Journal of Applied Crystallography Journal of Applied
Crystallography

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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

Volume 15| Part 1

ISSN: 1600-5767

February 1982 issue

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research papers

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An automated low-temperature Guinier X-ray diffractometer and camera

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A method of determining cubic parameters suited to the conditions of high- and low-temperature powder diffractometry

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The forward scattering of cold neutrons by mixtures of light and heavy water

R. P. May, K. Ibel and J. Haas

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Diffraction line profiles and Scherrer constants for materials with cylindrical crystallites

J. I. Langford and D. Louër

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High-resolution time-of-flight powder diffractometer at the ZING-P'' pulsed neutron source

J. D. Jorgensen and F. J. Rotella

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X-ray line profile analysis of deformed Al

W. Yuming, L. Shansan and L. Yenchin

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An improved EXAFS-function calculation procedure for materials with small interatomic separation

D. Macovei, P. Păuşescu, R. Grigorovici and R. Mănăilă

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Polycrystal scattering topography

Y. Chikaura, Y. Yoneda and G. Hildebrandt

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A new CeO₂ form obtained as oxidation product of CeO₂+SiO₂-doped hot-pressed silicon nitride

G. Celotti, G. N. Babini, A. Bellosi and P. Vincenzini

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A simple method for the determination of structure-factor phase relationships and crystal polarity using electron diffraction

J. Taftø and J. C. H. Spence

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Two-dimensional antiphase structure of Au₄Mg studied by high-voltage–high-resolution electron microscopy

O. Terasaki, Y. Mikata, D. Watanabe, K. Hiraga, D. Shindo and M. Hirabayashi

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Second harmonic generation and orientational order in connective tissue: a mosaic model for fibril orientational ordering in rat-tail tendon

S. Roth and I. Freund

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Refinement of the crystal orientation matrix for the flat-cone diffractometer

A. Wlodawer, L. Sjölin and A. Santoro

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Energy-dispersive measurements of diffracted synchrotron radiation as a function of pressure: applications to phase transitions in KCl and KI

E. F. Skelton, J. Kirkland and S. B. Qadri

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A multi-channel solid-state detector

Y. Nakano, T. Fukamachi, H. Kotani, H. Hirata, S. Hosoya and Y. Iitaka

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Equipping a three-circle single-crystal diffractometer with an Si(Li) solid-state detector and a low-temperature cryostat (80 K) to measure X-ray diffuse intensity

M. Bessière, S. Lefebvre, Y. Calvayrac, F. Bley and M. Fayard

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short communications

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The resolving capability of the NaI(Tl) scintillation detector

A. M. Mathieson

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A comment on attenuator factors and the dead time of counter systems

A. M. Mathieson

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Precise lattice parameter determination of PtHg₄

S. K. Lahiri, J. Angilello and M. Natan

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crystal data

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Crystal data for lanthanum chromate(V)

S. G. Manca and E. J. Baran

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Powder data for the solid electrolyte α-RbCu₄Cl₃I₂

A. Turković, B. Gržeta-Plenković and B. Etlinger

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Crystal data for the decavanadates of pyridine, 2-ethlpyridine and 3-ethylpyridine

J. M. Arrieta, J. M. Amigó and P. Gili

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Paramètres, groupe d'espace et diagramme de poudre de l'amino-2 thiazole-1,3

C. Caranoni and L. Capella

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An X-ray diffraction study of the system Al₂S₃–In₂S₃ in the In-rich region

S. Popović, B. Gržeta-Plenković and B. Etlinger

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Crystal data for deacetylpaniculine

M. T. Garland and O. Muñoz

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The polymorphism of silver tungstate Ag₂WO₄

A. J. van den Berg and C. A. H. Juffermans

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Crystal data for a new family of phases, Li₃Mg₂XO₆:X=Nb, Ta, Sb

M. Castellanos, J. A. Gard and A. R. West

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Crystal data for the monohydrated uranyl bis(dihydrogen phosphate), UO₂(H₂PO₄)₂.H₂O, and uranyl bis(dihydrogen arsenate), UO₂(H₂AsO₄)₂.H₂O

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computer programs

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TERRIG, a computer program for analysing thermal ellipsoids and rigid-body motions

N. Armaǧan and A. Yücel

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A generalized library program for texture calculations with even and odd coefficients

F. Wagner, E. Bechler-Ferry, C. Esling and R. Baro

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Indexing asymmetrical Laue photographs: application to echinoid calcite

H. V. Hart and E. A. Rietman

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HELP: a Fortran V computer program for obtaining the Cartesian coordinates of a single molecule from its chemical formula

A. Di Nola and E. Brosio

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Rapid analytic approximations for disorientation integrals in fiber diffraction

S. W. Provencher and J. Glöckner

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A molecular plotting program

R. Radhakrishnan

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laboratory notes

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A quick and simple method for orienting cubic single crystals from Laue back-reflection photographs

A. S. Cheng and C. Laird

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A fail-safe design for X-ray safety shutters

W. E. Cramer, S. Guggenheim and E. A. Port

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crystallographers

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Crystallographers

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international union of crystallography

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Division of Acta Crystallographica

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Deposition of Crystal Data

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book reviews

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Scanning electron microscopy/1980. Parts I and II edited by R. P. Becker and Om. Johari

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Characterisation of crystal growth defects by X-ray methods. NATO Advanced Study Institutes Series, Series B: Physics edited by B. K. Tanner and D. K. Bowen

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Current topics in materials science, Vols. 5 and 6 edited by E. Kaldis

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