Journal of Applied Crystallography

Volume 6, Part 3 (June 1973)



lead articles



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J. Appl. Cryst. (1973). 6, 165-190    [doi:10.1107/S0021889873008459]

The direct observation of the structure of real crystals by lattice imaging

J. G. Allpress and J. V. Sanders


research papers



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J. Appl. Cryst. (1973). 6, 190-196    [doi:10.1107/S0021889873008460]

The accuracy of cell dimensions determined by Cohen's method of least squares and the systematic indexing of powder data

J. I. Langford



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J. Appl. Cryst. (1973). 6, 197-202    [doi:10.1107/S0021889873008472]

Geometrical and statistical aspects of the accuracy of camera powder data

J. I. Langford and A. J. C. Wilson



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J. Appl. Cryst. (1973). 6, 203-205    [doi:10.1107/S0021889873008484]

Effect of non-linearity error in the Warren-Averbach analysis

G. Gilli and P. A. Borea



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J. Appl. Cryst. (1973). 6, 206-216    [doi:10.1107/S0021889873008496]

Structural transitions at low temperatures in vanadium deuterides

D. G. Westlake, M. H. Mueller and H. W. Knott



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J. Appl. Cryst. (1973). 6, 217-224    [doi:10.1107/S0021889873008502]

An X-ray study of [beta]-tantalum

R. D. Burbank



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J. Appl. Cryst. (1973). 6, 225-230    [doi:10.1107/S0021889873008514]

A new approach to the determination of crystallinity of polymers by X-ray diffraction

F. H. Chung and R. W. Scott



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J. Appl. Cryst. (1973). 6, 230-237    [doi:10.1107/S0021889873008526]

Note on the aberrations of a fixed-angle energy-dispersive powder diffractometer

A. J. C. Wilson



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J. Appl. Cryst. (1973). 6, 237-239    [doi:10.1107/S0021889873008538]

Determinations of particle size and strain in hexagonal ([beta]-phase) silver-antimony alloys by the method of variance

M. De and S. P. Sen Gupta



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J. Appl. Cryst. (1973). 6, 240-243    [doi:10.1107/S002188987300854X]

Neutron diffraction, magnetic and superconducting measurements on vanadium-manganese-gallium alloys

W. J. Kitchingman and P. L. Norman


short communications



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J. Appl. Cryst. (1973). 6, 244    [doi:10.1107/S0021889873008551]

Absorption corrections: procedures for checking crystal shape, crystal orientation, and computer absorption programs: erratum

D. Cahen and J. A. Ibers



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J. Appl. Cryst. (1973). 6, 245    [doi:10.1107/S0021889873008563]

Zur methode der quantitativen röntgenographischen Phasenanalyse von Pulvergemischen

M. Trömel und G. Murken


computer programs



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J. Appl. Cryst. (1973). 6, 246-249    [doi:10.1107/S0021889873008575]

A general Fourier program for X-ray crystal-structure analysis which utilizes the Cooley-Tukey algorithm

A. Immirzi


crystal data



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J. Appl. Cryst. (1973). 6, 249-250    [doi:10.1107/S0021889873008587]

Powder diffraction data for U3O5P2O7

J. M. Schaekers and W. G. Greybe


laboratory notes



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J. Appl. Cryst. (1973). 6, 250-251    [doi:10.1107/S0021889873008599]

A simple topographic camera

R. S. D'Amato and B. Greenberg


crystallographers



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J. Appl. Cryst. (1973). 6, 251    [doi:10.1107/S0021889873008605]

Crystallographers


book reviews



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J. Appl. Cryst. (1973). 6, 251-252    [doi:10.1107/S0021889873008617]

Microscopic identification of crystals by R. E. Stoiber and S. A. Morse



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J. Appl. Cryst. (1973). 6, 252    [doi:10.1107/S0021889873008629]

Early papers on diffraction of X-rays by crystals. Vol. II edited by J. M. Bijvoet, W. G. Burgers and G. Hägg



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J. Appl. Cryst. (1973). 6, 252-253    [doi:10.1107/S0021889873008630]

Electron microscopy in material science edited by U. Valdré


books received



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J. Appl. Cryst. (1973). 6, 253    [doi:10.1107/S0021889873008642]

Handbook of Geochemistry. Vol. II/3 edited by K. H. Wedepohl


meeting reports



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J. Appl. Cryst. (1973). 6, 253-256    [doi:10.1107/S002188987300943X]

Conference on Phase Analysis: Identification and Quantitative Determination. Hull, 5-7 April 1972

J. H. C. Hogg and H. H. Sutherland


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