Journal of Applied Crystallography

Volume 12, Part 4 (August 1979)



research papers



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J. Appl. Cryst. (1979). 12, 321-326    [doi:10.1107/S0021889879012620]

On the estimation of the locations of subunits within macromolecular aggregates from neutron interference data

P. B. Moore and E. Weinstein



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J. Appl. Cryst. (1979). 12, 327-331    [doi:10.1107/S0021889879012632]

Non-destructive investigation of texture by neutron diffraction

C. S. Choi, H. J. Prask and S. F. Trevino



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J. Appl. Cryst. (1979). 12, 332-338    [doi:10.1107/S0021889879012644]

Détermination expérimentale de la fonction d'orientation - son application dans le calcul des bandes de diffraction

J. de Courville, D. Tchoubar et C. Tchoubar



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J. Appl. Cryst. (1979). 12, 339-345    [doi:10.1107/S0021889879012656]

Geometrical problems with a position-sensitive detector employed on a diffractometer, including its use in the measurement of stress

M. R. James and J. B. Cohen



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J. Appl. Cryst. (1979). 12, 346-350    [doi:10.1107/S0021889879012668]

Diffracted beam-transmitted beam Borrmann X-ray topography in copper. A novel method of stereo depth topography

G. P. Hamill and T. Vreeland Jnr



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J. Appl. Cryst. (1979). 12, 351-356    [doi:10.1107/S002188987901267X]

Determination of local atomic configurations for binary substitutional alloys

J. E. Epperson



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J. Appl. Cryst. (1979). 12, 357-359    [doi:10.1107/S0021889879012681]

Simple methods of aligning four-circle diffractometers with crystal reflections

Y. Mitsui



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J. Appl. Cryst. (1979). 12, 360-364    [doi:10.1107/S0021889879012693]

Tie lines in a two-phase region in the Cu-Ni-Zn system

O. S. Mayall and A. Mathew



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J. Appl. Cryst. (1979). 12, 365-369    [doi:10.1107/S002188987901270X]

Voigt function fit of X-ray and neutron powder diffraction profiles

P. Suortti, M. Ahtee and L. Unonius



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J. Appl. Cryst. (1979). 12, 370-373    [doi:10.1107/S0021889879012711]

Accurate X-ray determination of the lattice parameters and the thermal expansion coefficients of VO2 near the transition temperature

D. Kucharczyk and T. Niklewski



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J. Appl. Cryst. (1979). 12, 374-378    [doi:10.1107/S0021889879012723]

Diffracted beam crystal centering and its application to high-pressure crystallography

H. E. King Jnr and L. W. Finger



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J. Appl. Cryst. (1979). 12, 379-386    [doi:10.1107/S0021889879012735]

An analytical method for the determination of the geometric and kinetic features of growing crystal faces

M. Rubbo and D. Aquilano



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J. Appl. Cryst. (1979). 12, 387-394    [doi:10.1107/S0021889879012747]

Lattice parameter, microstrains and non-stoichiometry in NiO. Comparison between mosaic microcrystals and quasi-perfect single microcrystals

F. Fiévet, P. Germi, F. de Bergevin and M. Figlarz


short communications



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J. Appl. Cryst. (1979). 12, 395-396    [doi:10.1107/S0021889879012759]

Confirmation and complementation of the conclusions from small-angle X-ray scattering of cellulose by direct electron-microscope observations

A. N. J. Heyn



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J. Appl. Cryst. (1979). 12, 396-397    [doi:10.1107/S0021889879012760]

Can metastable crystal forms `disappear'?

