Journal of Applied Crystallography

Volume 14, Part 2 (April 1981)

research papers
short communications
crystal data
computer programs
laboratory notes
crystallographers
book reviews

research papers

J. Appl. Cryst. (1981). 14, 79-81 [doi:10.1107/S0021889881008832]

Computer simulation of electron microscope images on microfiche

K. M. Crennell and L. G. Mallinson

J. Appl. Cryst. (1981). 14, 82-84 [doi:10.1107/S0021889881008844]

A low-temperature Weissenberg camera for neutrons

D. Hohlwein and A. F. Wright

J. Appl. Cryst. (1981). 14, 85-93 [doi:10.1107/S0021889881008856]

Characteristics of a flat multiwire area detector for protein crystallography

R. Hamlin, C. Cork, A. Howard, C. Nielsen, W. Vernon, D. Matthews and Ng. H. Xuong

J. Appl. Cryst. (1981). 14, 94-100 [doi:10.1107/S0021889881008868]

A computer graphics system for the building of macromolecular models into electron density maps

J. R. Miller, S. S. Abdel-Meguid, M. G. Rossmann and D. C. Anderson

J. Appl. Cryst. (1981). 14, 101-108 [doi:10.1107/S002188988100887X]

Convolution square root of band-limited symmetrical functions and its application to small-angle scattering data

O. Glatter

J. Appl. Cryst. (1981). 14, 109-116 [doi:10.1107/S0021889881008881]

Theoretical scattering amplitudes for the atomic scattering of low-energy electrons for use in surface crystallography by low-energy electron diffraction

G. B. Olszewski and S. L. Bernasek

J. Appl. Cryst. (1981). 14, 117-123 [doi:10.1107/S0021889881008893]

The use of cell and symmetry information for single-crystal orientation on diffractometers

Y. Le Page and E. J. Gabe

J. Appl. Cryst. (1981). 14, 124-130 [doi:10.1107/S002188988100890X]

An assessment of instrumental parameters which control the accuracy of stress measurement using the X-ray diffractometer method

P. Doig, D. Lonsdale and P. E. J. Flewitt

J. Appl. Cryst. (1981). 14, 131-133 [doi:10.1107/S0021889881008911]

Lattice-parameter studies on V_0.977Mo_0.023O₂ the vicinity of the semiconductor-to-metal transition

D. Kucharczyk and T. Niklewski

J. Appl. Cryst. (1981). 14, 134-136 [doi:10.1107/S0021889881008923]

Rotation data collection for protein crystallography with time-variable incident intensity from synchrotron radiation sources

H. D. Bartunik, P. N. Clout and B. Robrahn

short communications

J. Appl. Cryst. (1981). 14, 137-139 [doi:10.1107/S0021889881008935]

Neutron powder diffraction of forsterite, Mg₂SiO₄: a comparison with single-crystal investigations

G. A. Lager, F. K. Ross, F. J. Rotella and J. D. Jorgensen

J. Appl. Cryst. (1981). 14, 139-141 [doi:10.1107/S0021889881008947]

Adaptation of a Kratky camera to use with a one-dimensional position-sensitive detector

R.-J. Roe, J. C. Chang, M. Fishkis and J. J. Curro

crystal data

J. Appl. Cryst. (1981). 14, 141-142 [doi:10.1107/S0021889881008959]

Crystal data for -PbO₂

H. Harada, Y. Sasa and M. Uda

J. Appl. Cryst. (1981). 14, 143-144 [doi:10.1107/S0021889881008960]

Données cristallographiques sur l'aquapentachlororhodate d'ammonium (NH₄)₂[RhCl₅(H₂O)]

G. Bugli

J. Appl. Cryst. (1981). 14, 145 [doi:10.1107/S0021889881008972]

Crystal data for 5-hydroxy-7-methyl-1,4-naphthoquinone

A. Hussain, M. R. Hussain and S. Mehdi

computer programs

J. Appl. Cryst. (1981). 14, 145-148 [doi:10.1107/S0021889881008984]

XPKFIT: peak separation with arbitrary relations among the component peaks

M. Hayakawa and M. Oka

J. Appl. Cryst. (1981). 14, 149-151 [doi:10.1107/S0021889881008996]

A new computer program for Rietveld analysis of X-ray powder diffraction patterns

D. B. Wiles and R. A. Young

J. Appl. Cryst. (1981). 14, 151-153 [doi:10.1107/S002188988100900X]

BLOKJE, a computer program to calculate the domain of an atom in a structure

L. Gelato

laboratory notes

J. Appl. Cryst. (1981). 14, 153-154 [doi:10.1107/S0021889881009011]

A simple method for surveying macromolecular crystallization conditions by microdialysis

I. Rayment

J. Appl. Cryst. (1981). 14, 154-155 [doi:10.1107/S0021889881009023]

Determination of Bragg peaks from a flat single crystal using a rotation photograph

H. Chen and M. A. Dvorack

crystallographers

J. Appl. Cryst. (1981). 14, 155 [doi:10.1107/S0021889881009035]

Crystallographers

book reviews

J. Appl. Cryst. (1981). 14, 155-156 [doi:10.1107/S0021889881009047]