Journal of Applied Crystallography
Volume 9, Part 1 (February 1976)
J. Appl. Cryst. (1976). 9, 1-8 [doi:10.1107/S002188987601039X]
Precision and accuracy of the Bond method as applied to small spherical crystals
C. R. Hubbard and F. A. Mauer
J. Appl. Cryst. (1976). 9, 9-13 [doi:10.1107/S0021889876010406]
Lattice parameter determination using Kikuchi-line intersections: application to olivine and feldspar
A. Olsen
J. Appl. Cryst. (1976). 9, 14-17 [doi:10.1107/S0021889876010418]
A low-temperature apparatus for single-crystal diffractometry. The unit-cell dimension of ![[alpha]](/logos/entities/alpha_rmgif.gif)
-quartz in the temperature range
86-298 K
S. Danielsson, I. Grenthe and Å. Oskarsson
J. Appl. Cryst. (1976). 9, 18-27 [doi:10.1107/S002188987601042X]
Changes in microstructure of oriented Ba3Co2Fe24O41
material during sintering. II
E. M. C. Huijser-Gerits and G. D. Rieck
J. Appl. Cryst. (1976). 9, 28-33 [doi:10.1107/S0021889876010431]
Indexing program for powder patterns especially suitable for triclinic, monoclinic and orthorhombic lattices
F. Kohlbeck and E. M. Hörl
J. Appl. Cryst. (1976). 9, 34-38 [doi:10.1107/S0021889876010443]
Stereographic X-ray reflection topography of dislocations in zinc
T. Vreeland Jnr
J. Appl. Cryst. (1976). 9, 39-41 [doi:10.1107/S0021889876010455]
X-ray topographic study of defects in olivine crystals
T. J. Slind and H. Sørum
J. Appl. Cryst. (1976). 9, 42-47 [doi:10.1107/S0021889876010467]
Absolute sign of piezoelectric and pyroelectric coefficients and spontaneous polarization temperature dependence in -Cu(IO3)2, Nd(IO3)3.H2O and LiIO3
R. Liminga and S. C. Abrahams
J. Appl. Cryst. (1976). 9, 48-50 [doi:10.1107/S0021889876010479]
Etching of bismuth-antimony crystals in a magnetic field
V. P. Bhatt, A. R. Vyas and G. R. Pandya
J. Appl. Cryst. (1976). 9, 50-51 [doi:10.1107/S0021889876010480]
A difference method for precise determination of lattice constants on Weissenberg counter diffractometers
J. Mad'ar, B. Pisonová and N. Zrubáková
J. Appl. Cryst. (1976). 9, 52 [doi:10.1107/S0021889876010509]
Pyroelectric sign of LiIO3
E. H. Turner
J. Appl. Cryst. (1976). 9, 52-53 [doi:10.1107/S0021889876010492]
Crystal data for the complexes of triphenylphosphine oxide (TPPO) and benzyldiphenylphosphine oxide (BDPPO) with cobalt (II) thiocyanate
C. R. Leite, N. Barelli and A. C. Massabni
J. Appl. Cryst. (1976). 9, 54-56 [doi:10.1107/S0021889876010510]
Crystal data for apophyllite
D. Mittra and S. Z. Ali
J. Appl. Cryst. (1976). 9, 57 [doi:10.1107/S0021889876010522]
Practical experiments in crystallography:rotation-photograph simulator
L. Bretherton and C. H. L. Kennard
J. Appl. Cryst. (1976). 9, 57 [doi:10.1107/S0021889876010534]
Model drawing programs:production of diperiodic patterns
K. G. Shields and C. H. L. Kennard
J. Appl. Cryst. (1976). 9, 57-58 [doi:10.1107/S0021889876010546]
Cyanoacrylate: a useful cement for mounting crystals
C. H. L. Kennard
J. Appl. Cryst. (1976). 9, 58 [doi:10.1107/S0021889876010558]
Crystallographers
J. Appl. Cryst. (1976). 9, 58 [doi:10.1107/S002188987601056X]
Commission on Journals
J. Appl. Cryst. (1976). 9, 58 [doi:10.1107/S0021889876010571]
Notes and News
J. Appl. Cryst. (1976). 9, 59 [doi:10.1107/S0021889876010583]
Deformation geometry for material scientists by C. N. Reid
J. Appl. Cryst. (1976). 9, 59 [doi:10.1107/S0021889876010595]
Metals, ceramics and polymers by O. H. Wyatt and D. Dew-Hughes
J. Appl. Cryst. (1976). 9, 59-60 [doi:10.1107/S0021889876010601]
Electron microprobe analysis by S. J. B. Reed
J. Appl. Cryst. (1976). 9, 60 [doi:10.1107/S0021889876010613]
Advances in X-ray analysis. Vol. 18 edited by W. L. Pickles, C. S. Barrett, J. B. Newkirk and C. O. Ruud
J. Appl. Cryst. (1976). 9, 60-61 [doi:10.1107/S0021889876010625]
Quantitative scanning electron microscopy edited by D. B. Holt, M. D. Muir, P. R. Grant and I. M. Boswarva
J. Appl. Cryst. (1976). 9, 61-62 [doi:10.1107/S0021889876010637]
Crystal growth by B. R. Pamplin
J. Appl. Cryst. (1976). 9, 62 [doi:10.1107/S0021889876010649]
Thorium: preparation and properties by J. F. Smith, O. N. Carlson, D. T. Peterson and T. E. Scott
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