Journal of Applied Crystallography
Volume 10, Part 3 (June 1977)
J. Appl. Cryst. (1977). 10, 137-140 [doi:10.1107/S0021889877013120]
On Soulé-Porod plots of protein X-ray scattering data
N. S. Murthy and J. R. Knox
J. Appl. Cryst. (1977). 10, 141-146 [doi:10.1107/S0021889877013132]
Paracrystalline nature of myelin
A. Hybl
J. Appl. Cryst. (1977). 10, 147-150 [doi:10.1107/S0021889877013144]
A method of quantitative phase analysis without standards
L. S. Zevin
J. Appl. Cryst. (1977). 10, 151-155 [doi:10.1107/S0021889877013156]
Etude in situ par diffusion centrale des rayons X d'une faible addition de Mg sur les mécanismes de précipitation d'un alliage Al-15% Zn en poids
A. M. Flank et A. Naudon
J. Appl. Cryst. (1977). 10, 156-166 [doi:10.1107/S0021889877013168]
Photographing the reciprocal lattice with the axis of the film cylinder intersecting the rotation axis of the crystal at 45°
C. Chieh, R. Stokhuyzen and A. Beck
J. Appl. Cryst. (1977). 10, 167-171 [doi:10.1107/S002188987701317X]
High-pressure neutron diffraction study of Si2N2O
S. R. Srinivasa, L. Cartz, J. D. Jorgensen, T. G. Worlton, R. A. Beyerlein and M. Billy
J. Appl. Cryst. (1977). 10, 172-176 [doi:10.1107/S0021889877013181]
The small-angle scattering of neutrons by surface imperfections
M. Roth
J. Appl. Cryst. (1977). 10, 177-179 [doi:10.1107/S0021889877013193]
Intensity measurements of twinned or grown-together crystals on single-crystal diffractometers
W. Denner, H. d'Amour, H. Schulz and W. Stoeger
J. Appl. Cryst. (1977). 10, 180-183 [doi:10.1107/S002188987701320X]
Temperature dependence of the orthorhombic asymmetry of gallium metal
W. H. Haemmerle and J. B. Lastovka
J. Appl. Cryst. (1977). 10, 184-190 [doi:10.1107/S0021889877013211]
X-ray line-profile analysis. I. A method for unfolding diffraction profiles
B. Moraweck, Ph. de Montgolfier and A. J. Renouprez
J. Appl. Cryst. (1977). 10, 191-196 [doi:10.1107/S0021889877013223]
X-ray line-profile analysis. II. Determination of the crystallite-diameter distribution function
B. Moraweck, Ph. de Montgolfier and A. J. Renouprez
J. Appl. Cryst. (1977). 10, 197-199 [doi:10.1107/S0021889877013235]
Equipping a four-circle single-crystal diffractometer with an interchangeable Si(Li) solid-state detector
D. F. Grant, E. J. Lisher and R. H. Mitchell
J. Appl. Cryst. (1977). 10, 200 [doi:10.1107/S0021889877013247]
Données cristallo-chimiques sur le tétrapolyphosphate mixte de germanium et ammonium: (NH4)2GeP4O13
M. T. Averbuch-Pouchot
J. Appl. Cryst. (1977). 10, 201-202 [doi:10.1107/S0021889877013259]
Crystal data for methylammonium manganese(II) trichloride dihydrate, CH3NH3MnCl3.2H2O
W. Bachmann, H. R. Oswald and J. R. Günter
J. Appl. Cryst. (1977). 10, 202 [doi:10.1107/S0021889877013260]
Relations structurales entre GeS2 et GeS2-H.T.
E. Godlewski et P. Laruelle
J. Appl. Cryst. (1977). 10, 203-205 [doi:10.1107/S0021889877013272]
Crystal data for two series of solid solutions: (RbxK1-x)
Ag4I5 and (RBxK1-x)2AgI3
L. Bonpunt, Y. Obaid and Y. Haget
J. Appl. Cryst. (1977). 10, 206-208 [doi:10.1107/S0021889877013284]
A Fortran computer program to collect X-ray diffraction data on macromolecules
R. L. Girling, M. K. Wood and E. E. Abola
J. Appl. Cryst. (1977). 10, 208 [doi:10.1107/S0021889877013296]
A new single-crystal heater for the kappa diffractometer
C. E. Rice and W. R. Robinson
J. Appl. Cryst. (1977). 10, 208-209 [doi:10.1107/S0021889877013302]
A portable apparatus for mounting air-sensitive crystals
G. A. Rodley and Y. S. Ng
J. Appl. Cryst. (1977). 10, 209-210 [doi:10.1107/S0021889877013314]
The proper description of low-temperature X-ray diffraction apparatus
R. Rudman
J. Appl. Cryst. (1977). 10, 210 [doi:10.1107/S0021889877013326]
Crystallographers
J. Appl. Cryst. (1977). 10, 211 [doi:10.1107/S0021889877013338]
Establishment of a President's Fund
J. Appl. Cryst. (1977). 10, 211 [doi:10.1107/S002188987701334X]
International Tables for X-ray Crystallography
J. Appl. Cryst. (1977). 10, 211 [doi:10.1107/S0021889877013351]
Notes and News
J. Appl. Cryst. (1977). 10, 211-212 [doi:10.1107/S0021889877013363]
Characterisation of epitaxial semiconductor films edited by H. Kressel
J. Appl. Cryst. (1977). 10, 212 [doi:10.1107/S0021889877013375]
Vapour growth and epitaxy edited by G. W. Cullen, E. Kaldis, R. L. Parker and C. J. M. Rooymans
J. Appl. Cryst. (1977). 10, 212 [doi:10.1107/S0021889877013387]
Developments in electron microscopy and analysis edited by J. A. Venables
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