Journal of Applied Crystallography

Volume 8, Part 1 (February 1975)



research papers



pdf version buy article online

J. Appl. Cryst. (1975). 8, 1-7    [doi:10.1107/S0021889875009417]

Automatic collection of powder data from photographs

E. J. Sonneveld and J. W. Visser



pdf version buy article online

J. Appl. Cryst. (1975). 8, 8-11    [doi:10.1107/S0021889875009429]

The effects of instrumental distortion in X-ray diffraction studies of liquids. I. A study of the relative effectiveness of several monochromatizing techniques

S. C. Smelser, E. H. Henninger, C. J. Pings and G. D. Wignall



pdf version buy article online

J. Appl. Cryst. (1975). 8, 12-14    [doi:10.1107/S0021889875009430]

Thickness measurements of wet protein crystals in the electron microscope

D. L. Dorset and D. F. Parsons



pdf version buy article online

J. Appl. Cryst. (1975). 8, 15-16    [doi:10.1107/S0021889875009442]

Studies of the size and the misorientation of the mosaic blocks in pure and doped single crystals of potassium chloride

G. B. Mitra and B. K. Samantaray



pdf version buy article online

J. Appl. Cryst. (1975). 8, 17-19    [doi:10.1107/S0021889875009454]

Quantitative interpretation of X-ray diffraction patterns of mixtures. III. Simultaneous determination of a set of reference intensities

F. H. Chung



pdf version buy article online

J. Appl. Cryst. (1975). 8, 20-28    [doi:10.1107/S0021889875009466]

The neutron Fourier chopper in protein crystallography

A. C. Nunes



pdf version buy article online

J. Appl. Cryst. (1975). 8, 29-36    [doi:10.1107/S0021889875009478]

Misorientation contrast of crystal subgrain boundaries in Berg-Barrett X-ray micrographs

C. Cm. Wu and R. W. Armstrong



pdf version buy article online

J. Appl. Cryst. (1975). 8, 37-41    [doi:10.1107/S002188987500948X]

The avoidance of multiple diffraction errors in single-crystal intensity measurements at low temperatures

R. Hine, J. P. G. Richards and K. Tichy



pdf version buy article online

J. Appl. Cryst. (1975). 8, 42-44    [doi:10.1107/S0021889875009491]

Measurement of strain and lattice parameter in epitaxic layers

M. Hart and K. H. Lloyd



pdf version buy article online

J. Appl. Cryst. (1975). 8, 45-48    [doi:10.1107/S0021889875009508]

A silicon powder diffraction standard reference material

C. R. Hubbard, H. E. Swanson and F. A. Mauer



pdf version buy article online

J. Appl. Cryst. (1975). 8, 49-53    [doi:10.1107/S002188987500951X]

Electron-induced decomposition of Tin(IV) sulphide in the electron microscope

G. J. Tatlock and M. White



pdf version buy article online

J. Appl. Cryst. (1975). 8, 54-59    [doi:10.1107/S0021889875009521]

PERNOD - Ein Programm zur Verfeinerung von Kristallstrukturparametern aus Neutronenbeugungspulverdiagrammen

S. Klein und H. Weitzel



pdf version buy article online

J. Appl. Cryst. (1975). 8, 60-64    [doi:10.1107/S0021889875009533]

The measurement of integrated intensities from polymeric-fibre X-ray diffraction photographs

I. H. Hall and M. G. Pass


short communications



pdf version buy article online

J. Appl. Cryst. (1975). 8, 65-66    [doi:10.1107/S0021889875009545]

Lattice parameter of the non-stoichiometric compound TiNx

S. Nagakura, T. Kusunoki, F. Kakimoto and Y. Hirotsu



pdf version buy article online

J. Appl. Cryst. (1975). 8, 66    [doi:10.1107/S0021889875009557]

The variances of the Cu K[beta] and Fe K[beta] spectral distributions

J. I. Langford and J. Tapia



pdf version buy article online

J. Appl. Cryst. (1975). 8, 67-68    [doi:10.1107/S0021889875009569]

Computer simulation of X-ray topographs of stacking faults in silicon

B. C. Wonsiewicz and J. R. Patel


crystal data



pdf version buy article online

J. Appl. Cryst. (1975). 8, 69-70    [doi:10.1107/S0021889875009570]

Crystal data for C.I. pigment Red 6, 4-chloro-2-nitrophenylazo-2-naphthol

A. Whitaker



pdf version buy article online

J. Appl. Cryst. (1975). 8, 70-73    [doi:10.1107/S0021889875009582]

Crystal data for Mn5Si2

J. P. Sénateur, R. Fruchart and C. B. Shoemaker


computer programs



pdf version buy article online

J. Appl. Cryst. (1975). 8, 73-75    [doi:10.1107/S0021889875009594]

A general computer program for the analysis of X-ray diffraction data for liquids

G. Licheri, G. Piccaluga and G. Pinna


laboratory notes



pdf version buy article online

J. Appl. Cryst. (1975). 8, 75    [doi:10.1107/S0021889875009600]

A miniature goniometer head

M. Atoji and E. F. Bielick


crystallographers



pdf version free

J. Appl. Cryst. (1975). 8, 75    [doi:10.1107/S0021889875009612]

Crystallographers


international union of crystallography



pdf version free

J. Appl. Cryst. (1975). 8, 76    [doi:10.1107/S0021889875009624]

Tenth General Assembly and International Congress of Crystallography


notes and news



pdf version free

J. Appl. Cryst. (1975). 8, 76-77    [doi:10.1107/S0021889875009636]

Notes and News


book reviews



pdf version free

J. Appl. Cryst. (1975). 8, 77    [doi:10.1107/S0021889875009648]

Diffusion and defect data edited by F. H. Wöhlbier



pdf version free

J. Appl. Cryst. (1975). 8, 77    [doi:10.1107/S002188987500965X]

An Introduction to X-ray spectrometry by R. Jenkins



pdf version free

J. Appl. Cryst. (1975). 8, 77-78    [doi:10.1107/S0021889875009661]

Applied mineralogy. Vol. 5. Apatite by D. McConnell



pdf version free

J. Appl. Cryst. (1975). 8, 78    [doi:10.1107/S0021889875009673]

Dislocations and plastic deformation by I. Kovács and L. Zsoldos


books received



pdf version free

J. Appl. Cryst. (1975). 8, 78    [doi:10.1107/S0021889875009685]

Mechanische anisotropie edited by H. P. Stüwe


Copyright © International Union of Crystallography
IUCr Webmaster