Journal of Applied Crystallography

Volume 13, Part 5 (October 1980)



research papers



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J. Appl. Cryst. (1980). 13, 403-409    [doi:10.1107/S0021889880012459]

Phase transitions in ammonium nitrate

C. S. Choi, H. J. Prask and E. Prince



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J. Appl. Cryst. (1980). 13, 410-416    [doi:10.1107/S0021889880012460]

The measurement of the X-ray scattering factors of silicon from the fine structure of Laue-case rocking curves

U. Bonse and R. Teworte



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J. Appl. Cryst. (1980). 13, 417-424    [doi:10.1107/S0021889880012472]

Crystal subgrain misorientations observed by X-ray topography in reflection

R. W. Armstrong, W. J. Boettinger and M. Kuriyama



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J. Appl. Cryst. (1980). 13, 425-432    [doi:10.1107/S0021889880012484]

A novel low-temperature X-ray goniometer with closed-cycle cooling to about 18 K

S. Samson, E. Goldish and C. J. Dick



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J. Appl. Cryst. (1980). 13, 433-437    [doi:10.1107/S0021889880012496]

A white-X-ray four-circle diffractometer

T. Sakamaki, S. Hosoya and T. Fukamachi



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J. Appl. Cryst. (1980). 13, 438-449    [doi:10.1107/S0021889880012502]

Small-angle X-ray scattering due to sample shape

P. H. Stothart


crystal data



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J. Appl. Cryst. (1980). 13, 450-451    [doi:10.1107/S0021889880012514]

Preparation and X-ray powder diffraction studies of triple orthovanadates having langbeinite structure

M. A. Nabar and D. S. Phanasgaonkar



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J. Appl. Cryst. (1980). 13, 452-453    [doi:10.1107/S0021889880012526]

Données cristallographiques sur les thiocyanates de tris(éthylènediamine)rhodium(III) actif, racémique et racémique actif

C. Brouty, A. Whuler et P. Spinat



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J. Appl. Cryst. (1980). 13, 454-458    [doi:10.1107/S0021889880012538]

An X-ray diffraction study of the system Al2Se3In2Se3 in the In-rich region

B. Grzeta-Plenkovic, S. Popovic, D. Desnica and U. Desnica



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J. Appl. Cryst. (1980). 13, 458-459    [doi:10.1107/S002188988001254X]

Crystal data for a third polymorph ([zeta]) of C.I. Pigment Red 1,1-[(4-nitrophenyl)azo]-2-naphthol

A. Whitaker


computer programs



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J. Appl. Cryst. (1980). 13, 459-461    [doi:10.1107/S0021889880012551]

Computer program for radial distribution calculation from known bonding topologies

P. D'Antonio and J. H. Konnert


laboratory notes



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J. Appl. Cryst. (1980). 13, 462    [doi:10.1107/S0021889880012563]

A technique for controlling preferred orientation in powder diffraction samples

L. D. Calvert and A. F. Sirianni


crystallographers



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J. Appl. Cryst. (1980). 13, 462    [doi:10.1107/S0021889880012575]

Crystallographers


book reviews



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J. Appl. Cryst. (1980). 13, 462-463    [doi:10.1107/S0021889880012587]

Advances in X-ray analysis. Vol. 22 edited by G. J. McCarthy, C. S. Barrett, D. E. Leyden, J. B. Newkirk and C. O. Ruud



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J. Appl. Cryst. (1980). 13, 463    [doi:10.1107/S0021889880012599]

Industrial crystallization 78 edited by E. J. De Jong and S. J. Jancic



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J. Appl. Cryst. (1980). 13, 463-464    [doi:10.1107/S0021889880012605]

Scanning electron microscopy/1979. Parts I and II edited by O. Johari


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