Journal of Applied Crystallography

Volume 6, Part 4 (August 1973)

research papers
short communications
crystal data
computer programs
crystallographers
book reviews
books received
international union of crystallography

research papers

J. Appl. Cryst. (1973). 6, 257-266 [doi:10.1107/S0021889873008654]

Perfect crystals and imperfect neutrons

C. G. Shull

J. Appl. Cryst. (1973). 6, 266-273 [doi:10.1107/S0021889873008666]

Automatic peak determination in X-ray powder patterns

D. Taupin

J. Appl. Cryst. (1973). 6, 273-279 [doi:10.1107/S0021889873008678]

Long-period ordered structures in the quasi-binary Co₃V-Ni₃V alloy

T. Onozuka, S. Yamaguchi and M. Hirabayashi

J. Appl. Cryst. (1973). 6, 280-284 [doi:10.1107/S002188987300868X]

Mesures rapides des intensités de diffraction sur monocristaux

G. C. Bassi

J. Appl. Cryst. (1973). 6, 284-289 [doi:10.1107/S0021889873008691]

Structuration

A. L. Mackay and J. L. Finney

J. Appl. Cryst. (1973). 6, 289-291 [doi:10.1107/S0021889873008708]

A specimen cell for studying oriented liquid crystals in X-ray diffraction and by polarized light

M. V. King and M. Young

short communications

J. Appl. Cryst. (1973). 6, 292-293 [doi:10.1107/S002188987300871X]

On the inapplicability of the layer-transposition mechanism to polytype formation in ZnS

Z. H. Kalman, I. Kiflawi and I. T. Steinberger

J. Appl. Cryst. (1973). 6, 293-295 [doi:10.1107/S0021889873008721]

The reference plane in determination of an orientation relation

S. W. Kennedy

J. Appl. Cryst. (1973). 6, 295-297 [doi:10.1107/S0021889873008733]

A method to obtain good high-temperature X-ray patterns with a Guinier-Lenné camera

Ch. Susz and K. Yvon

J. Appl. Cryst. (1973). 6, 297-298 [doi:10.1107/S0021889873008745]

Escape peaks caused by a Ge(Li) detector in an energy-dispersive diffractometer

T. Fukamachi, S. Togawa and S. Hosoya

crystal data

J. Appl. Cryst. (1973). 6, 299-301 [doi:10.1107/S0021889873008757]

Données cristallographiques sur CuTh₂(PO₄)₃ et TlTh₂(PO₄)₃

M. Laügt

J. Appl. Cryst. (1973). 6, 301-303 [doi:10.1107/S0021889873008769]

Lattice parameters and powder diffraction data for 14 RCo₂Ge₂ compounds (R=La, Ce, Pr, Nd, Sm, Gd, Tb, Dy, Ho, Er, Tm, Yb, Lu, and Y)

W. M. McCall, K. S. V. L. Narasimhan and R. A. Butera

J. Appl. Cryst. (1973). 6, 303-304 [doi:10.1107/S0021889873008770]

Crystal data on phenylhydroxycyclopropenone

J. S. Chickos, A. F. Berndt and A. C. Claus

computer programs

J. Appl. Cryst. (1973). 6, 304-305 [doi:10.1107/S0021889873008782]

A computer program for the identification of crystalline precipitates by means of selected-area electron diffraction

R. Bucksch

J. Appl. Cryst. (1973). 6, 306 [doi:10.1107/S0021889873008794]

Note on a graphic display version of program ORTEP

A. G. Nord

crystallographers

J. Appl. Cryst. (1973). 6, 306 [doi:10.1107/S0021889873008800]

Crystallographers

book reviews

J. Appl. Cryst. (1973). 6, 306-307 [doi:10.1107/S0021889873008812]

The crystal chemistry and physics of metals and alloys by W. B. Pearson

J. Appl. Cryst. (1973). 6, 307-308 [doi:10.1107/S0021889873008824]

Crystallisation. 2nd edition by J. W. Mullin

J. Appl. Cryst. (1973). 6, 308 [doi:10.1107/S0021889873008836]

Seeing beyond the visible by A. Hewish

books received

J. Appl. Cryst. (1973). 6, 308 [doi:10.1107/S0021889873008848]

Index of crystallographic supplies edited by R. Rudman

international union of crystallography

J. Appl. Cryst. (1973). 6, 309-346 [doi:10.1107/S002188987300885X]