Journal of Applied Crystallography

Volume 12, Part 6 (December 1979)



lead articles



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J. Appl. Cryst. (1979). 12, 489-501    [doi:10.1107/S0021889879013169]

The influence of multiaxial stress states, stress gradients and elastic anisotropy on the evaluation of (Residual) stresses by X-rays

H. Dölle


research papers



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J. Appl. Cryst. (1979). 12, 502-510    [doi:10.1107/S0021889879013170]

Etude d'un systeme micellaire de type inverse par diffusion centrale des neutrons

C. Cabos et P. Delord



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J. Appl. Cryst. (1979). 12, 511-516    [doi:10.1107/S0021889879013182]

Pressure-induced tetrahedral tilting and deformation in Ge2N2O

S. R. Srinivasa, L. Cartz, J. D. Jorgensen and J. C. Labbe



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J. Appl. Cryst. (1979). 12, 517-524    [doi:10.1107/S0021889879013194]

Determination of inter-element effects through Monte Carlo simulation of X-ray fluorescence

H. A. Fine and F. L. Benitez-Garcia



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J. Appl. Cryst. (1979). 12, 525-530    [doi:10.1107/S0021889879013200]

The determination of crystallite dimensions using synchrotron-radiation X-ray diffraction photographs

Z. H. Kalman, I. T. Steinberger and S. S. Hasnain



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J. Appl. Cryst. (1979). 12, 531-536    [doi:10.1107/S0021889879013212]

Quantitative structural studies by means of the energy-dispersive method with X-rays from a storage ring

B. Buras, L. Gerward, A. M. Glazer, M. Hidaka and J. Staun Olsen



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J. Appl. Cryst. (1979). 12, 537-544    [doi:10.1107/S0021889879013224]

A liquid-helium cryostat for collection of three-dimensional X-ray intensity data down to 20 K. The crystal structure of D(+)-tartaric acid at 35, 105, 160 and 295 K

J. Albertsson, Å. Oskarsson and K. Ståhl



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J. Appl. Cryst. (1979). 12, 545-550    [doi:10.1107/S0021889879013236]

X-ray diffraction profiles from single crystals of Cu-Ge alloy containing heavily faulted regions

T. Takama, N. Yokota and S. Sato



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J. Appl. Cryst. (1979). 12, 551-553    [doi:10.1107/S0021889879013248]

Analysis of two-dimensional reflections from a fine-particle carbon

R. Caminiti, G. Licheri, G. Piccaluga and L. Schiffini



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J. Appl. Cryst. (1979). 12, 554-563    [doi:10.1107/S002188987901325X]

An analysis of the Rietveld refinement method

M. Sakata and M. J. Cooper



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J. Appl. Cryst. (1979). 12, 564-569    [doi:10.1107/S0021889879013261]

A texture goniometer with variable radius and collimation for analysis of textures in rocks

M. T. Frost and A. W. B. Siddans



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J. Appl. Cryst. (1979). 12, 570-581    [doi:10.1107/S0021889879013273]

Processing and post-refinement of oscillation camera data

M. G. Rossmann, A. G. W. Leslie, S. S. Abdel-Meguid and T. Tsukihara



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J. Appl. Cryst. (1979). 12, 582-584    [doi:10.1107/S0021889879013285]

Methods of mixing in quantitative X-ray phase analysis

L. S. Zevin



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J. Appl. Cryst. (1979). 12, 585-588    [doi:10.1107/S0021889879013297]

A method of reducing termination errors in radial distribution functions

R. Narayan and S. Ramaseshan



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J. Appl. Cryst. (1979). 12, 589-591    [doi:10.1107/S0021889879013303]

The crystal structure of cotton cellulose investigated by an electron diffraction technique

K. M. Paralikar, S. M. Betrabet and N. V. Bhat



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J. Appl. Cryst. (1979). 12, 592-600    [doi:10.1107/S0021889879013315]

A four-circle diffractometer on a focused, tuneable synchrotron radiation source: mechanical design, computer control and evaluation of system performance

J. C. Phillips, J. A. Cerino and K. O. Hodgson


short communications



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J. Appl. Cryst. (1979). 12, 601-602    [doi:10.1107/S0021889879013327]

Profile refinement of multiple-wavelength neutron powder data

P. W. De Haven and R. A. Jacobson



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J. Appl. Cryst. (1979). 12, 603-604    [doi:10.1107/S0021889879013339]

Thermal expansion of the disordered form of 2-fluoronaphthalene (form I)

A. Meresse, Y. Haget, A. Filhol and N. B. Chanh


crystal data



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J. Appl. Cryst. (1979). 12, 605    [doi:10.1107/S0021889879013340]

Données crystallographiques sur le dichromate d'ammonium et de cadmium dihydraté, Cd(NH4)2(Cr2O7)2.2H2O

D. Blum



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J. Appl. Cryst. (1979). 12, 606    [doi:10.1107/S0021889879013352]

Données cristallographiques sur le dichromate de cuivre dihydraté CuCr2O7.2H2O

D. Blum



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J. Appl. Cryst. (1979). 12, 607    [doi:10.1107/S0021889879013364]

Données cristallographiques sur la forme hexagonale du trichromate de rubidium: Rb2Cr3O10

D. Blum



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J. Appl. Cryst. (1979). 12, 608    [doi:10.1107/S0021889879013376]

Données cristallographiques sur la forme hexagonale du trichromate d'ammonium, (NH4)2Cr3O10

D. Blum



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J. Appl. Cryst. (1979). 12, 608-609    [doi:10.1107/S0021889879013388]

Données cristallographiques sur le tétrachromate d'ammonium (NH4)2Cr4O13

D. Blum et D. Tran Qui



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J. Appl. Cryst. (1979). 12, 609-610    [doi:10.1107/S002188987901339X]

