Journal of Applied Crystallography

Volume 12, Part 1 (February 1979)

• research papers
• short communications
• crystal data
• computer programs
• laboratory notes
• meeting reports
• crystallographers
• international union of crystallography
• book reviews

research papers

J. Appl. Cryst. (1979). 12, 1-9    [doi:10.1107/S0021889879011663]

X-ray television area detectors for macromolecular structural studies with synchrotron radiation sources

U. W. Arndt and D. J. Gilmore

J. Appl. Cryst. (1979). 12, 10-14    [doi:10.1107/S0021889879011675]

Diffractometry of closely superimposed twins and clusters: a method and a program for establishing UB matrices of single-crystal individuals

K. Tichý and J. Benes

J. Appl. Cryst. (1979). 12, 15-18    [doi:10.1107/S0021889879011687]

Correction de temps mort des raies de diffraction X

J. Rigoult

J. Appl. Cryst. (1979). 12, 19-24    [doi:10.1107/S0021889879011699]

On the possibility of utilizing holographic schemes in X-ray microscopy

V. V. Aristov and G. A. Ivanova

J. Appl. Cryst. (1979). 12, 25-26    [doi:10.1107/S0021889879011705]

X-ray beam polarization measurements

Y. Le Page, E. J. Gabe and L. D. Calvert

J. Appl. Cryst. (1979). 12, 27-33    [doi:10.1107/S0021889879011717]

Microfibril dimensions from small-angle X-ray scattering

B. Crist Jnr

J. Appl. Cryst. (1979). 12, 34-38    [doi:10.1107/S0021889879011729]

X-ray diffraction study of MgCl₂ aqueous solutions

R. Caminiti, G. Licheri, G. Piccaluga and G. Pinna

J. Appl. Cryst. (1979). 12, 39-41    [doi:10.1107/S0021889879011730]

Dépouillement par ordinateur des clichés de diffraction obtenus par la méthode de Laue

J.-P. Riquet et R. Bonnet

J. Appl. Cryst. (1979). 12, 42-48    [doi:10.1107/S0021889879011742]

Small-angle X-ray data processing for planar multilayered structures. I. Theory

C. R. Worthington and S. K. Wang

J. Appl. Cryst. (1979). 12, 49-53    [doi:10.1107/S0021889879011754]

Lattice parameters and birefringence in PbTiO₃ single crystals

S. A. Mabud and A. M. Glazer

J. Appl. Cryst. (1979). 12, 54-56    [doi:10.1107/S0021889879011766]

Pyroelectric temperature analysis as a method for study of ferroelectric transitions in polycrystalline materials

M. Topic

J. Appl. Cryst. (1979). 12, 57-59    [doi:10.1107/S0021889879011778]

Five new polytypes and polytypic change in PbI₂

T. Minagawa

J. Appl. Cryst. (1979). 12, 60-65    [doi:10.1107/S002188987901178X]

F_N: A criterion for rating powder diffraction patterns and evaluating the reliability of powder-pattern indexing

G. S. Smith and R. L. Snyder

J. Appl. Cryst. (1979). 12, 66-69    [doi:10.1107/S0021889879011791]

Orientations mutuelles observées sur des cristaux d'hématite

J. Rozière, C. Baltzinger et R. Baro

J. Appl. Cryst. (1979). 12, 70-77    [doi:10.1107/S0021889879011808]

Etude des défauts dans des monocristaux naturels de béryl. I. Observations des dislocations

E. Scandale, F. Scordari et A. Zarka

J. Appl. Cryst. (1979). 12, 78-83    [doi:10.1107/S002188987901181X]

Etude des défauts dans des monocristaux naturels de béryl. II. Etude de croissance

E. Scandale, F. Scordari et A. Zarka

J. Appl. Cryst. (1979). 12, 84-90    [doi:10.1107/S0021889879011821]

Etude précise des diagrammes de diffraction électronique de poudres de cristaux à grands paramètres. Exemple des phosphates de calcium. Intérêt de la diffraction à très haute tension. Calcul et tracé de diagrammes théoriques

J. Puech, M. Puech-Baux, G. Alcouffe, M. Brieu et L. Lafourcade

J. Appl. Cryst. (1979). 12, 91-94    [doi:10.1107/S0021889879011833]

Constitutional defect structure of CuAl₂

H. Zogg

J. Appl. Cryst. (1979). 12, 95-98    [doi:10.1107/S0021889879011845]

A real-time back-reflection Laue camera

D. H. Bilderback

J. Appl. Cryst. (1979). 12, 99-103    [doi:10.1107/S0021889879011857]

The orientation of apatite crystals in bone

G. E. Bacon, P. J. Bacon and R. K. Griffiths

J. Appl. Cryst. (1979). 12, 104-106    [doi:10.1107/S0021889879011869]

Piezoelectric and pyroelectric ionic displacements in Na(H₃O)[I(OH)₃O₃]

