Journal of Applied Crystallography
Volume 8, Part 6 (December 1975)
J. Appl. Cryst. (1975). 8, 575-577 [doi:10.1107/S0021889875011405]
A low-temperature X-ray study of the rhombohedral deformation of nickel oxide containing magnesium
G. Bliznakov, I. Tsolovski and D. Mehandjiev
J. Appl. Cryst. (1975). 8, 578-581 [doi:10.1107/S0021889875011417]
Determination of structure factors by white X-ray diffraction from a powder sample of GaP
R. Uno and J. Ishigaki
J. Appl. Cryst. (1975). 8, 582-588 [doi:10.1107/S0021889875011429]
Etude des fautes d'empilement dans les kaolinites partiellement désordonnées. I. Modèle d'empilement ne comportant que des fautes de translation
A. Plançon et C. Tchoubar
J. Appl. Cryst. (1975). 8, 589-597 [doi:10.1107/S0021889875011430]
Programme Fortran pour l'analyse tridimensionnelle des textures sans hypothèse restrictive sur les symétries de l'échantillon
A. Clément et G. Durand
J. Appl. Cryst. (1975). 8, 598-602 [doi:10.1107/S0021889875011442]
Periodic antiphase domain structure in the off-stoichiometric CuAu II phase
D. Watanabe and K. Takashima
J. Appl. Cryst. (1975). 8, 603-608 [doi:10.1107/S0021889875011454]
Formation des polytypes rhomboédriques de sulfure de titane
J.-J. Legendre, R. Moret, E. Tronc et M. Huber
J. Appl. Cryst. (1975). 8, 609-611 [doi:10.1107/S0021889875011466]
An improved ![[alpha]](/logos/entities/alpha_rmgif.gif)
2 elimination
R. Delhez and E. J. Mittemeijer
J. Appl. Cryst. (1975). 8, 612-614 [doi:10.1107/S0021889875011478]
An analysis of errors in the Fourier coefficients of the 1 line profile
R. Delhez and E. J. Mittemeijer
J. Appl. Cryst. (1975). 8, 615-618 [doi:10.1107/S002188987501148X]
The asymmetry of neutron powder diffraction peaks
M. J. Cooper and J. P. Sayer
J. Appl. Cryst. (1975). 8, 619-622 [doi:10.1107/S0021889875011491]
The estimated standard deviation of a step-scan-measured Bragg reflexion intensity
M. S. Lehmann
J. Appl. Cryst. (1975). 8, 623-627 [doi:10.1107/S0021889875011508]
Effects of electrostatic field on the diffraction contrast of imperfections in quartz
S. Yamashita and N. Kato
J. Appl. Cryst. (1975). 8, 628-635 [doi:10.1107/S002188987501151X]
Textures of cold-rolled pure aluminum measured by neutron and X-ray diffraction
O. J. Eder and R. Klemencic
J. Appl. Cryst. (1975). 8, 636-644 [doi:10.1107/S0021889875011521]
The effect of non-linearity on a two-dimensional model of crystal-growth disorder
T. R. Welberry and R. Galbraith
J. Appl. Cryst. (1975). 8, 645-648 [doi:10.1107/S0021889875011533]
On the dielectric behaviour of cadmium iodide polytypes
A. M. Fernandez and O. N. Srivastava
J. Appl. Cryst. (1975). 8, 649-652 [doi:10.1107/S0021889875011545]
USCI - Ein Programm zur Indizierung von Einkristallreflexen
S. Klein
J. Appl. Cryst. (1975). 8, 653-656 [doi:10.1107/S0021889875011557]
Analyse des bandes de diffraction affectées par une fonction défaut instrumentale
J. de Courville et D. Tchoubar
J. Appl. Cryst. (1975). 8, 657-669 [doi:10.1107/S0021889875011569]
On the widths of dislocation images in X-ray topography under low-absorption conditions
J. E. A. Miltat and D. K. Bowen
J. Appl. Cryst. (1975). 8, 670-673 [doi:10.1107/S0021889875011570]
Ein neues Verfahren zur gleichzeitigen Photographie zweier Netzebenen des reziproken Gitters
H. Jagodzinski
J. Appl. Cryst. (1975). 8, 674-677 [doi:10.1107/S0021889875011582]
The termination effect for amorphous patterns
B. E. Warren and R. L. Mozzi
J. Appl. Cryst. (1975). 8, 678-680 [doi:10.1107/S0021889875011594]
Measurement of Weissenberg films with a computer-controlled drum microdensitometer
L. Sjölin, G. Olsson and O. Lindqvist
J. Appl. Cryst. (1975). 8, 681-683 [doi:10.1107/S0021889875011600]
Automated computer indexing of powder patterns: the monoclinic case
G. S. Smith and E. Kahara
J. Appl. Cryst. (1975). 8, 683 [doi:10.1107/S0021889875011612]
Rapid determination of polarity sense by an energy-dispersive diffractometer: erratum
S. Hosoya and T. Fukamachi
J. Appl. Cryst. (1975). 8, 684-686 [doi:10.1107/S0021889875011624]
Réalisation d'un cryostat à température réglable pour diffractométrie X sur monocristal
G. Odou et M. More
J. Appl. Cryst. (1975). 8, 686 [doi:10.1107/S0021889875011636]
Crystal data for the tetraphenylarsonium salt of the monoanion of theophylline, [(C6H5)4As] [C7N4O2H7].5H2O
T. J. Kistenmacher and H. B. Kerfoot
J. Appl. Cryst. (1975). 8, 687-688 [doi:10.1107/S0021889875011648]
Crystal data for two polymorphic forms of PuOs2
R. B. Roof
J. Appl. Cryst. (1975). 8, 689-693 [doi:10.1107/S002188987501165X]
Etude diffractométrique de chlorures doubles du type ![[beta]](/logos/entities/beta_rmgif.gif)
-K2SO4
J. Lamotte et M. Vermeire
J. Appl. Cryst. (1975). 8, 693-694 [doi:10.1107/S0021889875011661]
An X-ray study of silver amalgam and its stoichiometry
K. A. Nirmala and D. S. S. Gowda
J. Appl. Cryst. (1975). 8, 694-695 [doi:10.1107/S0021889875011673]
Crystal data for two anhydrous compounds of methanesulphonic acid: Ca(CH3SO3)2 and
Ag(CH3SO3)
F. Charbonnier, R. Faure and H. Loiseleur
J. Appl. Cryst. (1975). 8, 696 [doi:10.1107/S0021889875011685]
Two simple devices for sealing wet single crystals in capillary tubes
F. D'Aprile and R. Moretto
J. Appl. Cryst. (1975). 8, 696 [doi:10.1107/S0021889875011697]
Crystallographers
J. Appl. Cryst. (1975). 8, 696-697 [doi:10.1107/S0021889875011703]
Acta Crystallographica and Journals of Applied Crystallography
J. Appl. Cryst. (1975). 8, 697 [doi:10.1107/S0021889875011715]
Notes and News
J. Appl. Cryst. (1975). 8, 697-698 [doi:10.1107/S0021889875011727]
Liquid phase epitaxy by G. M. Blom, S. L. Blank and J. M. Woodall
J. Appl. Cryst. (1975). 8, 698 [doi:10.1107/S0021889875011739]
Metallphysik by G. E. R. Schulze
Copyright © International Union of Crystallography
IUCr Webmaster