Journal of Applied Crystallography

Volume 13, Part 3 (June 1980)



research papers



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J. Appl. Cryst. (1980). 13, 201-206    [doi:10.1107/S0021889880011934]

Un goniomètre original très précis pour la diffraction des rayons X sur poudre à température controlée

J. F. Bérar, G. Calvarin et D. Weigel



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J. Appl. Cryst. (1980). 13, 207-210    [doi:10.1107/S0021889880011946]

A high-sensitivity double-beam triple-crystal X-ray spectrometer for lattice parameter and topographic measurements

R. C. Buschert, S. Pace, D. Inzaghi and A. E. Merlini



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J. Appl. Cryst. (1980). 13, 211-216    [doi:10.1107/S0021889880011958]

The morphotropic phase boundary in PZT solid solutions

S. A. Mabud



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J. Appl. Cryst. (1980). 13, 217-223    [doi:10.1107/S002188988001196X]

Ferroelastic phase transition in BiVO4 I. Birefringence measurements using the rotating-analyser method

I. G. Wood and A. M. Glazer



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J. Appl. Cryst. (1980). 13, 224-229    [doi:10.1107/S0021889880011971]

Ferroelastic phase transition in BiVO4 II. Birefringence at simultaneous high pressure and temperature

I. G. Wood, B. Welber, W. I. F. David and A. M. Glazer



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J. Appl. Cryst. (1980). 13, 230-232    [doi:10.1107/S0021889880011983]

A measurement method of growth and dissolution rates of birefringent crystal faces

M. Rubbo



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J. Appl. Cryst. (1980). 13, 233-243    [doi:10.1107/S0021889880011995]

Exact solution of the slit-height correction problem in small-angle X-ray scattering. III. Derivation of slit correction functions

M. Luban and M. Deutsch



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J. Appl. Cryst. (1980). 13, 244-251    [doi:10.1107/S0021889880012009]

Optical transforms of disordered molecular crystals

T. R. Welberry and R. D. G. Jones



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J. Appl. Cryst. (1980). 13, 252-255    [doi:10.1107/S0021889880012010]

The asymmetrically cut Bonse-Hart X-ray diffractometer. I. Design principles and performance

M. Deutsch



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J. Appl. Cryst. (1980). 13, 256-258    [doi:10.1107/S0021889880012022]

The asymmetrically cut Bonse-Hart X-ray diffractometer. II. Comparison with the Kratky camera

M. Deutsch



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J. Appl. Cryst. (1980). 13, 259-264    [doi:10.1107/S0021889880012034]

A new small-angle neutron scattering (SANS) instrument at ORNL using a position-sensitive area detector

H. R. Child and S. Spooner



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J. Appl. Cryst. (1980). 13, 265-272    [doi:10.1107/S0021889880012046]

The production of cold and ultracold neutrons by a moving crystal lattice

C. F. Majkrzak and S. S. Malik



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J. Appl. Cryst. (1980). 13, 273-279    [doi:10.1107/S0021889880012058]

Small-angle X-ray data processing for planar multilayered structures. 2. Experimental determination of the parameters for retinal photoreceptors and sarcoplasmic reticulum membranes

C. R. Worthington, A. R. Worthington and S. K. Wang



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J. Appl. Cryst. (1980). 13, 280-283    [doi:10.1107/S002188988001206X]

Determination of the largest particle dimension by direct Fourier cosine transformation of experimental small-angle X-ray scattering data

J. J. Müller, P. W. Schmidt, G. Damaschun and G. Walter



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J. Appl. Cryst. (1980). 13, 284-289    [doi:10.1107/S0021889880012071]

The application of a position-sensitive detector to high-pressure X-ray diffraction using a diamond-anvil cell

Y. Fujii, O. Shimomura, K. Takemura, S. Hoshino and S. Minomura



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J. Appl. Cryst. (1980). 13, 290-296    [doi:10.1107/S0021889880012083]

