Journal of Applied Crystallography

Volume 10, Part 1 (February 1977)



research papers



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J. Appl. Cryst. (1977). 10, 1-6    [doi:10.1107/S0021889877012679]

X-ray diffraction study of a one-dimensional GaAs-AlAs superlattice

A. Segmüller, P. Krishna and L. Esaki



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J. Appl. Cryst. (1977). 10, 7-11    [doi:10.1107/S0021889877012680]

Least-squares structure refinement based on profile analysis of powder film intensity data measured on an automatic microdensitometer

G. Malmros and J. O. Thomas



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J. Appl. Cryst. (1977). 10, 12-13    [doi:10.1107/S0021889877012692]

Peak shifts and peak broadening in powder neutron-diffraction patterns due to finite aperture counters

M. W. Thomas



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J. Appl. Cryst. (1977). 10, 14-17    [doi:10.1107/S0021889877012709]

The temperature dependence of the long-range order parameter of Ni3Al

D. P. Pope and J. L. Garin



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J. Appl. Cryst. (1977). 10, 18-20    [doi:10.1107/S0021889877012710]

Helium temperatures in a four-circle neutron diffractometer

I. R. Herbert and S. J. Campbell



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J. Appl. Cryst. (1977). 10, 21-23    [doi:10.1107/S0021889877012722]

Determination of spherical voids in layered structures (void program)

G. A. Langlet, M. O. Figueiredo and J. Lima-de-Faria



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J. Appl. Cryst. (1977). 10, 24    [doi:10.1107/S0021889877012734]

An APL solution for the sphere tangent to four spheres

G. A. Langlet



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J. Appl. Cryst. (1977). 10, 25-27    [doi:10.1107/S0021889877012746]

On the determination of the metastable miscibility gap in ternary alloys from small-angle measurements. I. Theoretical background

V. Gerold



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J. Appl. Cryst. (1977). 10, 28-31    [doi:10.1107/S0021889877012758]

On the determination of the metastable miscibility gap in ternary alloys from small-angle measurements. II. Application to the system Al-Zn-Mg

V. Gerold, J. E. Epperson and G. Kostorz



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J. Appl. Cryst. (1977). 10, 32-36    [doi:10.1107/S002188987701276X]

Further studies on the dielectric behaviour of cadmium iodide polytypes

A. M. Fernandez and O. N. Srivastava



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J. Appl. Cryst. (1977). 10, 37-44    [doi:10.1107/S0021889877012771]

Dimensions de micelles mixtes de p-alkylbenzènesulfonates par diffusion central des rayons X

C. Cabos, P. Delord et J. Rouviere



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J. Appl. Cryst. (1977). 10, 45-51    [doi:10.1107/S0021889877012783]

A multiple-counter X-ray diffractometer with equatorial geometry

D. W. Banner, P. R. Evans, D. J. Marsh and D. C. Phillips



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J. Appl. Cryst. (1977). 10, 52-56    [doi:10.1107/S0021889877012795]

Structure of TiNx studied by electron diffraction and microscopy

S. Nagakura and T. Kusunoki



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J. Appl. Cryst. (1977). 10, 57-59    [doi:10.1107/S0021889877012801]

X-ray misorientation contrast for a (lineage) subgrain boundary

R. W. Armstrong


short communications



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J. Appl. Cryst. (1977). 10, 60-61    [doi:10.1107/S0021889877012813]

Minimizing thermal gradient problems during precession photography of protein crystals

C. Thaxton and E. Lattman



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J. Appl. Cryst. (1977). 10, 62-63    [doi:10.1107/S0021889877012825]

Recording of electron-diffraction patterns of radiation-sensitive materials in the high-voltage electron microscope with luminescent radiographic screens

M. V. King and D. F. Parsons



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J. Appl. Cryst. (1977). 10, 64-66    [doi:10.1107/S0021889877012837]

An automated procedure for the correction of background due to inelastic scattering in electron diffraction patterns

R. D. B. Fraser, T. P. Macrae, E. Suzuki and P. A. Tulloch



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J. Appl. Cryst. (1977). 10, 66-68    [doi:10.1107/S0021889877012849]

The approximation of symmetric X-ray peaks by Pearson type VII distributions

M. M. Hall Jnr, V. G. Veeraraghavan, H. Rubin and P. G. Winchell



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J. Appl. Cryst. (1977). 10, 68    [doi:10.1107/S0021889877012850]

The problem of white radiation in the measurement of intensities with a solid-state detector: erratum

C. J. Howard and R. D. G. Jones


crystal data



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J. Appl. Cryst. (1977). 10, 68-69    [doi:10.1107/S0021889877012862]

Crystal data for some molecular complexes of hexamethylenetetramine with phenols

C.-S. Tse, Y.-S. Wong and T. C. W. Mak



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J. Appl. Cryst. (1977). 10, 70-71    [doi:10.1107/S0021889877012874]

Crystal data for [beta]-Ga2Se3

M. Y. Khan and S. Z. Ali



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J. Appl. Cryst. (1977). 10, 72    [doi:10.1107/S0021889877012886]

Crystal data for zinc oxysulphate [Zn3O(SO4)2]

E. Erdös


computer programs



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J. Appl. Cryst. (1977). 10, 73-74    [doi:10.1107/S0021889877012898]

LAZY PULVERIX, a computer program, for calculating X-ray and neutron diffraction powder patterns

K. Yvon, W. Jeitschko and E. Parthé


meeting reports



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J. Appl. Cryst. (1977). 10, 75    [doi:10.1107/S0021889877012904]

The Third European Crystallographic Meeting

S. C. Abrahams


crystallographers



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J. Appl. Cryst. (1977). 10, 76    [doi:10.1107/S0021889877012916]

Crystallographers


international union of crystallography



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J. Appl. Cryst. (1977). 10, 76    [doi:10.1107/S0021889877012928]

Eleventh General Assembly and International Congress of Crystallography


notes and news



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J. Appl. Cryst. (1977). 10, 76    [doi:10.1107/S002188987701293X]

Notes and News


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