V. W. Jacewicz and J. H. C. Nayler



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J. Appl. Cryst. (1979). 12, 398-399    [doi:10.1107/S0021889879012772]

`Randomness' in multiphase X-ray scatterers

J. Goodisman and H. Brumberger



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J. Appl. Cryst. (1979). 12, 399-400    [doi:10.1107/S0021889879012784]

Total thermal neutron cross sections of Al, Si, Cu, Zn, Ge, Pb and Bi single crystals

B. Grabcev, S. Todireanu and V. Cioca



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J. Appl. Cryst. (1979). 12, 401-402    [doi:10.1107/S0021889879012796]

Absorption correction and normalization of X-ray small-angle scattering data for materials producing intense scattering at extremely low angles

C. W. Dwiggins Jnr



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J. Appl. Cryst. (1979). 12, 403-404    [doi:10.1107/S0021889879012802]

A simple furnace for neutron diffraction studies

F. P. Bailey and C. E. G. Bennett


crystal data



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J. Appl. Cryst. (1979). 12, 405-406    [doi:10.1107/S0021889879012814]

Crystal data for Na4Mg2Si3O10

C. M. Foris, F. C. Zumsteg and R. D. Shannon



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J. Appl. Cryst. (1979). 12, 407-410    [doi:10.1107/S0021889879012826]

Powder diffraction data for compounds in the series Nax(CaxNax)Al2O6

F. Cervantes Lee and F. P. Glasser



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J. Appl. Cryst. (1979). 12, 411-412    [doi:10.1107/S0021889879012838]

Rare-earth trihydroxide parameters

W. O. Milligan, D. F. Mullica and J. D. Oliver



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J. Appl. Cryst. (1979). 12, 413    [doi:10.1107/S002188987901284X]

Crystal data and molecular packing of drug charge-transfer complexes. I. Promethazine picrate

B. Narayana Achar and J. Shashidhara Prasad



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J. Appl. Cryst. (1979). 12, 414-415    [doi:10.1107/S0021889879012851]

Crystal data of tris(2-cyanoethyl)phosphine oxide, tris(2-cyanoethyl)phosphine sulphide and tris(2-cyanoethyl)phosphine selenide

A. J. Blake, R. A. Howie and G. P. McQuillan



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J. Appl. Cryst. (1979). 12, 416-420    [doi:10.1107/S0021889879012863]

Revised and new crystal data for indium selenides

S. Popovic, A. Tonejc, B. Grzeta-Plenkovic, B. Celustka and R. Trojko



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J. Appl. Cryst. (1979). 12, 420-421    [doi:10.1107/S0021889879012875]

Crystal data for cis and trans-dichlorobis(imidazole)palladium(II)

M. C. Navarro Ranninger



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J. Appl. Cryst. (1979). 12, 421-422    [doi:10.1107/S0021889879012887]

Crystal data for PbGe[Ge3O9](h)

H. H. Otto and A. Dietrich


computer programs



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J. Appl. Cryst. (1979). 12, 423-424    [doi:10.1107/S0021889879012899]

Plot of packing program POP1

B. W. van de Waal


laboratory notes



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J. Appl. Cryst. (1979). 12, 425    [doi:10.1107/S0021889879012917]

A microprocessor-controlled optical incremental angle encoder system for the Picker FACS-I diffractometer

R. F. Wrenn, P. H. Bethge and F. S. Mathews



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J. Appl. Cryst. (1979). 12, 425-426    [doi:10.1107/S0021889879012905]

A miniature device for compressive stress application

S. C. Abrahams and J. L. Bernstein


meeting reports



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J. Appl. Cryst. (1979). 12, 426-427    [doi:10.1107/S0021889879012929]

Computer programming for protein crystallographic applications, University of California at San Diego, 28-29 November 1978

S. T. Freer and J. Stewart


crystallographers



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J. Appl. Cryst. (1979). 12, 427-428    [doi:10.1107/S0021889879012930]

Crystallographers


book reviews



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J. Appl. Cryst. (1979). 12, 428    [doi:10.1107/S0021889879012942]

Space groups for solid state scientists by G. Burns and A. M. Glazer



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J. Appl. Cryst. (1979). 12, 428    [doi:10.1107/S0021889879012954]

Glass, 1977 edited by Götz Götz


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