Journal of Applied Crystallography
Volume 10, Part 4 (August 1977)
J. Appl. Cryst. (1977). 10, 213-219 [doi:10.1107/S0021889877013399]
Perfection et stabilité thermique des structures lamellaires de l'eutectique Pb-Sn
J. J. Favier, M. Turpin, C. Petipas et B. Labulle
J. Appl. Cryst. (1977). 10, 220-227 [doi:10.1107/S0021889877013405]
Structural model for the 
-phase transformation
J. M. Sanchez and D. de Fontaine
J. Appl. Cryst. (1977). 10, 228-237 [doi:10.1107/S0021889877013417]
Electron diffraction patterns and extinction distances in rutile TiO2
M. G. Blanchin, E. Vicario and R. A. Ploc
J. Appl. Cryst. (1977). 10, 238-246 [doi:10.1107/S0021889877013429]
The influence of specimen absorption and beam divergence on the accurate determination of lattice parameters by the Debye-Scherrer method
P. A. Tempest
J. Appl. Cryst. (1977). 10, 247-251 [doi:10.1107/S0021889877013430]
Investigation of the ferroelastic domain structure in lead phosphate
M. Chabin, F. Gilletta and J. P. Ildefonse
J. Appl. Cryst. (1977). 10, 252-255 [doi:10.1107/S0021889877013442]
Estimating the unit-cell volume from one line in a powder diffraction pattern: the triclinic case
G. S. Smith
J. Appl. Cryst. (1977). 10, 256-261 [doi:10.1107/S0021889877013454]
X-ray diffraction studies of aqueous solutions of urea
R. Adams, H. H. M. Balyuzi and R. E. Burge
J. Appl. Cryst. (1977). 10, 262-269 [doi:10.1107/S0021889877013466]
Application of the pattern-fitting structure-refinement method of X-ray powder diffractometer patterns
R. A. Young, P. E. Mackie and R. B. von Dreele
J. Appl. Cryst. (1977). 10, 270-276 [doi:10.1107/S0021889877013478]
Structural transformation of tricalcium silicate during hydration
P. A. Slegers, M. Genet, A. J. Léonard and J. J. Fripiat
J. Appl. Cryst. (1977). 10, 277-280 [doi:10.1107/S002188987701348X]
Powder neutron diffraction-refinement of the total pattern
T. M. Sabine and P. J. Clarke
J. Appl. Cryst. (1977). 10, 281-286 [doi:10.1107/S0021889877013491]
Dislocation contrast in X-ray synchrotron topographs
B. K. Tanner, D. Midgley and M. Safa
J. Appl. Cryst. (1977). 10, 287-290 [doi:10.1107/S0021889877013508]
Asymmetric X-ray Bragg reflexion and shallow strain distribution in silicon single crystals
A. Fukuhara and Y. Takano
J. Appl. Cryst. (1977). 10, 291-307 [doi:10.1107/S002188987701351X]
La transformation de Rowland: analyse cristallographique de modèles de sphères dures; application à l'étude des relations d'orientation obtenues lors de la recristallisation
de Monocristaux d'aluminium
A. Dubertret et A. Le Lann