Journal of Applied Crystallography
Volume 12, Part 4 (August 1979)
J. Appl. Cryst. (1979). 12, 321-326 [doi:10.1107/S0021889879012620]
On the estimation of the locations of subunits within macromolecular aggregates from neutron interference data
P. B. Moore and E. Weinstein
J. Appl. Cryst. (1979). 12, 327-331 [doi:10.1107/S0021889879012632]
Non-destructive investigation of texture by neutron diffraction
C. S. Choi, H. J. Prask and S. F. Trevino
J. Appl. Cryst. (1979). 12, 332-338 [doi:10.1107/S0021889879012644]
Détermination expérimentale de la fonction d'orientation - son application dans le calcul des bandes de diffraction
J. de Courville, D. Tchoubar et C. Tchoubar
J. Appl. Cryst. (1979). 12, 339-345 [doi:10.1107/S0021889879012656]
Geometrical problems with a position-sensitive detector employed on a diffractometer, including its use in the measurement of stress
M. R. James and J. B. Cohen
J. Appl. Cryst. (1979). 12, 346-350 [doi:10.1107/S0021889879012668]
Diffracted beam-transmitted beam Borrmann X-ray topography in copper. A novel method of stereo depth topography
G. P. Hamill and T. Vreeland Jnr
J. Appl. Cryst. (1979). 12, 351-356 [doi:10.1107/S002188987901267X]
Determination of local atomic configurations for binary substitutional alloys
J. E. Epperson
J. Appl. Cryst. (1979). 12, 357-359 [doi:10.1107/S0021889879012681]
Simple methods of aligning four-circle diffractometers with crystal reflections
Y. Mitsui
J. Appl. Cryst. (1979). 12, 360-364 [doi:10.1107/S0021889879012693]
Tie lines in a two-phase region in the Cu-Ni-Zn system
O. S. Mayall and A. Mathew
J. Appl. Cryst. (1979). 12, 365-369 [doi:10.1107/S002188987901270X]
Voigt function fit of X-ray and neutron powder diffraction profiles
P. Suortti, M. Ahtee and L. Unonius
J. Appl. Cryst. (1979). 12, 370-373 [doi:10.1107/S0021889879012711]
Accurate X-ray determination of the lattice parameters and the thermal expansion coefficients of VO2 near the transition temperature
D. Kucharczyk and T. Niklewski
J. Appl. Cryst. (1979). 12, 374-378 [doi:10.1107/S0021889879012723]
Diffracted beam crystal centering and its application to high-pressure crystallography
H. E. King Jnr and L. W. Finger
J. Appl. Cryst. (1979). 12, 379-386 [doi:10.1107/S0021889879012735]
An analytical method for the determination of the geometric and kinetic features of growing crystal faces
M. Rubbo and D. Aquilano
J. Appl. Cryst. (1979). 12, 387-394 [doi:10.1107/S0021889879012747]
Lattice parameter, microstrains and non-stoichiometry in NiO. Comparison between mosaic microcrystals and quasi-perfect single microcrystals
F. Fiévet, P. Germi, F. de Bergevin and M. Figlarz
J. Appl. Cryst. (1979). 12, 395-396 [doi:10.1107/S0021889879012759]
Confirmation and complementation of the conclusions from small-angle X-ray scattering of cellulose by direct electron-microscope observations
A. N. J. Heyn
J. Appl. Cryst. (1979). 12, 396-397 [doi:10.1107/S0021889879012760]
Can metastable crystal forms `disappear'?
V. W. Jacewicz and J. H. C. Nayler
J. Appl. Cryst. (1979). 12, 398-399 [doi:10.1107/S0021889879012772]
`Randomness' in multiphase X-ray scatterers
J. Goodisman and H. Brumberger
J. Appl. Cryst. (1979). 12, 399-400 [doi:10.1107/S0021889879012784]
Total thermal neutron cross sections of Al, Si, Cu, Zn, Ge, Pb and Bi single crystals
B. Grabcev, S. Todireanu and V. Cioca
J. Appl. Cryst. (1979). 12, 401-402 [doi:10.1107/S0021889879012796]
Absorption correction and normalization of X-ray small-angle scattering data for materials producing intense scattering at extremely low angles
C. W. Dwiggins Jnr
J. Appl. Cryst. (1979). 12, 403-404 [doi:10.1107/S0021889879012802]
A simple furnace for neutron diffraction studies
F. P. Bailey and C. E. G. Bennett
J. Appl. Cryst. (1979). 12, 405-406 [doi:10.1107/S0021889879012814]
Crystal data for Na4Mg2Si3O10
C. M. Foris, F. C. Zumsteg and R. D. Shannon
J. Appl. Cryst. (1979). 12, 407-410 [doi:10.1107/S0021889879012826]
Powder diffraction data for compounds in the series Nax(Ca3±xNax)Al2O6
F. Cervantes Lee and F. P. Glasser
J. Appl. Cryst. (1979). 12, 411-412 [doi:10.1107/S0021889879012838]
Rare-earth trihydroxide parameters
W. O. Milligan, D. F. Mullica and J. D. Oliver
J. Appl. Cryst. (1979). 12, 413 [doi:10.1107/S002188987901284X]
Crystal data and molecular packing of drug charge-transfer complexes. I. Promethazine picrate
B. Narayana Achar and J. Shashidhara Prasad
J. Appl. Cryst. (1979). 12, 414-415 [doi:10.1107/S0021889879012851]
Crystal data of tris(2-cyanoethyl)phosphine oxide, tris(2-cyanoethyl)phosphine sulphide and tris(2-cyanoethyl)phosphine selenide
A. J. Blake, R. A. Howie and G. P. McQuillan
J. Appl. Cryst. (1979). 12, 416-420 [doi:10.1107/S0021889879012863]
Revised and new crystal data for indium selenides
S. Popovic, A. Tonejc, B. Grzeta-Plenkovic, B. Celustka and R. Trojko
J. Appl. Cryst. (1979). 12, 420-421 [doi:10.1107/S0021889879012875]
Crystal data for cis and trans-dichlorobis(imidazole)palladium(II)
M. C. Navarro Ranninger
J. Appl. Cryst. (1979). 12, 421-422 [doi:10.1107/S0021889879012887]
Crystal data for PbGe[Ge3O9](h)
H. H. Otto and A. Dietrich
J. Appl. Cryst. (1979). 12, 423-424 [doi:10.1107/S0021889879012899]
Plot of packing program POP1
B. W. van de Waal
J. Appl. Cryst. (1979). 12, 425 [doi:10.1107/S0021889879012917]
A microprocessor-controlled optical incremental angle encoder system for the Picker FACS-I diffractometer
R. F. Wrenn, P. H. Bethge and F. S. Mathews
J. Appl. Cryst. (1979). 12, 425-426 [doi:10.1107/S0021889879012905]
A miniature device for compressive stress application
S. C. Abrahams and J. L. Bernstein
J. Appl. Cryst. (1979). 12, 426-427 [doi:10.1107/S0021889879012929]
Computer programming for protein crystallographic applications, University of California at San Diego, 28-29 November 1978
S. T. Freer and J. Stewart
J. Appl. Cryst. (1979). 12, 427-428 [doi:10.1107/S0021889879012930]
Crystallographers
J. Appl. Cryst. (1979). 12, 428 [doi:10.1107/S0021889879012942]
Space groups for solid state scientists by G. Burns and A. M. Glazer
J. Appl. Cryst. (1979). 12, 428 [doi:10.1107/S0021889879012954]
Glass, 1977 edited by Götz Götz
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