Journal of Applied Crystallography
Volume 11, Part 6 (December 1978)
J. Appl. Cryst. (1978). 11, 675-680 [doi:10.1107/S0021889878014259]
Simulation of photographs on a storage display. Application to X-ray topography and TEM
Y. Epelboin
J. Appl. Cryst. (1978). 11, 681-683 [doi:10.1107/S0021889878014260]
Single-crystal X-ray diffraction study on the hydrogen ordering in Ta2H
H. Asano, Y. Ishikawa and M. Hirabayashi
J. Appl. Cryst. (1978). 11, 684-687 [doi:10.1107/S0021889878014272]
High-resolution energy-dispersive diffraction using synchrotron radiation
A. J. Bourdillon, A. M. Glazer, M. Hidaka and J. Bordas
J. Appl. Cryst. (1978). 11, 688-692 [doi:10.1107/S0021889878014284]
Applications of a two-circle SSD diffractometer in the angle-dispersive mode
T. Fukamachi, Y. Nakano, S. Hosoya and O. Shimomura
J. Appl. Cryst. (1978). 11, 693-694 [doi:10.1107/S0021889878014296]
An improved method for calculating the contribution of solvent to the X-ray diffraction pattern of biological molecules
R. D. B. Fraser, T. P. MacRae and E. Suzuki
J. Appl. Cryst. (1978). 11, 695-698 [doi:10.1107/S0021889878014302]
Calculation of powder-pattern intensity distributions
B. E. Warren
J. Appl. Cryst. (1978). 11, 699-700 [doi:10.1107/S0021889878014314]
Thermal expansivity and spontaneous stain temperature dependence in Tb2(MoO4)3
S. C. Abrahams, J. L. Bernstein, F. Lissalde and K. Nassau
J. Appl. Cryst. (1978). 11, 701-704 [doi:10.1107/S0021889878014326]
Comments on the paracrystalline nature of myelin
M. K. Gbordzoe and W. Kreutz
J. Appl. Cryst. (1978). 11, 705-706 [doi:10.1107/S0021889878014338]
Enhancement of the Bragg reflection from quartz crystals due to X-ray irradiation under high electric field
K. Yasuda and N. Kato
J. Appl. Cryst. (1978). 11, 707-708 [doi:10.1107/S002188987801434X]
Données cristallographiques sur les sulfates acides MIIIH(SO4)2.4H2O avec M=Al, Ga, In, Tl, V, Fe et Ti
J. Tudo, B. Jolibois, G. Laplace, G. Nowogrocki et F. Abraham
J. Appl. Cryst. (1978). 11, 709 [doi:10.1107/S0021889878014351]
Crystal data for ammonium thiosulphate: (NH4)2S2O3
Y. Elerman, A. A. Uraz, N. Armagan and Y. Aka
J. Appl. Cryst. (1978). 11, 710-711 [doi:10.1107/S0021889878014363]
Crystal data for barium thiosulphate monohydrate: BaS2O3. H2O
Y. Aka, N. Armagan, A. A. Uraz and Y. Elerman
J. Appl. Cryst. (1978). 11, 711-712 [doi:10.1107/S0021889878014375]
Atom packing projections
R. A. Ploc
J. Appl. Cryst. (1978). 11, 713-715 [doi:10.1107/S0021889878014387]
Indexing back-reflection Laue patterns by computer
R. A. Ploc
J. Appl. Cryst. (1978). 11, 715 [doi:10.1107/S0021889878014399]
Optical adjustment of bent-crystal monochromators
M. Spencer
J. Appl. Cryst. (1978). 11, 716 [doi:10.1107/S0021889878014405]
Easy crystal centring in a modified Gandolfi camera
A. Grüttner, K. Yvon and M. Delaloye
J. Appl. Cryst. (1978). 11, 716-717 [doi:10.1107/S0021889878014417]
Crystallography in materials science (Joint Spring Conference: The Institute of Physics Crystallography Group and Materials and Test Group), University of Bath, 10-12 April 1978
R. G. C. Arridge
J. Appl. Cryst. (1978). 11, 718 [doi:10.1107/S0021889878014429]
Crystallographers
J. Appl. Cryst. (1978). 11, 718-719 [doi:10.1107/S0021889878014430]
Prices of Acta Crystallographica and Journal of Applied Crystallography
J. Appl. Cryst. (1978). 11, 719 [doi:10.1107/S0021889878014442]
Report of Executive Committee for 1977
J. Appl. Cryst. (1978). 11, 719 [doi:10.1107/S0021889878014454]
The Warren Award
J. Appl. Cryst. (1978). 11, 719-720 [doi:10.1107/S0021889878014466]
Diffraction from materials edited by L. H. Schwartz and J. B. Cohen
J. Appl. Cryst. (1978). 11, 720 [doi:10.1107/S0021889878014478]
Crystal growth 1977 edited by R. L. Parker, A. A. Chernov, G. W. Cullen and J. B. Mullin
J. Appl. Cryst. (1978). 11, 721-727
Subject index to volume 11 (1978)
J. Appl. Cryst. (1978). 11, 728-733
Author index to volume 11 (1978)
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