Journal of Applied Crystallography
Volume 7, Part 6 (December 1974)
J. Appl. Cryst. (1974). 7, 515-518 [doi:10.1107/S0021889874010363]
Growth of unusual silicon carbide polytypes by island formation
U. Ram, M. Dubey and G. Singh
J. Appl. Cryst. (1974). 7, 519-525 [doi:10.1107/S0021889874010375]
Quantitative interpretation of X-ray diffraction patterns of mixtures. I. Matrix-flushing method for quantitative multicomponent analysis
F. H. Chung
J. Appl. Cryst. (1974). 7, 526-531 [doi:10.1107/S0021889874010387]
Quantitative interpretation of X-ray diffraction patterns of mixtures. II. Adiabatic principle of X-ray diffraction analysis of mixtures
F. H. Chung
J. Appl. Cryst. (1974). 7, 531-535 [doi:10.1107/S0021889874010399]
Effective elimination of the Compton component in amorphous scattering by experimental means
M. Shimazu and A. Watanabe
J. Appl. Cryst. (1974). 7, 535-540 [doi:10.1107/S0021889874010405]
An immobile dislocation arrangement in as-grown copper single crystals observed by X-ray topography
M. Kuriyama, J. G. Early and H. E. Burdette
J. Appl. Cryst. (1974). 7, 541-546 [doi:10.1107/S0021889874010417]
A ![[zeta]](/logos/entities/zeta_rmgif.gif)
-ray diffractometer: a tool for investigating mosaic structure
J. R. Schneider
J. Appl. Cryst. (1974). 7, 547-554 [doi:10.1107/S0021889874010429]
Interpretation of rocking curves measured by -ray diffractometry
J. R. Schneider
J. Appl. Cryst. (1974). 7, 555-564 [doi:10.1107/S0021889874010430]
Intensity determination by profile-fitting applied to precession photographs
G. C. Ford
J. Appl. Cryst. (1974). 7, 564-572 [doi:10.1107/S0021889874010442]
Intensitätsmessung bei ruhender Probe am Neutronen-Einkristalldiffraktometer
G. Egert
J. Appl. Cryst. (1974). 7, 572-576 [doi:10.1107/S0021889874010454]
Mise en oeuvre d'une chambre haute température pour diffractomètre à rayons X. Application à l'étude précise de l'expansion thermique de LiNbO3 entre l'ambiante et 1100°C
F. C. Lissalde et J. C. Peuzin
J. Appl. Cryst. (1974). 7, 577-585 [doi:10.1107/S0021889874010466]
Optical-diffraction methods of studying the electron-diffraction patterns of thin films of copper-gold alloys
H. Lipson and W. S. Michael
J. Appl. Cryst. (1974). 7, 585-587 [doi:10.1107/S0021889874010478]
Standard deviations of lattice parameters obtained from powder data measurements
J. Warczewski and P. M. de Wolff
J. Appl. Cryst. (1974). 7, 588-592 [doi:10.1107/S002188987401048X]
Diffraction of neutrons by a vibrating quartz bar in the Laue case
R. Michalec, B. Chalupa, L. Sedláková, P. Mikula, V. Petrzílka and J. Zelenka
J. Appl. Cryst. (1974). 7, 593-598 [doi:10.1107/S0021889874010491]
The skew-symmetric two-crystal X-ray interferometer
P. Becker and U. Bonse
J. Appl. Cryst. (1974). 7, 599-603 [doi:10.1107/S0021889874010508]
An automated drum scanner for rapid collection of X-ray crystallographic data
J. R. Einstein and B. W. McClelland
J. Appl. Cryst. (1974). 7, 603-608 [doi:10.1107/S002188987401051X]
A computer-controlled X-ray powder diffractometer
P. J. King and W. L. Smith
J. Appl. Cryst. (1974). 7, 608-610 [doi:10.1107/S0021889874010521]
Issledovanye tonkoy strukturi inkelya, deformirovannogo udarnimi volnami
E. F. Smyslov, G. V. Davydov, L. Z. Dankus und E. P. Alebastrova
J. Appl. Cryst. (1974). 7, 611-615 [doi:10.1107/S0021889874010533]
Pressure-induced change in the long-period stacking sequence of the close-packed layers in Mg3In
H. Iwasaki, Y. Watanabe and S. Ogawa
J. Appl. Cryst. (1974). 7, 615-617 [doi:10.1107/S0021889874010545]
A new type of electro-optic effect in semiconducting WO3
E. Salje
J. Appl. Cryst. (1974). 7, 618-620 [doi:10.1107/S0021889874010557]
A method for rapid crystal-surface characterization
T. Jokic
J. Appl. Cryst. (1974). 7, 621-624 [doi:10.1107/S0021889874010569]
Indexing rhombohedral powder diffraction patterns
L. K. Frevel and T. P. Blumer
J. Appl. Cryst. (1974). 7, 625-627 [doi:10.1107/S0021889874010570]
Optimization of the calculation of structure factors for large molecules
R. M. Burnett and C. E. Nordman
J. Appl. Cryst. (1974). 7, 628-630 [doi:10.1107/S0021889874010582]
The lattice parameters of quenched gold-manganese solid-solution alloys
D. P. Morris, J. L. Hughes and R. P. Williams
J. Appl. Cryst. (1974). 7, 631-632 [doi:10.1107/S0021889874010594]
Precise lattice constants and thermal expansion of K2Pt(CN)4Br0.3.3H2O
A. Freund
J. Appl. Cryst. (1974). 7, 632 [doi:10.1107/S0021889874010600]
Crystal data for cupric penicillamine disulphide hydrates. Errata
R. J. Gale, G. Donnay and C. A. Winkler
J. Appl. Cryst. (1974). 7, 632-633 [doi:10.1107/S0021889874010612]
A Fortran program for powder structure resolution
D. Minichelli and V. Longo
J. Appl. Cryst. (1974). 7, 634 [doi:10.1107/S0021889874010636]
Readily built instructional models
C. H. L. Kennard
J. Appl. Cryst. (1974). 7, 634-635 [doi:10.1107/S0021889874010624]
High-temperature cell for a small-angle X-ray goniometer
A. F. Craievich
J. Appl. Cryst. (1974). 7, 635-636 [doi:10.1107/S0021889874010648]
On the imaging of composition modulations
D. E. Laughlin
J. Appl. Cryst. (1974). 7, 636 [doi:10.1107/S002188987401065X]
Crystallographers
J. Appl. Cryst. (1974). 7, 636 [doi:10.1107/S0021889874010673]
Acta Crystallographica and Journals of Applied Crystallography
J. Appl. Cryst. (1974). 7, 636-637 [doi:10.1107/S0021889874010661]
Notes and News
J. Appl. Cryst. (1974). 7, 637 [doi:10.1107/S0021889874010685]
Standard X-ray diffraction powder patterns. Section 11 by H. E. Swanson, H. F. McMurdie, M. C. Morris, E. H. Evans and B. Paretzkin
J. Appl. Cryst. (1974). 7, 637-638 [doi:10.1107/S0021889874010697]
The growth of crystals from liquids by J. C. Brice
J. Appl. Cryst. (1974). 7, 638 [doi:10.1107/S0021889874010703]
Crystal growth - an introduction edited by W. Bardsley, D. T. J. Hurle and J. B. Mullin
Copyright © International Union of Crystallography
IUCr Webmaster