Journal of Applied Crystallography
Volume 12, Part 2 (April 1979)
J. Appl. Cryst. (1979). 12, 141-146 [doi:10.1107/S0021889879012085]
Bragg-case diffraction curves from copper whiskers by the X-ray triple-crystal diffraction method
O. Nittono, H. Yamagishi and S. Nagakura
J. Appl. Cryst. (1979). 12, 147-150 [doi:10.1107/S0021889879012097]
AIDED, a program for the automatic indexing of epitaxic derivatives; application to the graphite lamellar compounds
A. Setton and R. Setton
J. Appl. Cryst. (1979). 12, 151-155 [doi:10.1107/S0021889879012103]
Détermination par extensométrie et mesures ultrasonores des six constantes elastiques du cristal Al2Cu (
). Duscussion de l'anisotropie
N. Fribourg-Blanc, M. Dupeux, G. Guenin et R. Bonnet
J. Appl. Cryst. (1979). 12, 156-162 [doi:10.1107/S0021889879012115]
The resolution of the precession camera
M. Ogino and J. Harada
J. Appl. Cryst. (1979). 12, 163-165 [doi:10.1107/S0021889879012127]
Interprétation de Micromacles observées sur des faces (01.2) de l'hématite
C. Baltzinger, J. Rozière et R. Baro
J. Appl. Cryst. (1979). 12, 166-175 [doi:10.1107/S0021889879012139]
The interpretation of real-space information from small-angle scattering experiments
O. Glatter
J. Appl. Cryst. (1979). 12, 176-185 [doi:10.1107/S0021889879012140]
Determination of intersubunit distances and subunit shape parameters in DNA-dependent RNA polymerase by neutron small-angle scattering
P. Stöckel, R. May, I. Strell, Z. Cejka, W. Hoppe, H. Heumann, W. Zillig, H. L. Crespi, J. J. Katz and K. Ibel
J. Appl. Cryst. (1979). 12, 186-191 [doi:10.1107/S0021889879012152]
A perfect-crystal neutron polarizer as an application of magnetic prism refraction
G. Badurek, H. Rauch, A. Wilfing, U. Bonse and W. Graeff
J. Appl. Cryst. (1979). 12, 192-200 [doi:10.1107/S0021889879012164]
The small-angle neutron scattering facility at the SAFARI-1 reactor
C. Hofmeyr, R. M. Mayer and D. L. Tillwick
J. Appl. Cryst. (1979). 12, 201-204 [doi:10.1107/S0021889879012176]
The use of nuclear emulsions in X-ray topography: improvement of the development methods
Y. Epelboin, A. Jeanne-Michaud and A. Zarka
J. Appl. Cryst. (1979). 12, 205-208 [doi:10.1107/S0021889879012188]
The doping method in quantitative X-ray diffraction phase analysis
S. Popovic and B. Grzeta-Plenkovic
J. Appl. Cryst. (1979). 12, 209-220 [doi:10.1107/S002188987901219X]
Determination of strain distribution in elastically bent materials by X-ray intensity measurement
Z. H. Kalman and S. Weissmann
J. Appl. Cryst. (1979). 12, 221-224 [doi:10.1107/S0021889879012206]
A high-temperature focusing X-ray powder camera with new features
G. Hägg, N. O. Ersson, G. Rudenholm and B. Sellberg
J. Appl. Cryst. (1979). 12, 225-238 [doi:10.1107/S0021889879012218]
Processing oscillation diffraction data for very large unit cells with an automatic convolution technique and profile fitting
M. G. Rossmann
J. Appl. Cryst. (1979). 12, 239 [doi:10.1107/S002188987901222X]
A solid-state transformation in 1,5-dichloroanthraquinone
P.-W. Wang
J. Appl. Cryst. (1979). 12, 240-241 [doi:10.1107/S0021889879012231]
A reindexing of the X-ray powder diffraction pattern of
-LiAlO2
K. Dörhöfer
J. Appl. Cryst. (1979). 12, 241-242 [doi:10.1107/S0021889879012243]