Determination of strain concentration by microfluorescent densitometry of X-ray topography: A bridge between microfracture and continuum mechanics

Z. H. Kalman, J. Chaudhuri, G. J. Weng and S. Weissmann



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J. Appl. Cryst. (1980). 13, 297-303    [doi:10.1107/S0021889880012095]

X-ray studies of growth striations in Fe-2.8 wt%Si alloy single crystals

M. Polcarová, S. Kadecková and P. Vanek


short communications



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J. Appl. Cryst. (1980). 13, 304-305    [doi:10.1107/S0021889880012101]

A strategy for collecting isomorphous derivative data with the oscillation method

A. G. W. Leslie and T. Tsukihara



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J. Appl. Cryst. (1980). 13, 305-307    [doi:10.1107/S0021889880012113]

Revidierte Kristalldaten für Kaliumhexachlorotellurat, K2TeCl6

H. Henke



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J. Appl. Cryst. (1980). 13, 307-310    [doi:10.1107/S0021889880012125]

Crystal data and structural relation between Pb6GeO8.Pb11Ge3O17 and PbO

H. H. Otto



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J. Appl. Cryst. (1980). 13, 310    [doi:10.1107/S0021889880012137]

Unit-cell dimensions and space group of cholesteryl ethyl carbonate

N. C. Shivaprakash, P. K. Rajalakshmi and J. Shashidhara Prasad



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J. Appl. Cryst. (1980). 13, 311-315    [doi:10.1107/S0021889880012149]

Crystal data for AgGaxIn1-xSe2 and CuGaxIn1-xSe2

B. Grzeta-Plenkovic, S. Popovic, B. Celustka and B. Santic



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J. Appl. Cryst. (1980). 13, 315    [doi:10.1107/S0021889880012150]

Crystal data for bis(1,10-phenanthroline)-hydrochloric acid dihydrate, (C12H8N2)2.HCl.2H2O

G. Thevenet, C. Souleau, M. Montagu-Bourin and R. Ceolin


computer programs



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J. Appl. Cryst. (1980). 13, 316-317    [doi:10.1107/S0021889880012162]

Average of equivalent reflections using small computers

J. Rigoult and C. Guidi-Morosini


international union of crystallography



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J. Appl. Cryst. (1980). 13, 318-337    [doi:10.1107/S0021889880012174]

Commission on Crystallographic Apparatus. Microdensitometer Project report I. Inter-Experimental Agreement


laboratory notes



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J. Appl. Cryst. (1980). 13, 338    [doi:10.1107/S0021889880012186]

Lengthening the focal spot in Elliot rotating-anode X-ray sets

W. C. Phillips



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J. Appl. Cryst. (1980). 13, 338-339    [doi:10.1107/S0021889880012198]

Longer filament lifetimes for rotating-anode X-ray machines using a beam-deflecting magnet

W. C. Phillips



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J. Appl. Cryst. (1980). 13, 339    [doi:10.1107/S0021889880012216]

A device for powder-film calibration

G. Donnay and M. H. Knoepfel



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J. Appl. Cryst. (1980). 13, 339-340    [doi:10.1107/S0021889880012204]

A method of calibrating powder-camera films

M. Cartwright


meeting reports



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J. Appl. Cryst. (1980). 13, 340-341    [doi:10.1107/S0021889880012228]

Symposium on Crystallographic Studies Using Energy-Dispersive Diffraction, American Crystallographic Association, Boston University, Boston, Massachusetts, USA, 12-17 August 1979

C. T. Prewitt and D. E. Cox


crystallographers



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J. Appl. Cryst. (1980). 13, 342    [doi:10.1107/S002188988001223X]

Crystallographers


international union of crystallography



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J. Appl. Cryst. (1980). 13, 342    [doi:10.1107/S0021889880012241]

President's Fund


book reviews



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J. Appl. Cryst. (1980). 13, 342    [doi:10.1107/S0021889880012253]

Nondestructive evaluation of semiconductor materials and devices by J. N. Zemel


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