer, A. Vadon et R. Baro



pdf version buy article online

J. Appl. Cryst. (1973). 6, 105-113    [doi:10.1107/S0021889873008241]

Etude des systèmes à trois phases par diffusion centrale des rayons X

A. Renouprez et B. Imelik



pdf version buy article online

J. Appl. Cryst. (1973). 6, 113-116    [doi:10.1107/S0021889873008253]

Intérêt du filtrage des énergies en diffraction electronique

P. Duval et L. Henry



pdf version buy article online

J. Appl. Cryst. (1973). 6, 117-122    [doi:10.1107/S0021889873008265]

The precision of interplanar distances measured by an energy-dispersive diffractometer

T. Fukamachi, S. Hosoya and O. Terasaki



pdf version buy article online

J. Appl. Cryst. (1973). 6, 122-128    [doi:10.1107/S0021889873008277]

Unit-cell dimension measurements from pairs of X-ray diffraction lines

S. Popovic



pdf version buy article online

J. Appl. Cryst. (1973). 6, 129-132    [doi:10.1107/S0021889873008289]

An incident-beam ionization chamber and charge integration system for stabilization of X-ray diffraction experiments

R. W. Hendricks, J. T. De Lorenzo, F. M. Glass and R. E. Zedler



pdf version buy article online

J. Appl. Cryst. (1973). 6, 132-135    [doi:10.1107/S0021889873008290]

The measurement of single-crystal lattice parameters using a double-diffraction technique

F. J. Spooner and C. G. Wilson



pdf version buy article online

J. Appl. Cryst. (1973). 6, 136-138    [doi:10.1107/S0021889873008307]

Precision lattice parameters and the coefficients of thermal expansion of hexagonal germanium dioxide

K. V. K. Rao, S. V. N. Naidu and L. Iyengar



pdf version buy article online

J. Appl. Cryst. (1973). 6, 139-144    [doi:10.1107/S0021889873008319]

Double diffraction des rayons X par une substance amorphe

G. Malet, C. Cabos, A. Escande et P. Delord



pdf version buy article online

J. Appl. Cryst. (1973). 6, 145-148    [doi:10.1107/S0021889873008320]

Influence of crystal size on electron diffraction intensities

F. R. L. Schoening



pdf version buy article online

J. Appl. Cryst. (1973). 6, 148-152    [doi:10.1107/S0021889873008332]

Computerization of Ruland's X-ray method for determination of the crystallinity in polymers

C. G. Vonk



pdf version buy article online

J. Appl. Cryst. (1973). 6, 153-157    [doi:10.1107/S0021889873008344]

X-ray powder diffractometry of small (20 mg to 1 [mu]g) samples using standard equipment

P. J. Baldock and A. Parker


short communications



pdf version buy article online

J. Appl. Cryst. (1973). 6, 158    [doi:10.1107/S0021889873008356]

Consideration of the optimum precession angle for upper-level precession photographs. A correction

J. H. Cross, R. J. Fenn and A. J. Graham



pdf version buy article online

J. Appl. Cryst. (1973). 6, 158-160    [doi:10.1107/S0021889873008368]

Observation, par méthode de Lang, de différents arrangements de dislocations après recuit sur des cristaux de fluorure de lithium

B. Pavis et J. Grilhe


crystal data



pdf version buy article online

J. Appl. Cryst. (1973). 6, 161    [doi:10.1107/S002188987300837X]

Crystal data on 11-chloro-indazole [2,3-9][3,1]benzoxazin-5-one, C14H7ClN2O2

P. T. Clarke


notes and news



pdf version free

J. Appl. Cryst. (1973). 6, 162    [doi:10.1107/S0021889873008381]

Notes and News


crystallographers



pdf version free

J. Appl. Cryst. (1973). 6, 162    [doi:10.1107/S0021889873008393]

Crystallographers


book reviews



pdf version free

J. Appl. Cryst. (1973). 6, 162    [doi:10.1107/S002188987300840X]

Researches in powder metallurgy edited by B. A. Borok



pdf version free

J. Appl. Cryst. (1973). 6, 163    [doi:10.1107/S0021889873008411]

Herstellung von Kupfereinkristallen Kleiner Versetzungsdichte by E. Kappler, W. Uelhoff, H. Ehmer and F. Abbink



pdf version free

J. Appl. Cryst. (1973). 6, 163    [doi:10.1107/S0021889873008423]

Crystal growth 1971. Proceedings of 3rd International Conference, France 1971 edited by R. A. Laudise, J. B. Mullin and B. Mutaftschiev



pdf version free

J. Appl. Cryst. (1973). 6, 163-164    [doi:10.1107/S0021889873008435]

Technik-Wörterbuch Kristallografie. Englisch-Deutsch-Französisch-Russisch by K.-O. Backhaus



pdf version free

J. Appl. Cryst. (1973). 6, 164    [doi:10.1107/S0021889873008447]

Introduction to glass science edited by L. D. Pye, H. J. Stevens and W. C. La Course


Copyright © International Union of Crystallography
IUCr Webmaster