Journal of Applied Crystallography
Volume 13, Part 2 (April 1980)
J. Appl. Cryst. (1980). 13, 109-127 [doi:10.1107/S0021889880011715]
The study of the structure of grain boundaries using diffraction techniques
S. L. Sass
J. Appl. Cryst. (1980). 13, 128-131 [doi:10.1107/S0021889880011727]
A goniometer for the measurement of stresses in single crystals and coarse-grained specimens
J. Godijk, S. Nannenberg and P. F. Willemse
J. Appl. Cryst. (1980). 13, 132-134 [doi:10.1107/S0021889880011739]
The correlation function, intersect distribution and scattering from a cube
J. Goodisman
J. Appl. Cryst. (1980). 13, 135-140 [doi:10.1107/S0021889880011740]
Experimental separation of the coherent component of X-ray scattering prior to RDF analysis of non-crystalline polymers
G. R. Mitchell and A. H. Windle
J. Appl. Cryst. (1980). 13, 141-147 [doi:10.1107/S0021889880011752]
Circular diffuse scattering from a niobium tungsten bronze, 3Nb2O5.8WO3, studied by 1
MV higher-resolution electron microscopy
S. Horiuchi, K. Muramatsu and Y. Matsui
J. Appl. Cryst. (1980). 13, 148-153 [doi:10.1107/S0021889880011764]
Calcul du Profil des bandes de diffraction produites par des empilements de feuillets de nature différente
A. Plançon, G. Besson, C. H. Pons et C. Tchoubar
J. Appl. Cryst. (1980). 13, 154-162 [doi:10.1107/S0021889880011776]
Small-angle X-ray scattering from solutions of flow-oriented colloidal particles
B. Sjöberg
J. Appl. Cryst. (1980). 13, 163-167 [doi:10.1107/S0021889880011788]
An assessment of the performance of a diffracted-beam monochromator in single-crystal diffractometry
E. H. M. Evans, R. Hine, J. P. G. Richards and K. Tichy
J. Appl. Cryst. (1980). 13, 168-175 [doi:10.1107/S002188988001179X]
Small-angle scattering. Information content and error analysis
P. B. Moore
J. Appl. Cryst. (1980). 13, 176-179 [doi:10.1107/S0021889880011806]
Absolute atomic arrangement and spontaneous polarization in ferroelectric LiH3(SeO3)2
S. Chomnilpan, R. Liminga and R. Tellgren
J. Appl. Cryst. (1980). 13, 180-187 [doi:10.1107/S0021889880011818]
A high-resolution section topograph technique applicable to synchrotron radiation sources
Mai Zhen-Hong, S. Mardix and A. R. Lang
J. Appl. Cryst. (1980). 13, 188-189 [doi:10.1107/S002188988001182X]
Identification of coordination polyhedra in crystal structures
M. Johnson, J. C. Taylor and G. W. Cox
J. Appl. Cryst. (1980). 13, 190 [doi:10.1107/S0021889880011831]
Crystal data for barium methanesulphonate Ba(CH3SO3)2
Y. Garaud, F. Charbonnier and R. Faure
J. Appl. Cryst. (1980). 13, 191-192 [doi:10.1107/S0021889880011843]
Generalization of the ZRD-SEARCH-MATCH program for powder diffraction analysis
J. W. Edmonds
J. Appl. Cryst. (1980). 13, 193-197 [doi:10.1107/S0021889880011855]
Modelisation du désordre de substitution bidimensionnel
J. J. Legendre et M. Huber
J. Appl. Cryst. (1980). 13, 197-198 [doi:10.1107/S0021889880011867]
Program for crystal setting and data reduction on a PW 1100 diffractometer using a simple method based on real space
M. Biagini Cingi, G. Bandoli, D. A. Clemente and A. Tiripicchio
J. Appl. Cryst. (1980). 13, 199 [doi:10.1107/S0021889880011879]
A simple method for testing X-ray beam uniformity
P. G. Lenhert
J. Appl. Cryst. (1980). 13, 199 [doi:10.1107/S0021889880011880]
Crystallographers
J. Appl. Cryst. (1980). 13, 199-200 [doi:10.1107/S0021889880011892]
Commission on Crystallographic Apparatus. IUCr X-ray Attenuation Project
J. Appl. Cryst. (1980). 13, 200 [doi:10.1107/S0021889880011909]
Change of publisher of Structure Reports, Molecular Structures and Dimensions and other publications
J. Appl. Cryst. (1980). 13, 200 [doi:10.1107/S0021889880011910]
Essays on the properties of crystals by M. P. Shaskolskaya
J. Appl. Cryst. (1980). 13, 200 [doi:10.1107/S0021889880011922]
Solar cells. Their science, technology, applications and economics edited by T. Coutts, L. L. L. Kazmerski and S. Wagner
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