Journal of Applied Crystallography

Volume 11, Part 3 (June 1978)

• research papers
• crystal data
• international union of crystallography
• laboratory notes
• meeting reports
• crystallographers
• international union of crystallography

research papers

J. Appl. Cryst. (1978). 11, 165-172    [doi:10.1107/S0021889878013060]

Energy-dispersive powder profile refinement using synchrotron radiation

A. M. Glazer, M. Hidaka and J. Bordas

J. Appl. Cryst. (1978). 11, 173-178    [doi:10.1107/S0021889878013072]

Flat-cone diffractometer utilizing a linear position-sensitive detector

E. Prince, A. Wlodawer and A. Santoro

J. Appl. Cryst. (1978). 11, 179-183    [doi:10.1107/S0021889878013084]

Correction of integrated Bragg intensities for anisotropic thermal scattering

M. Merisalo and J. Kurittu

J. Appl. Cryst. (1978). 11, 184-189    [doi:10.1107/S0021889878013096]

Error analysis of 2 powder data for cubic or uniaxial phases

L. K. Frevel

J. Appl. Cryst. (1978). 11, 190-192    [doi:10.1107/S0021889878013102]

The effect of diffuse scattering on the dark-field contrast from precipitates

J. Gjønnes and J. K. Solberg

crystal data

J. Appl. Cryst. (1978). 11, 193    [doi:10.1107/S0021889878013114]

Crystal data for some tetraethylammonium salt hydrates

Y.-S. Lam and T. C. W. Mak

J. Appl. Cryst. (1978). 11, 194-195    [doi:10.1107/S0021889878013126]

Crystal data for 2-nitroso-2-bromo-3,3-dimethylbutane

M. G. Newton, N. S. Pantaleo, M. Galobardes and H. W. Pinnick

international union of crystallography

J. Appl. Cryst. (1978). 11, 196-205    [doi:10.1107/S0021889878013138]

Final Report of the International Project for the Calibration of Absolute Intensities in Small-Angle X-ray Scattering

laboratory notes

J. Appl. Cryst. (1978). 11, 206    [doi:10.1107/S002188987801314X]

Spherical crystals grown in situ for low-temperature X-ray work on volatile compounds

G. J. H. van Nes and F. van Bolhuis

J. Appl. Cryst. (1978). 11, 207    [doi:10.1107/S0021889878013151]

A simple temperature monitor for the PW1100 diffractometer

S. Harkema, G. J. van Hummel, H. J. de Groot, J. Gijgink and N. Schokkenbroek

meeting reports

J. Appl. Cryst. (1978). 11, 207-210    [doi:10.1107/S0021889878013163]

Fourth European crystallographic meeting

J. P. Glusker

crystallographers

J. Appl. Cryst. (1978). 11, 210    [doi:10.1107/S0021889878013175]

Crystallographers

international union of crystallography

J. Appl. Cryst. (1978). 11, 210    [doi:10.1107/S0021889878013187]

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