Journal of Applied Crystallography

Volume 8, Part 6 (December 1975)



research papers



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J. Appl. Cryst. (1975). 8, 575-577    [doi:10.1107/S0021889875011405]

A low-temperature X-ray study of the rhombohedral deformation of nickel oxide containing magnesium

G. Bliznakov, I. Tsolovski and D. Mehandjiev



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J. Appl. Cryst. (1975). 8, 578-581    [doi:10.1107/S0021889875011417]

Determination of structure factors by white X-ray diffraction from a powder sample of GaP

R. Uno and J. Ishigaki



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J. Appl. Cryst. (1975). 8, 582-588    [doi:10.1107/S0021889875011429]

Etude des fautes d'empilement dans les kaolinites partiellement désordonnées. I. Modèle d'empilement ne comportant que des fautes de translation

A. Plançon et C. Tchoubar



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J. Appl. Cryst. (1975). 8, 589-597    [doi:10.1107/S0021889875011430]

Programme Fortran pour l'analyse tridimensionnelle des textures sans hypothèse restrictive sur les symétries de l'échantillon

A. Clément et G. Durand



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J. Appl. Cryst. (1975). 8, 598-602    [doi:10.1107/S0021889875011442]

Periodic antiphase domain structure in the off-stoichiometric CuAu II phase

D. Watanabe and K. Takashima



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J. Appl. Cryst. (1975). 8, 603-608    [doi:10.1107/S0021889875011454]

Formation des polytypes rhomboédriques de sulfure de titane

J.-J. Legendre, R. Moret, E. Tronc et M. Huber



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J. Appl. Cryst. (1975). 8, 609-611    [doi:10.1107/S0021889875011466]

An improved [alpha]2 elimination

R. Delhez and E. J. Mittemeijer



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J. Appl. Cryst. (1975). 8, 612-614    [doi:10.1107/S0021889875011478]

An analysis of errors in the Fourier coefficients of the [alpha]1 line profile

R. Delhez and E. J. Mittemeijer



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J. Appl. Cryst. (1975). 8, 615-618    [doi:10.1107/S002188987501148X]

The asymmetry of neutron powder diffraction peaks

M. J. Cooper and J. P. Sayer



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J. Appl. Cryst. (1975). 8, 619-622    [doi:10.1107/S0021889875011491]

The estimated standard deviation of a step-scan-measured Bragg reflexion intensity

M. S. Lehmann



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J. Appl. Cryst. (1975). 8, 623-627    [doi:10.1107/S0021889875011508]

Effects of electrostatic field on the diffraction contrast of imperfections in quartz

S. Yamashita and N. Kato



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J. Appl. Cryst. (1975). 8, 628-635    [doi:10.1107/S002188987501151X]

Textures of cold-rolled pure aluminum measured by neutron and X-ray diffraction

O. J. Eder and R. Klemencic



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J. Appl. Cryst. (1975). 8, 636-644    [doi:10.1107/S0021889875011521]

The effect of non-linearity on a two-dimensional model of crystal-growth disorder

T. R. Welberry and R. Galbraith



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J. Appl. Cryst. (1975). 8, 645-648    [doi:10.1107/S0021889875011533]

On the dielectric behaviour of cadmium iodide polytypes

A. M. Fernandez and O. N. Srivastava



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J. Appl. Cryst. (1975). 8, 649-652    [doi:10.1107/S0021889875011545]

USCI - Ein Programm zur Indizierung von Einkristallreflexen

S. Klein



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J. Appl. Cryst. (1975). 8, 653-656    [doi:10.1107/S0021889875011557]

Analyse des bandes de diffraction affectées par une fonction défaut instrumentale

J. de Courville et D. Tchoubar



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J. Appl. Cryst. (1975). 8, 657-669    [doi:10.1107/S0021889875011569]

On the widths of dislocation images in X-ray topography under low-absorption conditions

J. E. A. Miltat and D. K. Bowen



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J. Appl. Cryst. (1975). 8, 670-673    [doi:10.1107/S0021889875011570]

Ein neues Verfahren zur gleichzeitigen Photographie zweier Netzebenen des reziproken Gitters

H. Jagodzinski



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J. Appl. Cryst. (1975). 8, 674-677    [doi:10.1107/S0021889875011582]

The termination effect for amorphous patterns

B. E. Warren and R. L. Mozzi



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J. Appl. Cryst. (1975). 8, 678-680    [doi:10.1107/S0021889875011594]

Measurement of Weissenberg films with a computer-controlled drum microdensitometer

L. Sjölin, G. Olsson and O. Lindqvist


short communications



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J. Appl. Cryst. (1975). 8, 681-683    [doi:10.1107/S0021889875011600]

Automated computer indexing of powder patterns: the monoclinic case

G. S. Smith and E. Kahara



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J. Appl. Cryst. (1975). 8, 683    [doi:10.1107/S0021889875011612]

Rapid determination of polarity sense by an energy-dispersive diffractometer: erratum

S. Hosoya and T. Fukamachi



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J. Appl. Cryst. (1975). 8, 684-686    [doi:10.1107/S0021889875011624]

Réalisation d'un cryostat à température réglable pour diffractométrie X sur monocristal

G. Odou et M. More


crystal data



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J. Appl. Cryst. (1975). 8, 686    [doi:10.1107/S0021889875011636]

Crystal data for the tetraphenylarsonium salt of the monoanion of theophylline, [(C6H5)4As] [C7N4O2H7].5H2O

T. J. Kistenmacher and H. B. Kerfoot



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J. Appl. Cryst. (1975). 8, 687-688    [doi:10.1107/S0021889875011648]

Crystal data for two polymorphic forms of PuOs2

R. B. Roof



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J. Appl. Cryst. (1975). 8, 689-693    [doi:10.1107/S002188987501165X]

Etude diffractométrique de chlorures doubles du type [beta]-K2SO4

J. Lamotte et M. Vermeire



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J. Appl. Cryst. (1975). 8, 693-694    [doi:10.1107/S0021889875011661]

An X-ray study of silver amalgam and its stoichiometry

K. A. Nirmala and D. S. S. Gowda



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J. Appl. Cryst. (1975). 8, 694-695    [doi:10.1107/S0021889875011673]

Crystal data for two anhydrous compounds of methanesulphonic acid: Ca(CH3SO3)2 and Ag(CH3SO3)

F. Charbonnier, R. Faure and H. Loiseleur


laboratory notes



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J. Appl. Cryst. (1975). 8, 696    [doi:10.1107/S0021889875011685]

Two simple devices for sealing wet single crystals in capillary tubes

F. D'Aprile and R. Moretto


crystallographers



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J. Appl. Cryst. (1975). 8, 696    [doi:10.1107/S0021889875011697]

Crystallographers


international union of crystallography



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J. Appl. Cryst. (1975). 8, 696-697    [doi:10.1107/S0021889875011703]

Acta Crystallographica and Journals of Applied Crystallography


notes and news



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J. Appl. Cryst. (1975). 8, 697    [doi:10.1107/S0021889875011715]

Notes and News


book reviews



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J. Appl. Cryst. (1975). 8, 697-698    [doi:10.1107/S0021889875011727]

Liquid phase epitaxy by G. M. Blom, S. L. Blank and J. M. Woodall



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J. Appl. Cryst. (1975). 8, 698    [doi:10.1107/S0021889875011739]

Metallphysik by G. E. R. Schulze


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