Journal of Applied Crystallography

Volume 13, Part 6 (December 1980)

• research papers
• short communications
• crystal data
• computer programs
• laboratory notes
• international union of crystallography
• crystallographers
• book reviews

research papers

J. Appl. Cryst. (1980). 13, 465-471    [doi:10.1107/S0021889880012617]

A systematic method of estimating the performance of X-ray optical systems for synchrotron radiation. I. Description of various optical elements in position-angle space for ideally monochromatic X-rays

T. Matsushita and U. Kaminaga

J. Appl. Cryst. (1980). 13, 472-478    [doi:10.1107/S0021889880012629]

A systematic method of estimating the performance of X-ray optical systems for synchrotron radiation. II. Treatment in position-angle-wavelength space

T. Matsushita and U. Kaminaga

J. Appl. Cryst. (1980). 13, 479-485    [doi:10.1107/S0021889880012630]

Optimization of quantitative X-ray diffraction analysis

P. Szabó

J. Appl. Cryst. (1980). 13, 486-493    [doi:10.1107/S0021889880012642]

An X-ray crystallographic study of V₂D

H. S. U. Jo, S. C. Moss and D. G. Westlake

J. Appl. Cryst. (1980). 13, 494-499    [doi:10.1107/S0021889880012654]

Calcul de la FDOC à différents ordres de développement. Choix de l'ordre en fonction de l'acuité de la texture dans le cas de tôles d'aluminium

P. Dervin, M. Pernot et R. Penelle

J. Appl. Cryst. (1980). 13, 500-504    [doi:10.1107/S0021889880012666]

A determination of the normalization factor and its application to the incomplete pole-figure method

M. Humbert and H. W. Bergmann

J. Appl. Cryst. (1980). 13, 505-512    [doi:10.1107/S0021889880012678]

The structure of a lipid-water lamellar phase containing two types of lipid monolayers. An X-ray and neutron scattering study

J. L. Ranck, G. Zaccaï and V. Luzzati

J. Appl. Cryst. (1980). 13, 513-515    [doi:10.1107/S002188988001268X]

Détermination précise de la composition de couches epitaxiées Ga_1-xIn_xP (0x0,10)

A. Etcheberry, A. Marbeuf, M. Rommeluere et J. Rioux

J. Appl. Cryst. (1980). 13, 516-520    [doi:10.1107/S0021889880012691]

Absolute sense and model for the piezoelectric and pyroelectric coefficients in Ba(NO₂)₂H₂O and Cs₂S₂O₆

R. Liminga, S. C. Abrahams and J. L. Bernstein

J. Appl. Cryst. (1980). 13, 521-523    [doi:10.1107/S0021889880012708]

The limiting size of natural paracrystals

F. J. Baltá-Calleja and R. Hosemann

J. Appl. Cryst. (1980). 13, 524-528    [doi:10.1107/S002188988001271X]

The calculation of intensities diffracted by a partially oriented powder with a layer structure

A. Plançon

J. Appl. Cryst. (1980). 13, 529-532    [doi:10.1107/S0021889880012721]

A search for internal distortion in CeBi

M. H. Mueller, H. Shaked and O. Vogt

J. Appl. Cryst. (1980). 13, 533-538    [doi:10.1107/S0021889880012733]

Theoretical investigation of the ferroelastic domain structure in cesium lead chloride in the monoclinic phase

M. Chabin and F. Gilletta

J. Appl. Cryst. (1980). 13, 539-543    [doi:10.1107/S0021889880012745]

Experiment investigation of the ferroelastic domain structure in cesium lead chloride in the monoclinic phase

M. Chabin and F. Gilletta

J. Appl. Cryst. (1980). 13, 544-554    [doi:10.1107/S0021889880012757]

The role of the inversion centre in texture analysis

H. J. Bunge, C. Esling and J. Muller

J. Appl. Cryst. (1980). 13, 555-562    [doi:10.1107/S0021889880012769]

Projective properties of Laue topographs

J. Miltat and M. Dudley

J. Appl. Cryst. (1980). 13, 563-571    [doi:10.1107/S0021889880012770]

An automated peak fitting procedure for processing protein diffraction data from a linear position-sensitive detector

S. A. Spencer and A. A. Kossiakoff

J. Appl. Cryst. (1980). 13, 572-576    [doi:10.1107/S0021889880012782]

Application of the indirect transform method to obtaining distance distribution functions of extremely large colloids and emulsions using small-angle X-ray scattering data obtained with a Bonse-Hart instrument

C. W. Dwiggins Jnr

J. Appl. Cryst. (1980). 13, 577-584    [doi:10.1107/S0021889880012794]

Evaluation of small-angle scattering data from lamellar and cylindrical particles by the indirect transformation method

O. Glatter

J. Appl. Cryst. (1980). 13, 585-590    [doi:10.1107/S0021889880012800]

Intensity corrections for one-dimensional structure determination

B. Crist and C. R. Worthington

J. Appl. Cryst. (1980). 13, 591-596    [doi:10.1107/S0021889880012812]

Electron microscopic study of small particles of tungsten oxide formed by the evaporation of tungsten trioxide

