Journal of Applied Crystallography

Volume 10, Part 5 (October 1977)



research papers



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J. Appl. Cryst. (1977). 10, 369-371    [doi:10.1107/S0021889877013788]

Multiple diffraction in spinel and the space-group ambiguity

P. Thompson and N. W. Grimes



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J. Appl. Cryst. (1977). 10, 372-375    [doi:10.1107/S002188987701379X]

Contribution de la diffraction neutronique à l'étude de la fonction texture du titane recristallisé, comparaison avec le diffraction des rayons X

J. P. Mardon, M. Pernot, P. Dervin, R. Penelle et M. Englander



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J. Appl. Cryst. (1977). 10, 376-385    [doi:10.1107/S0021889877013806]

A general method for locating the X-ray source point in Kossel diffraction

S. Biggin and D. J. Dingley



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J. Appl. Cryst. (1977). 10, 386-389    [doi:10.1107/S0021889877013818]

A computer-controlled X-ray powder diffraction system with an automatic sample changer

H. J. Holland and R. C. Medrud



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J. Appl. Cryst. (1977). 10, 390-396    [doi:10.1107/S002188987701382X]

X-ray diffraction profiles fron neutron-irradiated LiF single crystals

C. A. Pimentel and S. Caticha-Ellis



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J. Appl. Cryst. (1977). 10, 397-400    [doi:10.1107/S0021889877013831]

The limit of detection of amosite in two forms of calcium silicate matrix

J. W. Critchell and P. E. J. Flewitt



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J. Appl. Cryst. (1977). 10, 401-404    [doi:10.1107/S0021889877013843]

X-ray line-broadening studies on austenitic stainless steel filings

P. K. Nair and R. Vasudevan



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J. Appl. Cryst. (1977). 10, 405-411    [doi:10.1107/S0021889877013855]

Profile analysis of X-ray powder diffractometer data: structural refinement of La0.75Sr0.25CrO3

C. P. Khattak and D. E. Cox



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J. Appl. Cryst. (1977). 10, 412-414    [doi:10.1107/S0021889877013867]

Low-angle X-ray scattering with C K[alpha] radiation

O. Aita, H. Fujimoto, C. Sugiura and Y. Siota



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J. Appl. Cryst. (1977). 10, 415-421    [doi:10.1107/S0021889877013879]

A new method for the evaluation of small-angle scattering data

O. Glatter



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J. Appl. Cryst. (1977). 10, 422-425    [doi:10.1107/S0021889877013880]

The use of integrals of the Airy diffraction intensity profile in X-ray topography of `spike' diffuse reflexions

M. Moore and A. R. Lang



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J. Appl. Cryst. (1977). 10, 426-429    [doi:10.1107/S0021889877013892]

A pattern-recognition procedure for scanning oscillation films

W. Kabsch


crystallographers



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J. Appl. Cryst. (1977). 10, 430    [doi:10.1107/S0021889877013909]

Crystallographers


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