Journal of Applied Crystallography
Volume 11, Part 2 (April 1978)
J. Appl. Cryst. (1978). 11, 73-79 [doi:10.1107/S0021889878012807]
A general, weighted least-squares method for the evaluation of small-angle X-ray data without desmearing
B. Sjöberg
J. Appl. Cryst. (1978). 11, 80-86 [doi:10.1107/S0021889878012819]
An experimental verification of neutron multiple scattering calculations in vanadium
F. F. Freeman, B. H. Meardon and W. G. Williams
J. Appl. Cryst. (1978). 11, 87-97 [doi:10.1107/S0021889878012820]
Exact solution of the slit-height correction problem in small-angle X-ray scattering. I. The general method and its accuracy in application to simulated data
M. Deutsch and M. Luban
J. Appl. Cryst. (1978). 11, 98-101 [doi:10.1107/S0021889878012832]
Exact solution of the slit-height correction problem in small-angle X-ray scattering. II. A method for arbitrary slit transmission functions
M. Deutsch and M. Luban
J. Appl. Cryst. (1978). 11, 102-113 [doi:10.1107/S0021889878012844]
Scherrer after sixty years: A survey and some new results in the determination of crystallite size
J. I. Langford and A. J. C. Wilson
J. Appl. Cryst. (1978). 11, 114-120 [doi:10.1107/S0021889878012856]
The analysis of single-crystal Bragg reflections from profile measurements
D. F. Grant and E. J. Gabe
J. Appl. Cryst. (1978). 11, 121-124 [doi:10.1107/S0021889878012868]
The influence of crystal structure on the photoresponse of iron-titanium oxide electrodes
B. Morosin, R. J. Baughman, D. S. Ginley and M. A. Butler
J. Appl. Cryst. (1978). 11, 125-127 [doi:10.1107/S002188987801287X]
A diffractometer technique for precise orientation of single crystals
G. J. McIntyre and Z. Barnea
J. Appl. Cryst. (1978). 11, 128-131 [doi:10.1107/S0021889878012881]
Absolute sign of piezoelectric d33 and pyroelectric p3
coefficients in LiClO4.3H2O.
R. Liminga, S. Chomnilpan and S. C. Abrahams
J. Appl. Cryst. (1978). 11, 132-136 [doi:10.1107/S0021889878012893]
Vacancy ordering in VN1-x
T. Onozuka
J. Appl. Cryst. (1978). 11, 137-140 [doi:10.1107/S002188987801290X]
Optimum resolution in X-ray energy-dispersive diffractometry
B. Buras, N. Niimura and J. S. Olsen
J. Appl. Cryst. (1978). 11, 141-147 [doi:10.1107/S0021889878012911]
Etudes de couches minces d'ytterbium par diffraction X in situ
M. Gasgnier and J. C. Malaurent
J. Appl. Cryst. (1978). 11, 148-150 [doi:10.1107/S0021889878012923]
Spherical monocrystals for X-ray work obtained by plasma remelting of alloy powder
L. Arnberg and S. Westman
J. Appl. Cryst. (1978). 11, 151 [doi:10.1107/S0021889878012935]
Thermal expansion of benzalazine
V. Mom and G. de With
J. Appl. Cryst. (1978). 11, 152-153 [doi:10.1107/S0021889878012947]
Second-harmonic generation (SHG) in metal-phosphorus sulphide-halides having icosahedral structures
A. Bubenzer and R. Nitsche
J. Appl. Cryst. (1978). 11, 153-155 [doi:10.1107/S0021889878012959]
Evidence of non-cubic lattice distortions around vacant sites in Co-Ga
' phases
G. Kirchgraber and V. Gerold
J. Appl. Cryst. (1978). 11, 156-157 [doi:10.1107/S0021889878012960]
Crystal data for a new variety of the double oxide MnSnO3
B. Durand and H. Loiseleur
J. Appl. Cryst. (1978). 11, 157-158 [doi:10.1107/S0021889878012972]
Crystal data and crystal growth of PbGe3O7
H. H. Otto
J. Appl. Cryst. (1978). 11, 158-159 [doi:10.1107/S0021889878012984]
Crystal data for Pb3Bi2[
(GeO4)3]
H. H. Otto and W. Müller-Lierheim
J. Appl. Cryst. (1978). 11, 159-160 [doi:10.1107/S0021889878012996]
Crystal data for sodium calcium suplhate [Na4Ca(SO4)3]
E. Erdoes and H. Altorfer
J. Appl. Cryst. (1978). 11, 161 [doi:10.1107/S002188987801300X]
Préparation et données cristallographiques de
-LiAmO2
J. Rebizant et U. Benedict
J. Appl. Cryst. (1978). 11, 162 [doi:10.1107/S0021889878013011]
Crystal data for lead diarsenate [Pb2As2O7]
M. A. Nabar and A. P. Dalvi
J. Appl. Cryst. (1978). 11, 163 [doi:10.1107/S0021889878013035]
A simple method for measuring crystal densities
S. Zamvil, R. Pludow and A. F. Fucaloro
J. Appl. Cryst. (1978). 11, 163-164 [doi:10.1107/S0021889878013023]
A simple procedure to vary the effective radius of curvature of a plate crystal
A. M. Mathieson
J. Appl. Cryst. (1978). 11, 164 [doi:10.1107/S0021889878013047]
Crystallographers
J. Appl. Cryst. (1978). 11, 164 [doi:10.1107/S0021889878013059]
Microscope photometry by H. Piller
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