Journal of Applied Crystallography
Volume 14, Part 3 (June 1981)
J. Appl. Cryst. (1981). 14, 157-159 [doi:10.1107/S0021889881009059]
Comparison of profile and integrated-intensity methods in powder refinement
E. Prince
J. Appl. Cryst. (1981). 14, 160-168 [doi:10.1107/S0021889881009060]
The use of continuous diffraction data as a phase constraint. I. One-dimensional theory
L. Makowski
J. Appl. Cryst. (1981). 14, 169-177 [doi:10.1107/S0021889881009072]
High-voltage, high-resolution electron microscopy of Au-Cd alloys. I. Hexagonal long-period superstructures near 30 at. % Cd
M. Hirabayashi, K. Hiraga and D. Shindo
J. Appl. Cryst. (1981). 14, 178-184 [doi:10.1107/S0021889881009084]
High-voltage, high-resolution electron microscopy of Au-Cd alloys. II. Double hexagonal long-period superstructures
D. Shindo, K. Hiraga and M. Hirabayashi
J. Appl. Cryst. (1981). 14, 185-190 [doi:10.1107/S0021889881009096]
High-voltage, high-resolution electron microscopy of Au-Cd alloys. III. One-dimensional long-period superstructure of DO23
type
K. Hiraga, D. Shindo and M. Hirabayashi
J. Appl. Cryst. (1981). 14, 191-202 [doi:10.1107/S0021889881009102]
Small-angle neutron scattering of aqueous dispersions of lipids and lipid mixtures. A contrast variation study
W. Knoll, J. Haas, H. B. Stuhrmann, H.-H. Füldner, H. Vogel and E. Sackmann
J. Appl. Cryst. (1981). 14, 203-207 [doi:10.1107/S0021889881009114]
Thermal expansion and phase transitions of sodium potassium tartrate tetrahydrate (RS)
W. Bronowska
J. Appl. Cryst. (1981). 14, 208-209 [doi:10.1107/S0021889881009126]
Die sin
i/sin
j-Methode für die Bestimmung von Gitterparametern
J. Vavrda
J. Appl. Cryst. (1981). 14, 209-210 [doi:10.1107/S0021889881009138]
Crystal data for the decavanadates of methylpyridines
J. M. Arrieta, P. Gili and J. M. Amigó
J. Appl. Cryst. (1981). 14, 211-212 [doi:10.1107/S002188988100914X]
Données cristallographiques des formes polymorphes du complexe racémique de fluorure de tris(éthylènediamine)cobalt(III)
P. Spinat, A. Whuler et C. Brouty
J. Appl. Cryst. (1981). 14, 212-213 [doi:10.1107/S0021889881009151]
Kristallstrukturdaten von PdAl4
M. Ellner, U. Kattner und B. Predel
J. Appl. Cryst. (1981). 14, 214-215 [doi:10.1107/S0021889881009163]
A procedure for random access to reflection data
S. R. Hall
J. Appl. Cryst. (1981). 14, 216 [doi:10.1107/S0021889881009175]
Submission of Manuscripts Based on Powder Diffraction Profile Fitting or Refinement (Rietveld) Methods: Deposition of Data
J. Appl. Cryst. (1981). 14, 216-217 [doi:10.1107/S0021889881009187]
Commission on Journals: Standards for the Publication of Powder Pattern Data
J. Appl. Cryst. (1981). 14, 217 [doi:10.1107/S0021889881009199]
Communicated Abstracts Twelfth Congress of Crystallography, Carleton University, Ottawa, 16-25 August 1981
J. Appl. Cryst. (1981). 14, 217-218 [doi:10.1107/S0021889881009205]
Crystallographers
J. Appl. Cryst. (1981). 14, 218 [doi:10.1107/S0021889881009217]
Electron microscopy and analysis 1979 edited by T. Mulvey
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