Journal of Applied Crystallography

Volume 14, Part 2 (April 1981)



research papers



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J. Appl. Cryst. (1981). 14, 79-81    [doi:10.1107/S0021889881008832]

Computer simulation of electron microscope images on microfiche

K. M. Crennell and L. G. Mallinson



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J. Appl. Cryst. (1981). 14, 82-84    [doi:10.1107/S0021889881008844]

A low-temperature Weissenberg camera for neutrons

D. Hohlwein and A. F. Wright



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J. Appl. Cryst. (1981). 14, 85-93    [doi:10.1107/S0021889881008856]

Characteristics of a flat multiwire area detector for protein crystallography

R. Hamlin, C. Cork, A. Howard, C. Nielsen, W. Vernon, D. Matthews and Ng. H. Xuong



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J. Appl. Cryst. (1981). 14, 94-100    [doi:10.1107/S0021889881008868]

A computer graphics system for the building of macromolecular models into electron density maps

J. R. Miller, S. S. Abdel-Meguid, M. G. Rossmann and D. C. Anderson



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J. Appl. Cryst. (1981). 14, 101-108    [doi:10.1107/S002188988100887X]

Convolution square root of band-limited symmetrical functions and its application to small-angle scattering data

O. Glatter



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J. Appl. Cryst. (1981). 14, 109-116    [doi:10.1107/S0021889881008881]

Theoretical scattering amplitudes for the atomic scattering of low-energy electrons for use in surface crystallography by low-energy electron diffraction

G. B. Olszewski and S. L. Bernasek



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J. Appl. Cryst. (1981). 14, 117-123    [doi:10.1107/S0021889881008893]

The use of cell and symmetry information for single-crystal orientation on diffractometers

Y. Le Page and E. J. Gabe



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J. Appl. Cryst. (1981). 14, 124-130    [doi:10.1107/S002188988100890X]

An assessment of instrumental parameters which control the accuracy of stress measurement using the X-ray diffractometer method

P. Doig, D. Lonsdale and P. E. J. Flewitt



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J. Appl. Cryst. (1981). 14, 131-133    [doi:10.1107/S0021889881008911]

Lattice-parameter studies on V0.977Mo0.023O2 the vicinity of the semiconductor-to-metal transition

D. Kucharczyk and T. Niklewski



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J. Appl. Cryst. (1981). 14, 134-136    [doi:10.1107/S0021889881008923]

Rotation data collection for protein crystallography with time-variable incident intensity from synchrotron radiation sources

H. D. Bartunik, P. N. Clout and B. Robrahn


short communications



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J. Appl. Cryst. (1981). 14, 137-139    [doi:10.1107/S0021889881008935]

Neutron powder diffraction of forsterite, Mg2SiO4: a comparison with single-crystal investigations

G. A. Lager, F. K. Ross, F. J. Rotella and J. D. Jorgensen



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J. Appl. Cryst. (1981). 14, 139-141    [doi:10.1107/S0021889881008947]

Adaptation of a Kratky camera to use with a one-dimensional position-sensitive detector

R.-J. Roe, J. C. Chang, M. Fishkis and J. J. Curro


crystal data



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J. Appl. Cryst. (1981). 14, 141-142    [doi:10.1107/S0021889881008959]

Crystal data for [beta]-PbO2

H. Harada, Y. Sasa and M. Uda



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J. Appl. Cryst. (1981). 14, 143-144    [doi:10.1107/S0021889881008960]

Données cristallographiques sur l'aquapentachlororhodate d'ammonium (NH4)2[RhCl5(H2O)]

G. Bugli



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J. Appl. Cryst. (1981). 14, 145    [doi:10.1107/S0021889881008972]

Crystal data for 5-hydroxy-7-methyl-1,4-naphthoquinone

A. Hussain, M. R. Hussain and S. Mehdi


computer programs



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J. Appl. Cryst. (1981). 14, 145-148    [doi:10.1107/S0021889881008984]

XPKFIT: peak separation with arbitrary relations among the component peaks

M. Hayakawa and M. Oka



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J. Appl. Cryst. (1981). 14, 149-151    [doi:10.1107/S0021889881008996]

A new computer program for Rietveld analysis of X-ray powder diffraction patterns

D. B. Wiles and R. A. Young



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J. Appl. Cryst. (1981). 14, 151-153    [doi:10.1107/S002188988100900X]

BLOKJE, a computer program to calculate the domain of an atom in a structure

L. Gelato


laboratory notes



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J. Appl. Cryst. (1981). 14, 153-154    [doi:10.1107/S0021889881009011]

A simple method for surveying macromolecular crystallization conditions by microdialysis

I. Rayment



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J. Appl. Cryst. (1981). 14, 154-155    [doi:10.1107/S0021889881009023]

Determination of Bragg peaks from a flat single crystal using a rotation photograph

H. Chen and M. A. Dvorack


crystallographers



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J. Appl. Cryst. (1981). 14, 155    [doi:10.1107/S0021889881009035]

Crystallographers


book reviews



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J. Appl. Cryst. (1981). 14, 155-156    [doi:10.1107/S0021889881009047]

Crystal growth: a tutorial approach edited by W. Bardsley, D. T. J. Hurle and J. B. Mullin


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