Journal of Applied Crystallography
Volume 9, Part 2 (April 1976)
J. Appl. Cryst. (1976). 9, 63-67 [doi:10.1107/S0021889876010650]
Intensity correction factors for neutron powder diffraction measurements
M. J. Cooper and A. V. Glasspool
J. Appl. Cryst. (1976). 9, 68-80 [doi:10.1107/S0021889876010662]
Spherical-wave theory of the zero-absorption LLL X-ray or neutron interferometer
W. Bauspiess, U. Bonse and W. Graeff
J. Appl. Cryst. (1976). 9, 81-94 [doi:10.1107/S0021889876010674]
Digital processing of fibre diffraction patterns
R. D. B. Fraser, T. P. Macrae, A. Miller and R. J. Rowlands
J. Appl. Cryst. (1976). 9, 95-97 [doi:10.1107/S0021889876010686]
A snare affecting the recording of disorder diffuse reflections of `spike' type
S. Suzuki and A. R. Lang
J. Appl. Cryst. (1976). 9, 98-105 [doi:10.1107/S0021889876010698]
Stabilities and cell parameters for phases of the AgI-NH4I-H2O system
L. R. Johnson and B. L. Davis
J. Appl. Cryst. (1976). 9, 106-114 [doi:10.1107/S0021889876010704]
A method of increasing the detected intensity in X-ray powder diffractometers
R. Narayan
J. Appl. Cryst. (1976). 9, 115-118 [doi:10.1107/S0021889876010716]
A single-crystal automatic indexing procedure
R. A. Jacobson
J. Appl. Cryst. (1976). 9, 119-125 [doi:10.1107/S0021889876010728]
A four-circle single crystal diffractometer with a rotating anode source
W. R. Massey Jnr and P. C. Manor
J. Appl. Cryst. (1976). 9, 126-129 [doi:10.1107/S002188987601073X]
Influence de la variation du facteur de structure avec l'écart à la position de Bragg, sur l'analyse des profils de raie
F. Bley et M. Fayard
J. Appl. Cryst. (1976). 9, 130-133 [doi:10.1107/S0021889876010741]
Neutron Weissenberg photographs of satellite reflexions in plagioclase feldspars
D. Hohlwein and W. Joswig
J. Appl. Cryst. (1976). 9, 134-138 [doi:10.1107/S0021889876010753]
X-ray scattering and radial distribution function of liquid water
F. Hajdu, S. Lengyel and G. Pálinkás
J. Appl. Cryst. (1976). 9, 139-141 [doi:10.1107/S0021889876010765]
An estimate of crystallite size from the peak of the diffraction line-profile
W. L. Smith
J. Appl. Cryst. (1976). 9, 142-144 [doi:10.1107/S0021889876010777]
A facile location of goniometer tilt-axis position with respect to a single-crystal electron-diffraction pattern orientation
D. L. Dorset
J. Appl. Cryst. (1976). 9, 145-158 [doi:10.1107/S0021889876010789]
A second harmonic analyzer for the detection of non-centrosymmetry
J. P. Dougherty and S. K. Kurtz
J. Appl. Cryst. (1976). 9, 159-168 [doi:10.1107/S0021889876010790]
A comparison between the structures of amorphous and liquid Ag-Cu and Cu-Mg alloys
W. E. Lukens and C. N. J. Wagner
J. Appl. Cryst. (1976). 9, 169-174 [doi:10.1107/S0021889876010807]
The reference intensity ratio, I/Ic, for computer simulated powder
patterns
C. R. Hubbard, E. H. Evans and D. K. Smith
J. Appl. Cryst. (1976). 9, 175-177 [doi:10.1107/S0021889876010819]
Caractérisation du fer amorphe élaboré par décomposition à froid du fer carbonyle
J. P. Lauriat
J. Appl. Cryst. (1976). 9, 178-180 [doi:10.1107/S0021889876010820]
Topographic observation of micro defects (e.g. `swirls') in nearly perfect crystals
M. Renninger
J. Appl. Cryst. (1976). 9, 180-181 [doi:10.1107/S0021889876010832]
Méthode de détermination rapide par diffraction électronique des faces de croissance de l'hématite
F. Tissier, J. Bessières et R. Baro
J. Appl. Cryst. (1976). 9, 181-182 [doi:10.1107/S0021889876010844]
Extension of the FIGATOM program to the automatic plotting of layers in close-packed structures: erratum
G. A. Langlet
J. Appl. Cryst. (1976). 9, 183 [doi:10.1107/S0021889876010856]
Crystal data of three new potassium hydrogen polyiodate compounds
S. A. Hamid and G. Kunze
J. Appl. Cryst. (1976). 9, 184 [doi:10.1107/S0021889876010868]
Données cristallographiques sur le trimétaphosphate de plomb trihydraté Pb3(P3O9)2.3H2O
A. Durif et M. Brunel-Laügt
J. Appl. Cryst. (1976). 9, 185 [doi:10.1107/S002188987601087X]
Manipulator for Gandolfi-attachment X-ray spindles
G. H. Myer
J. Appl. Cryst. (1976). 9, 185 [doi:10.1107/S0021889876010881]
A stereographic net for measuring direction cosines
P. T. Clarke
J. Appl. Cryst. (1976). 9, 185 [doi:10.1107/S0021889876010893]
Crystallographers
J. Appl. Cryst. (1976). 9, 186 [doi:10.1107/S002188987601090X]
Commission on Crystallographic Apparatus
J. Appl. Cryst. (1976). 9, 186 [doi:10.1107/S0021889876012260]
Anomalous Scattering Errata
J. Appl. Cryst. (1976). 9, 186 [doi:10.1107/S0021889876010911]
The physics of liquid crystals by P. D. de Gennes
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