Journal of Applied Crystallography
Volume 9, Part 5 (October 1976)
J. Appl. Cryst. (1976). 9, 373-374 [doi:10.1107/S0021889876011643]
The use of structure factors in the refinement of unit-cell parameters from powder diffraction data
A. Alberti
J. Appl. Cryst. (1976). 9, 375-377 [doi:10.1107/S0021889876011655]
An X-ray topographic study of dislocations in a LiNbO3 crystal
Y. Okada and T. Iizuka
J. Appl. Cryst. (1976). 9, 378-381 [doi:10.1107/S0021889876011667]
A low-temperature glass cryostat for X-ray diffraction work
H. Maeta, T. Kato and S. Okuda
J. Appl. Cryst. (1976). 9, 382-390 [doi:10.1107/S0021889876011679]
Profile analysis of amorphous haloes by means of a Fourier transformation, with special reference to the structures of amorphous Pt-C and Ni-P
K. Doi
J. Appl. Cryst. (1976). 9, 391-393 [doi:10.1107/S0021889876011680]
Twinning in Ti4O7
J. L. Hodeau, M. Marezio, C. Schlenker, R. Buder and S. Lakkis
J. Appl. Cryst. (1976). 9, 394-402 [doi:10.1107/S0021889876011692]
Absolute structure-factor measurements in imperfect single crystals by means of ![[zeta]](/logos/entities/zeta_rmgif.gif)
-ray diffractometry
J. R. Schneider
J. Appl. Cryst. (1976). 9, 403-406 [doi:10.1107/S0021889876011709]
The thermal expansion of 2H-MoS2, 2H-MoSe2 and 2H-WSe2 between 20 and 800°C
S. H. El-Mahalawy and B. L. Evans
J. Appl. Cryst. (1976). 9, 407-410 [doi:10.1107/S0021889876011710]
Dislocations in molybdenum ditelluride
M. K. Agarwal and M. J. Capers
J. Appl. Cryst. (1976). 9, 411 [doi:10.1107/S0021889876011722]
Crystal data for phosphorus oxynitride
K. R. Waerstad and J. M. Sullivan
J. Appl. Cryst. (1976). 9, 412 [doi:10.1107/S0021889876011734]
Données cristallographiques sur un phosphobéryllate d'ammonium: Be2P3O10NH4
M. Bagieu-Beucher, A. Durif et M. T. Averbuch-Pouchot
J. Appl. Cryst. (1976). 9, 413-414 [doi:10.1107/S0021889876011746]
Crystal data for lanthanide orthophosphates
M. Kizilyalli and A. J. E. Welch
J. Appl. Cryst. (1976). 9, 415-416 [doi:10.1107/S0021889876011758]
Präparation von biologischem Material und eine verbesserte Präparatträgerhalterung für Kiessig-Kameras
J. Paulick
J. Appl. Cryst. (1976). 9, 416 [doi:10.1107/S002188987601176X]
Crystal mounter
L. Bretherton and C. H. L. Kennard
J. Appl. Cryst. (1976). 9, 416-417 [doi:10.1107/S0021889876011771]
A simple and rapid coordinate measurement system for large-molecule oscillation photographs
L. I. Grossman and G. A. Petsko
J. Appl. Cryst. (1976). 9, 417 [doi:10.1107/S0021889876011783]
Crystallographers
J. Appl. Cryst. (1976). 9, 417 [doi:10.1107/S0021889876011795]
International Tables for X-ray Crystallography
J. Appl. Cryst. (1976). 9, 417 [doi:10.1107/S0021889876011801]
Symmetry Aspects of M.C.Escher's Periodic Drawings
J. Appl. Cryst. (1976). 9, 417-418 [doi:10.1107/S0021889876011813]
Notes and News
J. Appl. Cryst. (1976). 9, 418 [doi:10.1107/S0021889876011825]
Practical electron microscopy in materials science edited by J. W. Edington
J. Appl. Cryst. (1976). 9, 418 [doi:10.1107/S0021889876011837]
Applications of liquid crystals by G. Meier, E. Sackamann and J. G. Grabmaier
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