Journal of Applied Crystallography
Volume 8, Part 5 (October 1975)
J. Appl. Cryst. (1975). 8, 499-506 [doi:10.1107/S0021889875011132]
Cu K
2 elimination algorithm
J. Ladell, A. Zagofsky and S. Pearlman
J. Appl. Cryst. (1975). 8, 507-514 [doi:10.1107/S0021889875011144]
The phases of the AgI-KI-H2O system
L. R. Johnson
J. Appl. Cryst. (1975). 8, 515-519 [doi:10.1107/S0021889875011156]
Extension of the FIGATOM program to the automatic plotting of layers in close-packed structures
G. A. Langlet
J. Appl. Cryst. (1975). 8, 520-521 [doi:10.1107/S0021889875011168]
CAMEL JOCKEY, an absorption correction program
H. D. Flack
J. Appl. Cryst. (1975). 8, 522-524 [doi:10.1107/S002188987501117X]
Absolute intensity measurement in neutron powder diffraction
M. Merisalo and T. Paakkari
J. Appl. Cryst. (1975). 8, 525-529 [doi:10.1107/S0021889875011181]
CRT output of Fourier syntheses for the Nova 1200
J. P. Cowan, W. T. Blunck, W. M. Macintyre and R. C. Haltiwanger
J. Appl. Cryst. (1975). 8, 530-534 [doi:10.1107/S0021889875011193]
The influence of multiple Bragg scattering in
-ray diffractometry
J. R. Schneider
J. Appl. Cryst. (1975). 8, 535-537 [doi:10.1107/S002188987501120X]
Neutron small-angle scattering in aged Al-Mg
J. M. Raynal and M. Roth
J. Appl. Cryst. (1975). 8, 538-542 [doi:10.1107/S0021889875011211]
The determination of the scattering density distribution of polydisperse solutions by contrast variation: a neutron scattering study of ferritin
H. B. Stuhrmann and E. D. Duee
J. Appl. Cryst. (1975). 8, 543-544 [doi:10.1107/S0021889875011223]
Interpretation of the initial slope of the Fourier-coefficient-against-order curve for X-ray diffraction line profiles
G. B. Mitra and B. K. Mathur
J. Appl. Cryst. (1975). 8, 545-556 [doi:10.1107/S0021889875011235]
X-ray diffraction techniques for the analysis of epitaxic thin films
C. A. Wallace and R. C. C. Ward
J. Appl. Cryst. (1975). 8, 557-558 [doi:10.1107/S0021889875011247]
The use of a projector-digitizer-calculator combination for the interpretation of diffraction photographs
P. Gadó, A. Griger and T. Turmezey
J. Appl. Cryst. (1975). 8, 558-560 [doi:10.1107/S0021889875011259]
Computer enhancement of a diffuse scattering signal in an electron diffraction pattern
R. E. Villagrana and J. M. Garth
J. Appl. Cryst. (1975). 8, 560-561 [doi:10.1107/S0021889875011260]
Neutron time-of-flight techniques for investigation of the extinction effect
N. Niimura, S. Tomiyoshi, J. Takahashi and J. Harada
J. Appl. Cryst. (1975). 8, 562-564 [doi:10.1107/S0021889875011272]
Données cristallographiques sur cinq nouveaux tétramétaphosphates du type MIIMI2P4O12
M. C. Cavero-Ghersi et A. Durif
J. Appl. Cryst. (1975). 8, 564 [doi:10.1107/S0021889875011284]
Données cristallographiques sur le tripolyphosphate de zinc heptadécahydraté Zn5(P3O10)2.17H2O
M. T. Averbuch-Pouchot et A. Durif
J. Appl. Cryst. (1975). 8, 565-566 [doi:10.1107/S0021889875011296]
Crystal data for C.I. Pigment Red 2:1'-(2,5-dichlorophenyl)azo-2'-hydroxy-3'-phenylamidonaphthalene
A. Whitaker
J. Appl. Cryst. (1975). 8, 566-567 [doi:10.1107/S0021889875011302]
Crystal data on clomiphene hydrochloride, isomer A, C26H29ONCl2
J. S. Cantrell
J. Appl. Cryst. (1975). 8, 568 [doi:10.1107/S0021889875011314]
New crystal data for beryllium(II) bromide
F. Lazarini
J. Appl. Cryst. (1975). 8, 568-570 [doi:10.1107/S0021889875011326]
An adaptable disk-oriented automatic diffractometer control program
P. G. Lenhert
J. Appl. Cryst. (1975). 8, 571 [doi:10.1107/S0021889875011338]
A `defocusing' monochromator
A. M. Mathieson
J. Appl. Cryst. (1975). 8, 571 [doi:10.1107/S002188987501134X]
A method for mounting powder samples that avoids adverse strain effects at low temperatures
S. F. Cogan and F. H. Cocks
J. Appl. Cryst. (1975). 8, 572 [doi:10.1107/S0021889875011351]
Crystallographers
J. Appl. Cryst. (1975). 8, 572 [doi:10.1107/S0021889875011363]
International tables for X-ray crystallography. Vol. IV edited by J. A. Ibers and W. C. Hamilton
J. Appl. Cryst. (1975). 8, 572-573 [doi:10.1107/S0021889875011375]
Writing scientific papers in English by M. O'Connor and F. P. Woodford
J. Appl. Cryst. (1975). 8, 573 [doi:10.1107/S0021889875011387]
Systematic materials analysis. Vol. 1 edited by J. H. Richardson and R. V. Peterson
J. Appl. Cryst. (1975). 8, 573-574 [doi:10.1107/S0021889875011399]
X-ray diffraction procedures for polycrystalline and amorphous materials by H. P. Klug and L. E. Alexander
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