Journal of Applied Crystallography

Volume 13, Part 1 (February 1980)

• research papers
• crystal data
• computer programs
• laboratory notes
• international union of crystallography
• crystallographers
• book reviews
• books received

research papers

J. Appl. Cryst. (1980). 13, 1-6    [doi:10.1107/S0021889880011417]

On the geometrical conditions for recording X-ray topographs of large crystal slices

A. Lindegaard-Andersen, C. Christiansen and L. Zsoldos

J. Appl. Cryst. (1980). 13, 7-11    [doi:10.1107/S0021889880011429]

Determination of particle-size distribution functions from small-angle scattering data by means of the indirect transformation method

O. Glatter

J. Appl. Cryst. (1980). 13, 12-16    [doi:10.1107/S0021889880011430]

The application of asymmetric Bragg reflections in the Bond method of measuring lattice parameters

M. Wolcyrz, A. Pietraszko and K. Lukaszewicz

J. Appl. Cryst. (1980). 13, 17-23    [doi:10.1107/S0021889880011442]

The formation of varieties of carbon ordering in pseudobinary compounds of V₂C, Nb₂C and Ta₂C

K. Hiraga and M. Hirabayashi

J. Appl. Cryst. (1980). 13, 24-30    [doi:10.1107/S0021889880011454]

Phases, lattice parameters and thermal expansion of (Ga_xIn_1-x)₂Se₃, 1x0, between room temperature and melting point

A. Tonejc, S. Popovic and B. Grzeta-Plenkovic

J. Appl. Cryst. (1980). 13, 31-33    [doi:10.1107/S0021889880011466]

X-ray Bragg reflexion and strain compensation in silicon crystals

A. Fukuhara, Y. Takano, M. Namba and M. Maki

J. Appl. Cryst. (1980). 13, 34-45    [doi:10.1107/S0021889880011478]

The determination of diffuse-boundary thicknesses of polymers by small-angle X-ray scattering

J. T. Koberstein, B. Morra and R. S. Stein

J. Appl. Cryst. (1980). 13, 46-49    [doi:10.1107/S002188988001148X]

A miniature piston-cylinder apparatus for high-pressure X-ray diffraction in conjunction with energy dispersion

W. Nuding, E. Hinze and G. Will

J. Appl. Cryst. (1980). 13, 50-57    [doi:10.1107/S0021889880011491]

Etude des défauts des croissance dans des monocristaux naturels de quartz

A. Ser, J. P. Bideau, J. Clastre et A. Zarka

J. Appl. Cryst. (1980). 13, 58-64    [doi:10.1107/S0021889880011508]

Theoretical considerations of extra equal-thickness fringes around a dislocation outcrop observed with an X-ray plane wave

H. Ishida

J. Appl. Cryst. (1980). 13, 65-73    [doi:10.1107/S002188988001151X]

Analysis of stacking order and disorder by continuous Fourier transformation of diffracted intensities. Example: '₁ Cu-Al martensite

G. Van der Perre and A. Deruyttere

J. Appl. Cryst. (1980). 13, 74-77    [doi:10.1107/S0021889880011521]

Notes on the handling of position and broadening errors in deconvoluted X-ray diffraction line profiles

Th. H. de Keijser and E. J. Mittemeijer

J. Appl. Cryst. (1980). 13, 78-87    [doi:10.1107/S0021889880011533]

Assessment of synchrotron electron-beam damage in diamond by optical, cathodoluminescence and X-ray topographic methods

Mai Zhen-Hong and A. R. Lang

J. Appl. Cryst. (1980). 13, 88-92    [doi:10.1107/S0021889880011545]

Appareil de microdéformation à chaud pour topographie aux rayons X. Application à des bicristaux de germanium

P. Debrenne, A. Mathiot et R. de Tournemine

crystal data

J. Appl. Cryst. (1980). 13, 93-95    [doi:10.1107/S0021889880011557]

Crystal data for two kinds of molecular alloys between sebacic and dodecanedioic acids

Y. Haget, M. A. Cuevas, N. B. Chanh, L. Bonpunt and M. Font Altaba

J. Appl. Cryst. (1980). 13, 95-96    [doi:10.1107/S0021889880011569]

Crystal data for hexamethylenetetraselenafulvalene-perfluorotetracyanoquinodimethane

T. J. Emge, T. J. Kistenmacher, W. Bryden and L. K. Frevel

J. Appl. Cryst. (1980). 13, 96-97    [doi:10.1107/S0021889880011570]

Données crystallographiques sur les formes et du dichromate de baryum BaCr₂O₇

D. Blum

J. Appl. Cryst. (1980). 13, 98-99    [doi:10.1107/S0021889880011582]

Données cristallographiques de l'octohydrate du métagallate(III) de lithium

C. Caranoni et L. Capella

J. Appl. Cryst. (1980). 13, 99-100    [doi:10.1107/S0021889880011594]

Kristallstrukturdaten von Mn₂Ge

M. Ellner

computer programs

J. Appl. Cryst. (1980). 13, 100-101    [doi:10.1107/S0021889880011600]

A program to generate Bragg reflections compatible with lattice type and systematic absences

E. Arzi

J. Appl. Cryst. (1980). 13, 101-104    [doi:10.1107/S0021889880011612]

LSD: a Fortran software for mini-computers to control a four-circle neutron diffractometer for single crystals

A. Barthélemy and A. Filhol

laboratory notes

J. Appl. Cryst. (1980). 13, 105    [doi:10.1107/S0021889880011624]

A computer-controlled slit unit for the PW1100 diffractometer

S. Harkema and G. J. van Hummel

international union of crystallography

J. Appl. Cryst. (1980). 13, 105    [doi:10.1107/S0021889880011636]

Twelfth General Assembly and International Congress of Crystallography

J. Appl. Cryst. (1980). 13, 106    [doi:10.1107/S0021889880011648]

Donation

crystallographers

J. Appl. Cryst. (1980). 13, 106    [doi:10.1107/S002188988001165X]

Crystallographers

book reviews

J. Appl. Cryst. (1980). 13, 106    [doi:10.1107/S0021889880011661]

Crystal growth: theory and techniques. Vol. 2 edited by C. H. L. Goodman

J. Appl. Cryst. (1980). 13, 107    [doi:10.1107/S0021889880011673]

Optical determination of rock forming minerals by Tröger Tröger

J. Appl. Cryst. (1980). 13, 107    [doi:10.1107/S0021889880011685]

Current topics in materials sceince. Vol. 1 edited by E. Kaldis

J. Appl. Cryst. (1980). 13, 107-108    [doi:10.1107/S0021889880011697]

Diffraction and imaging techniques in material science edited by S. Amelinckx, R. Gevers and J. Van Landuyt

books received

J. Appl. Cryst. (1980). 13, 108    [doi:10.1107/S0021889880011703]

CALPHAD: Computer Coupling of Phase Diagrams edited by L. Kaufman

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