Journal of Applied Crystallography

Volume 9, Part 4 (August 1976)



research papers



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J. Appl. Cryst. (1976). 9, 263-268    [doi:10.1107/S0021889876011333]

Mise en évidence par diffraction électronique de la mise en ordre des atomes de nickel en excès par rapport à la stoechiométrie dans les alliages [beta]'-NiAl riches en nickel: formation d'une surstructure Ni2Al

F. Reynaud



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J. Appl. Cryst. (1976). 9, 269-272    [doi:10.1107/S0021889876011345]

Characteristics of a channel plate as an image intensifier for X-ray topography

M. Ando, S. Hosoya and K. Namikawa



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J. Appl. Cryst. (1976). 9, 273-278    [doi:10.1107/S0021889876011357]

Wavelength-dependent reflectivities of a few neutron monochromators

S. S. Malik



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J. Appl. Cryst. (1976). 9, 279-285    [doi:10.1107/S0021889876011369]

Etude des fautes d'empilement dans les kaolinites partiellement désordonnées. II. Modèles d'empilement comportant des fautes par rotation

A. Plançon et C. Tchoubar



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J. Appl. Cryst. (1976). 9, 286-290    [doi:10.1107/S0021889876011370]

The detection of small differences in lattice constant at low temperature by an energy-dispersive X-ray diffractometer

T. Nakajima, T. Fukamachi, O. Terasaki and S. Hosoya



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J. Appl. Cryst. (1976). 9, 291-295    [doi:10.1107/S0021889876011382]

Indexing crystal faces on SEM photographs

C. S. Strom



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J. Appl. Cryst. (1976). 9, 296-309    [doi:10.1107/S0021889876011394]

The neutron small-angle camera D11 at the high-flux reactor, Grenoble

K. Ibel



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J. Appl. Cryst. (1976). 9, 310-317    [doi:10.1107/S0021889876011400]

The influence of elastic anisotropy on the X-ray topographic image width of pure screw dislocations

H. Klapper



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J. Appl. Cryst. (1976). 9, 318-324    [doi:10.1107/S0021889876011412]

Etude du polytypisme des cristaux de carbure de silicium par diffraction électronique par réflexion

P. Michel, J. P. Gauthier et R. Riwan



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J. Appl. Cryst. (1976). 9, 325-334    [doi:10.1107/S0021889876011424]

The investigation of multi-reflection images from small crystallites using dark-field electron microscopy

W. Krakow and B. M. Siegel



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J. Appl. Cryst. (1976). 9, 335-338    [doi:10.1107/S0021889876011436]

Phase transition studies of pure and flux-grown barium titanate crystals

R. Clarke



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J. Appl. Cryst. (1976). 9, 339-341    [doi:10.1107/S0021889876011448]

A rapid procedure for aligning crystals on the precession camera

D. R. Stirling and F. J. de Wet



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J. Appl. Cryst. (1976). 9, 342-346    [doi:10.1107/S002188987601145X]

Lattice-parameter measurement technique for single crystals using two lattice planes, and its application to Gd3Ga5O12 single crystals

S. Isomae, S. Kishino, K. Takagi, M. Ishii and M. Maki



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J. Appl. Cryst. (1976). 9, 347-351    [doi:10.1107/S0021889876011461]

Méthode d'indexation rapide des diagrammes de diffraction électronique en réflexion de la face (00.1) de cristaux hexagonaux

J. Bessières, J. J. Heizmann et R. Baro


short communications



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J. Appl. Cryst. (1976). 9, 352    [doi:10.1107/S0021889876011473]

An erratum: effective particle size as determined by the initial slope of the Fourier-coefficient-against-order curve for X-ray diffraction line profiles

G. B. Mitra and B. K. Mathur



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J. Appl. Cryst. (1976). 9, 353-354    [doi:10.1107/S0021889876011485]

Epaisseur moyenne de domaines ordonnés de LiFe5O8 dans diverses directions

M. Bessière, F. Bley, Y. Calvayrac, S. Lefebvre et M. Fayard



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J. Appl. Cryst. (1976). 9, 355-356    [doi:10.1107/S0021889876011497]

Problems in the simulation of dark-field images in X-ray topography and electron microscopy

Y. Epelboin



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J. Appl. Cryst. (1976). 9, 356-357    [doi:10.1107/S0021889876011503]

Transmission absorption-edge technique for absolute polarity determination

S. C. Abrahams and J. L. Bernstein


crystal data



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J. Appl. Cryst. (1976). 9, 357-359    [doi:10.1107/S0021889876011515]

Crystal data for two new lanthanide acid iodates: Pr(IO3)3.HIO3 and 3La(IO3)3.JIO3.7H2O

S. C. Abrahams, J. L. Bernstein, J. W. Shiever and K. Nassau



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J. Appl. Cryst. (1976). 9, 360    [doi:10.1107/S0021889876011527]

Crystal data for tris (trimethylammonium) heptabromodicadmate

A. Daoud and J. C. Mutin



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J. Appl. Cryst. (1976). 9, 361-364    [doi:10.1107/S0021889876011539]

Crystal data for some o-molecular compounds

F. H. Herbstein, M. Kaftory and H. Regev



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J. Appl. Cryst. (1976). 9, 364-366    [doi:10.1107/S0021889876011540]

Constantes cristallographiques de CuSe2O5, CuSeO3 et Cu2SeO4

G. Meunier et M. Bertaud



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J. Appl. Cryst. (1976). 9, 366-367    [doi:10.1107/S0021889876011552]

Crystal data for a tetrahydrated compound of 1,2-ethanedisuplhonic acid with CuII: Cu[SO3(CH2)2SO3].4H2O

F. Charbonnier, J. Faure and H. Loiseleur



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J. Appl. Cryst. (1976). 9, 368-369    [doi:10.1107/S0021889876011564]

Données cristallographiques sur deux phosphates de scandium: Sc(PO3)3 et Sc4(P4O12)3

M. Bagieu-Beucher


laboratory notes



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J. Appl. Cryst. (1976). 9, 369-370    [doi:10.1107/S0021889876011576]

Alimentation autonome en azote liquide: application à un dispositif basse température Stoe

S. Lecocq et A. Thozet



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J. Appl. Cryst. (1976). 9, 370    [doi:10.1107/S0021889876011588]

Observation of lead L[alpha] radiation from commercial X-ray tubes

G. J. McIntyre and Z. Barnea


crystallographers



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J. Appl. Cryst. (1976). 9, 370-371    [doi:10.1107/S002188987601159X]

Crystallographers


international union of crystallography



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J. Appl. Cryst. (1976). 9, 371    [doi:10.1107/S0021889876011606]

Report of the Tenth General Assembly and International Congress of Crystallography



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J. Appl. Cryst. (1976). 9, 371    [doi:10.1107/S0021889876012272]

World Directory of Crystallographers. Fifth Edition


book reviews



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J. Appl. Cryst. (1976). 9, 371    [doi:10.1107/S0021889876011618]

Real solids and radiation by A. E. Hughes and D. Pooley



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J. Appl. Cryst. (1976). 9, 371-372    [doi:10.1107/S002188987601162X]

Fraktionierung der Spurenelemente bei der Kristallisation by H. E. Usdowski



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J. Appl. Cryst. (1976). 9, 372    [doi:10.1107/S0021889876011631]

Surface physics by M. Prutton


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