Etude cristallographique des monophosphates acides du type MII(H2PO4)2.2H2O pour MII=MnII, FeII, CoII

A. Boudjada et A. Durif



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J. Appl. Cryst. (1979). 12, 611    [doi:10.1107/S0021889879013406]

Crystal data for ammonium magnesium carbonate tetrahydrate [(NH4)2Mg(CO3)2.4H2O]

E. Erdös, H. Altorfer and J. Witt



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J. Appl. Cryst. (1979). 12, 612    [doi:10.1107/S0021889879013418]

Crystal data for pipemidic acid trihydrate C14H17N5O3.3H2O

R. Ceolin, F. Clanet, G. Ghemard, C. Souleau and P. Khodadad



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J. Appl. Cryst. (1979). 12, 613-614    [doi:10.1107/S002188987901342X]

Crystal data for sodium propanoate: C2H5COONa

V. Massarotti and G. Spinolo



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J. Appl. Cryst. (1979). 12, 615    [doi:10.1107/S0021889879013431]

Données crystallographiques sur la forme basse température de (NH4)3In(SO4)3

G. Laplace et B. Jolibois



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J. Appl. Cryst. (1979). 12, 616    [doi:10.1107/S0021889879013443]

New crystal data for Ca, Cu, UO2 hydrated carbonate: voglite

P. Piret and M. Deliens



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J. Appl. Cryst. (1979). 12, 617-618    [doi:10.1107/S0021889879013455]

Crystal data for N(CH3)4GeCl3

A. Möller and J. Felsche



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J. Appl. Cryst. (1979). 12, 618    [doi:10.1107/S0021889879013467]

Lattice parameters and space group of ethyl-4-acetoxy-5-methoxy-8-bromo-2-naphthoate (C16H15BrO5)

M. R. Hussain, A. Hussain and B. R. Rao



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J. Appl. Cryst. (1979). 12, 619-621    [doi:10.1107/S0021889879013479]

Crystal data for room temperature PuGa

R. B. Roof



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J. Appl. Cryst. (1979). 12, 621-622    [doi:10.1107/S0021889879013480]

Crystal data for [alpha]-iminodiacetic acid

M. Delfino, J. A. Nicolosi and J. Ladell



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J. Appl. Cryst. (1979). 12, 623-626    [doi:10.1107/S0021889879013492]

Revised crystal data for the aluminate sodalite Ca8[Al12O24](WO4)2

W. Depmeier



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J. Appl. Cryst. (1979). 12, 626-627    [doi:10.1107/S0021889879013509]

Crystal data for a second polymorph ([beta]) of C.I. Pigment Red 1,1-[(4-nitrophenyl)azo]-2-naphthol

A. Whitaker


computer programs



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J. Appl. Cryst. (1979). 12, 628    [doi:10.1107/S0021889879013510]

Curve analysis of small-angle scattering by triaxial body models using a graphic display device

Y. Hiragi



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J. Appl. Cryst. (1979). 12, 629-634    [doi:10.1107/S0021889879013522]

A search-match system for X-ray powder diffraction data

R. G. Marquart, I. Katsnelson, G. W. A. Milne, S. R. Heller, G. G. Johnson Jnr and R. Jenkins



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J. Appl. Cryst. (1979). 12, 634-635    [doi:10.1107/S0021889879013534]

Computer program for radial distribution analysis of X-ray, neutron and electron diffraction data

P. D'Antonio and J. H. Konnert



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J. Appl. Cryst. (1979). 12, 636-638    [doi:10.1107/S0021889879013546]

A system for interactive electron image calculations

A. J. Skarnulis


meeting reports



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J. Appl. Cryst. (1979). 12, 638-639    [doi:10.1107/S0021889879013558]

Inter-Congress Symposium on Accuracy in Powder Diffraction, National Bureau of Standards, Washington DC, USA, 11-15 June 1979

L. D. Calvert


crystallographers



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J. Appl. Cryst. (1979). 12, 639    [doi:10.1107/S002188987901356X]

Crystallographers


international union of crystallography



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J. Appl. Cryst. (1979). 12, 639-640    [doi:10.1107/S0021889879013571]

Prices of Acta Crystallographica and Journal of Applied Crystallography



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J. Appl. Cryst. (1979). 12, 640    [doi:10.1107/S0021889879013583]

Report of the Eleventh General Assembly International Congress of Crystallography



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J. Appl. Cryst. (1979). 12, 640    [doi:10.1107/S0021889879013595]

Report of Executive Committee for 1978



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J. Appl. Cryst. (1979). 12, 640    [doi:10.1107/S0021889879013601]

Commission on Journals: Chemical Nomenclature


book reviews



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J. Appl. Cryst. (1979). 12, 640-641    [doi:10.1107/S0021889879013613]

Scanning electron microscopy 1978. Vol. I edited by O. Johari



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J. Appl. Cryst. (1979). 12, 641    [doi:10.1107/S0021889879013625]

Surface crystallography by LEED. Theory, computation and structural results by M. A. Van Hove and S. Y. Tong



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J. Appl. Cryst. (1979). 12, 641-642    [doi:10.1107/S0021889879013637]

High pressure science and technology: 6th AIRAPT conference edited by D. Timmerhaus and M. S. Barker



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J. Appl. Cryst. (1979). 12, 642    [doi:10.1107/S0021889879013649]

Crystals: growth, properties and applications. Vol. 1. Crystals for magnetic applications edited by C. J. M. Rooijmans


J. Appl. Cryst. (1979). 12, 643-649

Subject index to volume 12 (1979)


J. Appl. Cryst. (1979). 12, 650-655

Author index to volume 12 (1979)


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