Journal of Applied Crystallography

Volume 10, Part 4 (August 1977)



research papers



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J. Appl. Cryst. (1977). 10, 213-219    [doi:10.1107/S0021889877013399]

Perfection et stabilité thermique des structures lamellaires de l'eutectique Pb-Sn

J. J. Favier, M. Turpin, C. Petipas et B. Labulle



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J. Appl. Cryst. (1977). 10, 220-227    [doi:10.1107/S0021889877013405]

Structural model for the \def\lambdabar{\ifvmode\noindent\fi{\hbox{$\lambda$}\kern-0.35em\raise0.7ex\hbox{-}\kern0.2em}}\lambdabar-phase transformation

J. M. Sanchez and D. de Fontaine



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J. Appl. Cryst. (1977). 10, 228-237    [doi:10.1107/S0021889877013417]

Electron diffraction patterns and extinction distances in rutile TiO2

M. G. Blanchin, E. Vicario and R. A. Ploc



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J. Appl. Cryst. (1977). 10, 238-246    [doi:10.1107/S0021889877013429]

The influence of specimen absorption and beam divergence on the accurate determination of lattice parameters by the Debye-Scherrer method

P. A. Tempest



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J. Appl. Cryst. (1977). 10, 247-251    [doi:10.1107/S0021889877013430]

Investigation of the ferroelastic domain structure in lead phosphate

M. Chabin, F. Gilletta and J. P. Ildefonse



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J. Appl. Cryst. (1977). 10, 252-255    [doi:10.1107/S0021889877013442]

Estimating the unit-cell volume from one line in a powder diffraction pattern: the triclinic case

G. S. Smith



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J. Appl. Cryst. (1977). 10, 256-261    [doi:10.1107/S0021889877013454]

X-ray diffraction studies of aqueous solutions of urea

R. Adams, H. H. M. Balyuzi and R. E. Burge



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J. Appl. Cryst. (1977). 10, 262-269    [doi:10.1107/S0021889877013466]

Application of the pattern-fitting structure-refinement method of X-ray powder diffractometer patterns

R. A. Young, P. E. Mackie and R. B. von Dreele



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J. Appl. Cryst. (1977). 10, 270-276    [doi:10.1107/S0021889877013478]

Structural transformation of tricalcium silicate during hydration

P. A. Slegers, M. Genet, A. J. Léonard and J. J. Fripiat



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J. Appl. Cryst. (1977). 10, 277-280    [doi:10.1107/S002188987701348X]

Powder neutron diffraction-refinement of the total pattern

T. M. Sabine and P. J. Clarke



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J. Appl. Cryst. (1977). 10, 281-286    [doi:10.1107/S0021889877013491]

Dislocation contrast in X-ray synchrotron topographs

B. K. Tanner, D. Midgley and M. Safa



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J. Appl. Cryst. (1977). 10, 287-290    [doi:10.1107/S0021889877013508]

Asymmetric X-ray Bragg reflexion and shallow strain distribution in silicon single crystals

A. Fukuhara and Y. Takano



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J. Appl. Cryst. (1977). 10, 291-307    [doi:10.1107/S002188987701351X]

La transformation de Rowland: analyse cristallographique de modèles de sphères dures; application à l'étude des relations d'orientation obtenues lors de la recristallisation de Monocristaux d'aluminium

A. Dubertret et A. Le Lann