S. C. Abrahams, F. Lissalde and J. L. Bernstein

J. Appl. Cryst. (1979). 12, 107-109    [doi:10.1107/S0021889879011870]

Quantitative analysis of multicomponent powders by full-profile refinement of Guinier-Hägg X-ray film data

P.-E. Werner, S. Salomé, G. Malmros and J. O. Thomas

J. Appl. Cryst. (1979). 12, 110-115    [doi:10.1107/S0021889879011882]

Determination of the Burgers vector of perfect dislocations observed by X-ray topography in hexagonal single crystals

C. G'Sell and Y. Epelboin

J. Appl. Cryst. (1979). 12, 116-118    [doi:10.1107/S0021889879011894]

Détermination de l'intensité intégrée en step-scanning

J. Rigoult

J. Appl. Cryst. (1979). 12, 119-125    [doi:10.1107/S0021889879011900]

Diffraction line broadening of crystals containing small-angle boundaries

M. Wilkens

short communications

J. Appl. Cryst. (1979). 12, 126    [doi:10.1107/S0021889879011912]

Gandolfi attachment for a Debye-Scherrer camera

G. Moss, D. F. Wentworth and Z. Barnea

J. Appl. Cryst. (1979). 12, 127-128    [doi:10.1107/S0021889879011924]

An X-ray goniometer for producing accurately oriented crystal faces

K. H. Lloyd

J. Appl. Cryst. (1979). 12, 129    [doi:10.1107/S0021889879011936]

Harmonic-free single-crystal monochromators for neutrons and X-rays

M. Hart and A. R. D. Rodrigues

crystal data

J. Appl. Cryst. (1979). 12, 129-130    [doi:10.1107/S0021889879011948]

New crystal data for silver sulphide sulphate, Ag₈S₃SO₄

H. Hirsch

J. Appl. Cryst. (1979). 12, 131-132    [doi:10.1107/S002188987901195X]

Crystal data for calcium fluoride silicon oxide (CaF₂.SiO₂), a dehydration product of fluorapophyllite

G. F. Marriner, J. I. Langford and J. Tarney

computer programs

J. Appl. Cryst. (1979). 12, 133-134    [doi:10.1107/S0021889879011961]

Computer-generated standard stereographic projections

M. E. Packer

J. Appl. Cryst. (1979). 12, 134    [doi:10.1107/S0021889879011973]

Profile analysis of diffractometer data

O. Lindqvist and E. Ljungström

laboratory notes

J. Appl. Cryst. (1979). 12, 135    [doi:10.1107/S0021889879011997]

A semiautomatic coordinate measuring device for molecular models

Y. Mitsui

J. Appl. Cryst. (1979). 12, 135-136    [doi:10.1107/S0021889879011985]

Model drawing programs: manufacture of masks to produce optical transforms

C. H. L. Kennard and K. G. Shields

J. Appl. Cryst. (1979). 12, 136    [doi:10.1107/S0021889879012000]

A status monitor for the Elliott rotating-anode X-ray source

W. R. Massey Jnr

J. Appl. Cryst. (1979). 12, 137    [doi:10.1107/S0021889879012012]

A low-cost Richards box for superimposing molecular models on three-dimensional electron density maps

C. H. L. Kennard and L. Bretherton

meeting reports

J. Appl. Cryst. (1979). 12, 137-138    [doi:10.1107/S0021889879012024]

Synchrotron Radiation Symposium, European Physical Society Fourth General Conference, York, England, 25-29 September 1978

H. Stuhrmann

J. Appl. Cryst. (1979). 12, 138    [doi:10.1107/S0021889879012036]

Teaching Crystallography for Today's Sciences, Summer School, Erice, Sicily, Italy, 6-16 September 1977

A. Authier

crystallographers

J. Appl. Cryst. (1979). 12, 138    [doi:10.1107/S0021889879012048]

Crystallographers

international union of crystallography

J. Appl. Cryst. (1979). 12, 138    [doi:10.1107/S002188987901205X]

Union Office, Change of Address

J. Appl. Cryst. (1979). 12, 138-139    [doi:10.1107/S0021889879012061]

Copying Fees and Copyright Law

book reviews

J. Appl. Cryst. (1979). 12, 139-140    [doi:10.1107/S0021889879012073]

Crystallography by M. P. Shaskol'skaya

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