Crystal data for isotypic Cs2[M(CN)4].H2O compounds,
M=Pt, Pd and Ni
W. Holzapfel, H. H. Otto, H. Yersin and G. Gliemann
J. Appl. Cryst. (1979). 12, 243 [doi:10.1107/S0021889879012255]
X-ray powder diffraction data for strontium aluminate, SrAl2O4
F. Hanic, T. Y. Chemekova and J. Majling
J. Appl. Cryst. (1979). 12, 244 [doi:10.1107/S0021889879012267]
Crystal data for Na3Mg2P5O16
J. Majling and F. Hanic
J. Appl. Cryst. (1979). 12, 245 [doi:10.1107/S0021889879012279]
Studies on selenates. IV. Crystal chemical data for cobalt(II) selenate tetrahydrate
M. A. Nabar and S. V. Paralkar
J. Appl. Cryst. (1979). 12, 246 [doi:10.1107/S0021889879012280]
Crystal data for ammonium thiosulphate (NH4)2S2O3
G. W. Smith
J. Appl. Cryst. (1979). 12, 247-248 [doi:10.1107/S0021889879012292]
Etude cristallochimique du di-o-thymotide C22H24O4
M. Marais, J. Burgeat, F. Heliot, J. Primot and J. Jerphagnon
J. Appl. Cryst. (1979). 12, 249-251 [doi:10.1107/S0021889879012309]
Powder data for some new europium antimonides and bismuthides
J. B. Taylor, L. D. Calvert and Y. Wang
J. Appl. Cryst. (1979). 12, 251-252 [doi:10.1107/S0021889879012310]
Crystal data and crystal growth of Pb5GeO7
H. H. Otto
J. Appl. Cryst. (1979). 12, 253-254 [doi:10.1107/S0021889879012322]
Crystal data for the chloride of tetrakis(imidazole) palladium(II), [Pd(ImH)4]Cl2 and the tetrachloropalladate of
tetrakis(N-methylimidazole) palladium(II); [Pd(NMeIm)4] [PdCl4]
M. C. Navarro Ranninger
J. Appl. Cryst. (1979). 12, 254-255 [doi:10.1107/S0021889879012334]
Crystal data for cis- and trans-dichlorobis(N-methylimidazole)palladium(II)
M. C. Navarro Ranninger
J. Appl. Cryst. (1979). 12, 255-256 [doi:10.1107/S0021889879012346]
Crystal data for naphthaceno[5,6-cd]-1,2-dithiole-7,7,8,8-tetracyanoquinodimethane (DTT-TCNQ)
P. J. Nigrey and H. Katz
J. Appl. Cryst. (1979). 12, 257-258 [doi:10.1107/S0021889879012358]
Crystal data for the trimetaphosphates of lanthanum, cerium and praseodymium
I. L. Botto and E. J. Baran
J. Appl. Cryst. (1979). 12, 258 [doi:10.1107/S002188987901236X]
The matching of rigid bodies; a program using Kabsch's procedure
P. S. Yuen and S. C. Nyburg
J. Appl. Cryst. (1979). 12, 259-260 [doi:10.1107/S0021889879012371]
Tracé automatique des courbes d'égal facteur de Schmid
G. Alcouffe, B. Legros-de-Mauduit et A. Remon Sancho
J. Appl. Cryst. (1979). 12, 261 [doi:10.1107/S0021889879012383]
A comment on `a simple method for measuring crystal densities' (Zamvil, Pludow & Fucaloro, 1978)
R. G. Eggins and C. H. L. Kennard
J. Appl. Cryst. (1979). 12, 261 [doi:10.1107/S0021889879012395]
The use of ultrasonics for cleaning crystals
R. G. Eggins and C. H. L. Kennard
J. Appl. Cryst. (1979). 12, 261 [doi:10.1107/S0021889879012401]
Eleventh International Congress of Crystallography. Communicated Abstracts: Supplement to Acta Crystallographica
J. Appl. Cryst. (1979). 12, 261 [doi:10.1107/S0021889879012413]
Dimensions of Material Deposited under the Supplementary Publication Scheme
J. Appl. Cryst. (1979). 12, 261 [doi:10.1107/S0021889879012425]
Crystallographers
J. Appl. Cryst. (1979). 12, 262 [doi:10.1107/S0021889879012437]
Semi-metals & narrow-bandgap semiconductors by D. R. Lovett
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