Journal of Applied Crystallography

Volume 13, Part 1 (February 1980)



research papers



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J. Appl. Cryst. (1980). 13, 1-6    [doi:10.1107/S0021889880011417]

On the geometrical conditions for recording X-ray topographs of large crystal slices

A. Lindegaard-Andersen, C. Christiansen and L. Zsoldos



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J. Appl. Cryst. (1980). 13, 7-11    [doi:10.1107/S0021889880011429]

Determination of particle-size distribution functions from small-angle scattering data by means of the indirect transformation method

O. Glatter



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J. Appl. Cryst. (1980). 13, 12-16    [doi:10.1107/S0021889880011430]

The application of asymmetric Bragg reflections in the Bond method of measuring lattice parameters

M. Wolcyrz, A. Pietraszko and K. Lukaszewicz



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J. Appl. Cryst. (1980). 13, 17-23    [doi:10.1107/S0021889880011442]

The formation of varieties of carbon ordering in pseudobinary compounds of V2C, Nb2C and Ta2C

K. Hiraga and M. Hirabayashi



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J. Appl. Cryst. (1980). 13, 24-30    [doi:10.1107/S0021889880011454]

Phases, lattice parameters and thermal expansion of (GaxIn1-x)2Se3, 1>=x>=0, between room temperature and melting point

A. Tonejc, S. Popovic and B. Grzeta-Plenkovic



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J. Appl. Cryst. (1980). 13, 31-33    [doi:10.1107/S0021889880011466]

X-ray Bragg reflexion and strain compensation in silicon crystals

A. Fukuhara, Y. Takano, M. Namba and M. Maki



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J. Appl. Cryst. (1980). 13, 34-45    [doi:10.1107/S0021889880011478]

The determination of diffuse-boundary thicknesses of polymers by small-angle X-ray scattering

J. T. Koberstein, B. Morra and R. S. Stein



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J. Appl. Cryst. (1980). 13, 46-49    [doi:10.1107/S002188988001148X]

A miniature piston-cylinder apparatus for high-pressure X-ray diffraction in conjunction with energy dispersion

W. Nuding, E. Hinze and G. Will



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J. Appl. Cryst. (1980). 13, 50-57    [doi:10.1107/S0021889880011491]

Etude des défauts des croissance dans des monocristaux naturels de quartz

A. Ser, J. P. Bideau, J. Clastre et A. Zarka



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J. Appl. Cryst. (1980). 13, 58-64    [doi:10.1107/S0021889880011508]

Theoretical considerations of extra equal-thickness fringes around a dislocation outcrop observed with an X-ray plane wave

H. Ishida



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J. Appl. Cryst. (1980). 13, 65-73    [doi:10.1107/S002188988001151X]

Analysis of stacking order and disorder by continuous Fourier transformation of diffracted intensities. Example: [beta]'1 Cu-Al martensite

G. Van der Perre and A. Deruyttere



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J. Appl. Cryst. (1980). 13, 74-77    [doi:10.1107/S0021889880011521]

Notes on the handling of position and broadening errors in deconvoluted X-ray diffraction line profiles

Th. H. de Keijser and E. J. Mittemeijer



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J. Appl. Cryst. (1980). 13, 78-87    [doi:10.1107/S0021889880011533]

Assessment of synchrotron electron-beam damage in diamond by optical, cathodoluminescence and X-ray topographic methods

Mai Zhen-Hong and A. R. Lang



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J. Appl. Cryst. (1980). 13, 88-92    [doi:10.1107/S0021889880011545]

Appareil de microdéformation à chaud pour topographie aux rayons X. Application à des bicristaux de germanium

P. Debrenne, A. Mathiot et R. de Tournemine


crystal data



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J. Appl. Cryst. (1980). 13, 93-95    [doi:10.1107/S0021889880011557]

Crystal data for two kinds of molecular alloys between sebacic and dodecanedioic acids

Y. Haget, M. A. Cuevas, N. B. Chanh, L. Bonpunt and M. Font Altaba



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J. Appl. Cryst. (1980). 13, 95-96    [doi:10.1107/S0021889880011569]

Crystal data for hexamethylenetetraselenafulvalene-perfluorotetracyanoquinodimethane

T. J. Emge, T. J. Kistenmacher, W. Bryden and L. K. Frevel



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J. Appl. Cryst. (1980). 13, 96-97    [doi:10.1107/S0021889880011570]

Données crystallographiques sur les formes [alpha] et [beta] du dichromate de baryum BaCr2O7

D. Blum



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J. Appl. Cryst. (1980). 13, 98-99    [doi:10.1107/S0021889880011582]

Données cristallographiques de l'octohydrate du métagallate(III) de lithium

C. Caranoni et L. Capella



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J. Appl. Cryst. (1980). 13, 99-100    [doi:10.1107/S0021889880011594]

Kristallstrukturdaten von Mn2Ge

M. Ellner


computer programs



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J. Appl. Cryst. (1980). 13, 100-101    [doi:10.1107/S0021889880011600]

A program to generate Bragg reflections compatible with lattice type and systematic absences

E. Arzi



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J. Appl. Cryst. (1980). 13, 101-104    [doi:10.1107/S0021889880011612]

LSD: a Fortran software for mini-computers to control a four-circle neutron diffractometer for single crystals

A. Barthélemy and A. Filhol


laboratory notes



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J. Appl. Cryst. (1980). 13, 105    [doi:10.1107/S0021889880011624]

A computer-controlled slit unit for the PW1100 diffractometer

S. Harkema and G. J. van Hummel


international union of crystallography



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J. Appl. Cryst. (1980). 13, 105    [doi:10.1107/S0021889880011636]

Twelfth General Assembly and International Congress of Crystallography



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J. Appl. Cryst. (1980). 13, 106    [doi:10.1107/S0021889880011648]

Donation


crystallographers



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J. Appl. Cryst. (1980). 13, 106    [doi:10.1107/S002188988001165X]

Crystallographers


book reviews



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J. Appl. Cryst. (1980). 13, 106    [doi:10.1107/S0021889880011661]

Crystal growth: theory and techniques. Vol. 2 edited by C. H. L. Goodman



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J. Appl. Cryst. (1980). 13, 107    [doi:10.1107/S0021889880011673]

Optical determination of rock forming minerals by Tröger Tröger



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J. Appl. Cryst. (1980). 13, 107    [doi:10.1107/S0021889880011685]

Current topics in materials sceince. Vol. 1 edited by E. Kaldis



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J. Appl. Cryst. (1980). 13, 107-108    [doi:10.1107/S0021889880011697]

Diffraction and imaging techniques in material science edited by S. Amelinckx, R. Gevers and J. Van Landuyt


books received



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J. Appl. Cryst. (1980). 13, 108    [doi:10.1107/S0021889880011703]

CALPHAD: Computer Coupling of Phase Diagrams edited by L. Kaufman


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