Journal of Applied Crystallography

Volume 10, Part 3 (June 1977)



research papers



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J. Appl. Cryst. (1977). 10, 137-140    [doi:10.1107/S0021889877013120]

On Soulé-Porod plots of protein X-ray scattering data

N. S. Murthy and J. R. Knox



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J. Appl. Cryst. (1977). 10, 141-146    [doi:10.1107/S0021889877013132]

Paracrystalline nature of myelin

A. Hybl



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J. Appl. Cryst. (1977). 10, 147-150    [doi:10.1107/S0021889877013144]

A method of quantitative phase analysis without standards

L. S. Zevin



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J. Appl. Cryst. (1977). 10, 151-155    [doi:10.1107/S0021889877013156]

Etude in situ par diffusion centrale des rayons X d'une faible addition de Mg sur les mécanismes de précipitation d'un alliage Al-15% Zn en poids

A. M. Flank et A. Naudon



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J. Appl. Cryst. (1977). 10, 156-166    [doi:10.1107/S0021889877013168]

Photographing the reciprocal lattice with the axis of the film cylinder intersecting the rotation axis of the crystal at 45°

C. Chieh, R. Stokhuyzen and A. Beck



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J. Appl. Cryst. (1977). 10, 167-171    [doi:10.1107/S002188987701317X]

High-pressure neutron diffraction study of Si2N2O

S. R. Srinivasa, L. Cartz, J. D. Jorgensen, T. G. Worlton, R. A. Beyerlein and M. Billy



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J. Appl. Cryst. (1977). 10, 172-176    [doi:10.1107/S0021889877013181]

The small-angle scattering of neutrons by surface imperfections

M. Roth



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J. Appl. Cryst. (1977). 10, 177-179    [doi:10.1107/S0021889877013193]

Intensity measurements of twinned or grown-together crystals on single-crystal diffractometers

W. Denner, H. d'Amour, H. Schulz and W. Stoeger



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J. Appl. Cryst. (1977). 10, 180-183    [doi:10.1107/S002188987701320X]

Temperature dependence of the orthorhombic asymmetry of gallium metal

W. H. Haemmerle and J. B. Lastovka



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J. Appl. Cryst. (1977). 10, 184-190    [doi:10.1107/S0021889877013211]

X-ray line-profile analysis. I. A method for unfolding diffraction profiles

B. Moraweck, Ph. de Montgolfier and A. J. Renouprez



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J. Appl. Cryst. (1977). 10, 191-196    [doi:10.1107/S0021889877013223]

X-ray line-profile analysis. II. Determination of the crystallite-diameter distribution function

B. Moraweck, Ph. de Montgolfier and A. J. Renouprez



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J. Appl. Cryst. (1977). 10, 197-199    [doi:10.1107/S0021889877013235]

Equipping a four-circle single-crystal diffractometer with an interchangeable Si(Li) solid-state detector

D. F. Grant, E. J. Lisher and R. H. Mitchell


crystal data



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J. Appl. Cryst. (1977). 10, 200    [doi:10.1107/S0021889877013247]

Données cristallo-chimiques sur le tétrapolyphosphate mixte de germanium et ammonium: (NH4)2GeP4O13

M. T. Averbuch-Pouchot



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J. Appl. Cryst. (1977). 10, 201-202    [doi:10.1107/S0021889877013259]

Crystal data for methylammonium manganese(II) trichloride dihydrate, CH3NH3MnCl3.2H2O

W. Bachmann, H. R. Oswald and J. R. Günter



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J. Appl. Cryst. (1977). 10, 202    [doi:10.1107/S0021889877013260]

Relations structurales entre GeS2 et GeS2-H.T.

E. Godlewski et P. Laruelle



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J. Appl. Cryst. (1977). 10, 203-205    [doi:10.1107/S0021889877013272]

Crystal data for two series of solid solutions: (RbxK1-x) Ag4I5 and (RBxK1-x)2AgI3

L. Bonpunt, Y. Obaid and Y. Haget


computer programs



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J. Appl. Cryst. (1977). 10, 206-208    [doi:10.1107/S0021889877013284]

A Fortran computer program to collect X-ray diffraction data on macromolecules

R. L. Girling, M. K. Wood and E. E. Abola


laboratory notes



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J. Appl. Cryst. (1977). 10, 208    [doi:10.1107/S0021889877013296]

A new single-crystal heater for the kappa diffractometer

C. E. Rice and W. R. Robinson



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J. Appl. Cryst. (1977). 10, 208-209    [doi:10.1107/S0021889877013302]

A portable apparatus for mounting air-sensitive crystals

G. A. Rodley and Y. S. Ng


letters to the editor



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J. Appl. Cryst. (1977). 10, 209-210    [doi:10.1107/S0021889877013314]

The proper description of low-temperature X-ray diffraction apparatus

R. Rudman


crystallographers



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J. Appl. Cryst. (1977). 10, 210    [doi:10.1107/S0021889877013326]

Crystallographers


international union of crystallography



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J. Appl. Cryst. (1977). 10, 211    [doi:10.1107/S0021889877013338]

Establishment of a President's Fund



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J. Appl. Cryst. (1977). 10, 211    [doi:10.1107/S002188987701334X]

International Tables for X-ray Crystallography


notes and news



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J. Appl. Cryst. (1977). 10, 211    [doi:10.1107/S0021889877013351]

Notes and News


book reviews



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J. Appl. Cryst. (1977). 10, 211-212    [doi:10.1107/S0021889877013363]

Characterisation of epitaxial semiconductor films edited by H. Kressel



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J. Appl. Cryst. (1977). 10, 212    [doi:10.1107/S0021889877013375]

Vapour growth and epitaxy edited by G. W. Cullen, E. Kaldis, R. L. Parker and C. J. M. Rooymans


books received



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J. Appl. Cryst. (1977). 10, 212    [doi:10.1107/S0021889877013387]

Developments in electron microscopy and analysis edited by J. A. Venables


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