Journal of Applied Crystallography

Volume 11, Part 1 (February 1978)

research papers
short communications
crystal data
computer programs
laboratory notes
crystallographers
international union of crystallography
book reviews
international union of crystallography

research papers

J. Appl. Cryst. (1978). 11, 1-5 [doi:10.1107/S0021889878012583]

Röntgenkleinstwinkelstreuung an Erythrocyten

P. Stasiecki und H. B. Stuhrmann

J. Appl. Cryst. (1978). 11, 6-9 [doi:10.1107/S0021889878012595]

The analysis of X-ray diffraction profiles from imperfect solids by an application of convolution relations

R. K. Nandi and S. P. Sen Gupta

J. Appl. Cryst. (1978). 11, 10-14 [doi:10.1107/S0021889878012601]

A rapid method for analysing the breadths of diffraction and spectral lines using the Voigt function

J. I. Langford

J. Appl. Cryst. (1978). 11, 15-30 [doi:10.1107/S0021889878012613]

The ORNL 10-meter small angle X-ray scattering camera

R. W. Hendricks

J. Appl. Cryst. (1978). 11, 31-34 [doi:10.1107/S0021889878012625]

Microfurnace for single-crystal diffraction measurements

F. Lissalde, S. C. Abrahams and J. L. Bernstein

J. Appl. Cryst. (1978). 11, 35-39 [doi:10.1107/S0021889878012637]

Recherche des systèmes de glissement actifs dans un processus de déformation plastique du polycristal. I. Cas du glissement cristallographique dans les cristaux cubiques

F. Royer, J.-M. Mohr et C. Tavard

J. Appl. Cryst. (1978). 11, 40-43 [doi:10.1107/S0021889878012649]

Application of X-ray synchrotron topography to in situ studies of recrystallization

I. B. MacCormack and B. K. Tanner

J. Appl. Cryst. (1978). 11, 44-49 [doi:10.1107/S0021889878012650]

The effects of instrumental distortion in X-ray diffraction studies of liquids. II. Collimation distortion

G. D. Wignall, W. E. Munsil and C. J. Pings

J. Appl. Cryst. (1978). 11, 50-55 [doi:10.1107/S0021889878012662]

Smoothing and validity of crystallite-size distributions from X-ray line-profile analysis

A. Le Bail and D. Louër

short communications

J. Appl. Cryst. (1978). 11, 56 [doi:10.1107/S0021889878012674]

A pattern-recognition procedure for scanning oscillation films: a correction

W. Kabsch

crystal data

J. Appl. Cryst. (1978). 11, 56-57 [doi:10.1107/S0021889878012686]

Studies on selenates. III. Crystal chemical data for zirconium and cerium selenate tetrahydrates

M. A. Nabar and V. R. Ajgaonkar

J. Appl. Cryst. (1978). 11, 58 [doi:10.1107/S0021889878012698]

Crystal data for 15-O-acetylacerinol and two related triterpenes isolated from Japanese Cimicifuga plants

K. Resing, A. Fitzgerald and G. Gusano

J. Appl. Cryst. (1978). 11, 59 [doi:10.1107/S0021889878012704]

Crystal data for di--chloro-bis(2-methylallyl-3-norbornyl)palladium(II), (C₁₁H₁₇PdCl)₂

G. Tieghi and M. Zocchi

computer programs

J. Appl. Cryst. (1978). 11, 60-61 [doi:10.1107/S0021889878012716]

Trial and error indexing program for powder patterns of monoclinic substances

F. Kohlbeck and E. M. Hörl

laboratory notes

J. Appl. Cryst. (1978). 11, 62 [doi:10.1107/S0021889878012728]

A modified diffusion apparatus for the growth of single crystals

S. A. Martin and H. M. Haendler

J. Appl. Cryst. (1978). 11, 62 [doi:10.1107/S002188987801273X]

A simple back-reflexion camera

W. A. Denne

crystallographers

J. Appl. Cryst. (1978). 11, 62-63 [doi:10.1107/S0021889878012741]

Crystallographers

international union of crystallography

J. Appl. Cryst. (1978). 11, 63-64 [doi:10.1107/S0021889878012753]

Transfer of Copyright

J. Appl. Cryst. (1978). 11, 64 [doi:10.1107/S0021889878012765]

Notes for Authors

J. Appl. Cryst. (1978). 11, 64 [doi:10.1107/S0021889878012777]

Polarzation ratio for X-rays. A survey by the Commission on Crystallographic Apparatus

book reviews

J. Appl. Cryst. (1978). 11, 64 [doi:10.1107/S0021889878012789]

Advances in X-ray analysis. Vol. 20 edited by H. F. McMurdie, C. S. Barrett, J. B. Newkirk and C. O. Ruud