H. Shibahara and H. Hashimoto

J. Appl. Cryst. (1980). 13, 597-600    [doi:10.1107/S0021889880012824]

Recherche des systèmes de glissement actifs dans un processus de déformation plastique du polycristal. III. Comportement du facteur de Taylor dans le cas du glissement cristallographique dans les cristaux cubiques

F. Royer et C. Tavard

J. Appl. Cryst. (1980). 13, 601-604    [doi:10.1107/S0021889880012836]

A novel high-temperature tensile stage for live X-ray topography

H. Baumgart, G. Markewitz and W. Hartmann

short communications

J. Appl. Cryst. (1980). 13, 605-607    [doi:10.1107/S0021889880012848]

An X-ray film powder profile refinement of the crystal structure of Ta₅P₃

J. O. Thomas, N. O. Ersson and Y. Andersson

J. Appl. Cryst. (1980). 13, 608-610    [doi:10.1107/S002188988001285X]

Molecular motions in a solid-solid transition of sodium dodecylsulphate

E. M. Macchi, F. J. Barrantes and G. E. Rigotti

J. Appl. Cryst. (1980). 13, 611    [doi:10.1107/S0021889880012861]

The space group of -In₂Se₃ and ₁-(Ga_xIn_1-x)₂Se₃: erratum

S. Popovic

crystal data

J. Appl. Cryst. (1980). 13, 611-612    [doi:10.1107/S0021889880012873]

X-ray powder diffraction data for 5'-azido-5'-deoxy-3'-O-acetylthymidine

D. F. Mullica, W. O. Milligan, W. B. Lunsford and M. Castro

J. Appl. Cryst. (1980). 13, 613    [doi:10.1107/S0021889880012897]

Crystal data for new rare-earth thallates M^IIITi^IIIO₃(M=La,Nd)

B. L. Dubey, S. Lakshmi, I. Das, B. N. Tiwari and A. Tripathi

J. Appl. Cryst. (1980). 13, 614-615    [doi:10.1107/S0021889880012903]

Crystal data for three new ammonium potassium pyrophosphates

K. R. Waerstad and A. W. Frazier

J. Appl. Cryst. (1980). 13, 616-617    [doi:10.1107/S0021889880012915]

Données cristallographiques sur (-)-[Rh(en)₃]Br₃.H₂O

P. Spinat, A. Whuler et C. Brouty

J. Appl. Cryst. (1980). 13, 618-621    [doi:10.1107/S0021889880012927]

Space group and lattice constants of Ca₁₀(PO₄)₆CO₃

J. C. Elliott

J. Appl. Cryst. (1980). 13, 621    [doi:10.1107/S0021889880012939]

Crystal data for barium iodate monohydrate

M. S. Joshi, T. P. Singh and S. G. Trivedi

J. Appl. Cryst. (1980). 13, 622-624    [doi:10.1107/S0021889880012940]

Crystal data for potassium and rubidium propanoates: C₂H₅COOK and C₂H₅COORb

V. Massarotti and G. Spinolo

computer programs

J. Appl. Cryst. (1980). 13, 625-629    [doi:10.1107/S0021889880012952]

The CRISTEP desktop plotter system for molecular and crystallographic drawings

J. F. de Wet

J. Appl. Cryst. (1980). 13, 630-633    [doi:10.1107/S0021889880012964]

EDINP, the Edinburgh powder profile refinement program

G. S. Pawley

laboratory notes

J. Appl. Cryst. (1980). 13, 633    [doi:10.1107/S0021889880012976]

A fast and accurate way of aligning X-ray cameras

S. Hovmöller

J. Appl. Cryst. (1980). 13, 633-634    [doi:10.1107/S0021889880012988]

Reliable temperature readings in the low-temperature Guinier-Lenné camera

G. H. Kolkman and F. Tuinstra

international union of crystallography

J. Appl. Cryst. (1980). 13, 634-635    [doi:10.1107/S002188988001299X]

Prices of Acta Crystallographica and Journal of Applied Crystallography

J. Appl. Cryst. (1980). 13, 635    [doi:10.1107/S0021889880013003]

Computing in Crystallography

J. Appl. Cryst. (1980). 13, 635    [doi:10.1107/S0021889880013015]

Report of the Executive Committee for 1979

crystallographers

J. Appl. Cryst. (1980). 13, 636    [doi:10.1107/S0021889880013027]

Crystallographers

book reviews

J. Appl. Cryst. (1980). 13, 636    [doi:10.1107/S0021889880013039]

Ferroelectric films of metallic complex oxides by Yu. Ya. Tomashpolsky

J. Appl. Cryst. (1980). 13, 636-637    [doi:10.1107/S0021889880013040]

Current topics in materials science. Vol. 3 edited by E. Kaldis

J. Appl. Cryst. (1980). 13, 637    [doi:10.1107/S0021889880013052]

Current topics in materials science. Vol. 4 edited by E. Kaldis

J. Appl. Cryst. (1980). 13, 637-638    [doi:10.1107/S0021889880013064]

Handbook of semiconductors. Vol. 2. Optical properties of solids edited by M. Balkanski

J. Appl. Cryst. (1980). 13, 639-644

Subject index to volume 13 (1980)

J. Appl. Cryst. (1980). 13, 645-649

Author index to volume 13 (1980)

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