Journal of Applied Crystallography

Volume 14, Part 4 (August 1981)



research papers



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J. Appl. Cryst. (1981). 14, 219-222    [doi:10.1107/S0021889881009229]

An estimate of the surface roughness effect

B. Borie



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J. Appl. Cryst. (1981). 14, 223-225    [doi:10.1107/S0021889881009230]

A new method to determine the exact values of the fiber identity period of polyamides

K. Kaji, H. Yamagishi and R. Kitamaru



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J. Appl. Cryst. (1981). 14, 226-229    [doi:10.1107/S0021889881009242]

A simple procedure for fitting a backgound to a certain class of measured spectra

S. Steenstrup



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J. Appl. Cryst. (1981). 14, 230-233    [doi:10.1107/S0021889881009254]

The feasibility of the reproduction of the texture function by the vector method

J. Pospiech, D. Ruer and R. Baro



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J. Appl. Cryst. (1981). 14, 234-236    [doi:10.1107/S0021889881009266]

Calcium fluoride as an internal pressure standard in high-pressure crystallography

R. M. Hazen and L. W. Finger



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J. Appl. Cryst. (1981). 14, 237-240    [doi:10.1107/S0021889881009278]

On the estimation of the radius of gyration of the subunits of macromolecular aggregates of biological origin in situ

P. B. Moore



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J. Appl. Cryst. (1981). 14, 241-246    [doi:10.1107/S002188988100928X]

Growth of a beryl single crystal-history of the development and the genetic medium

G. Graziani, E. Scandale and A. Zarka



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J. Appl. Cryst. (1981). 14, 247-252    [doi:10.1107/S0021889881009291]

Refraction corrections to the diffractometer angles of centered reflections from extended-face single crystals

G. J. McIntyre



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J. Appl. Cryst. (1981). 14, 253-255    [doi:10.1107/S0021889881009308]

Determination of the odd part of the texture function by anomalous scattering

H. J. Bunge and C. Esling



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J. Appl. Cryst. (1981). 14, 256-260    [doi:10.1107/S002188988100931X]

Preliminary investigation of a new X-ray film

S. Abrahamsson, O. Lindqvist, L. Sjölin and A. Wlodawer



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J. Appl. Cryst. (1981). 14, 261-264    [doi:10.1107/S0021889881009321]

Neutron powder diffraction study of defect spinel structures: Tetrahedrally coordinated Ti4+ in Ni2.62Ti0.69O4 and Ni2.42Ti0.74Si0.05O4

G. A. Lager, T. Armbruster, F. K. Ross, F. J. Rotella and J. D. Jorgensen



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J. Appl. Cryst. (1981). 14, 265-269    [doi:10.1107/S0021889881009333]

Complete determination of subgrain misorientation by an X-ray topographic method

J. Kulda and M. Polcarová



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J. Appl. Cryst. (1981). 14, 270-273    [doi:10.1107/S0021889881009345]

The influence of crystallite orientations on the chemical reactivity of hematite [alpha]-Fe2O3 and magnetite Fe3O4

J. J. Heizmann, P. Becker and R. Baro



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J. Appl. Cryst. (1981). 14, 274-279    [doi:10.1107/S0021889881009357]

An interactive graphics system for comparing the model building of macromolecules

N. P. Brandenburg, S. Dempsey, B. W. Dijkstra, L. J. Lijk and W. G. J. Hol


laboratory notes



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J. Appl. Cryst. (1981). 14, 280    [doi:10.1107/S0021889881009369]

A high-resolution X-ray facility

H. Chen and M. Kuriyama


crystallographers



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J. Appl. Cryst. (1981). 14, 280    [doi:10.1107/S0021889881009370]

Crystallographers


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