Journal of Applied Crystallography

Volume 15, Part 1 (February 1982)



research papers



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J. Appl. Cryst. (1982). 15, 1-4    [doi:10.1107/S0021889882011261]

An automated low-temperature Guinier X-ray diffractometer and camera

J. Ihringer



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J. Appl. Cryst. (1982). 15, 5-14    [doi:10.1107/S0021889882011273]

A method of determining cubic parameters suited to the conditions of high- and low-temperature powder diffractometry

R. W. Cheary



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J. Appl. Cryst. (1982). 15, 15-19    [doi:10.1107/S0021889882011285]

The forward scattering of cold neutrons by mixtures of light and heavy water

R. P. May, K. Ibel and J. Haas



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J. Appl. Cryst. (1982). 15, 20-26    [doi:10.1107/S0021889882011297]

Diffraction line profiles and Scherrer constants for materials with cylindrical crystallites

J. I. Langford and D. Louër



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J. Appl. Cryst. (1982). 15, 27-34    [doi:10.1107/S0021889882011303]

High-resolution time-of-flight powder diffractometer at the ZING-P'' pulsed neutron source

J. D. Jorgensen and F. J. Rotella



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J. Appl. Cryst. (1982). 15, 35-38    [doi:10.1107/S0021889882011315]

X-ray line profile analysis of deformed Al

W. Yuming, L. Shansan and L. Yenchin



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J. Appl. Cryst. (1982). 15, 39-47    [doi:10.1107/S0021889882011327]

An improved EXAFS-function calculation procedure for materials with small interatomic separation

D. Macovei, P. Pausescu, R. Grigorovici and R. Manaila



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J. Appl. Cryst. (1982). 15, 48-54    [doi:10.1107/S0021889882011339]

Polycrystal scattering topography

Y. Chikaura, Y. Yoneda and G. Hildebrandt



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J. Appl. Cryst. (1982). 15, 55-59    [doi:10.1107/S0021889882011340]

A new CeO2 form obtained as oxidation product of CeO2+SiO2-doped hot-pressed silicon nitride

G. Celotti, G. N. Babini, A. Bellosi and P. Vincenzini



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J. Appl. Cryst. (1982). 15, 60-64    [doi:10.1107/S0021889882011352]

A simple method for the determination of structure-factor phase relationships and crystal polarity using electron diffraction

J. Taftø and J. C. H. Spence



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J. Appl. Cryst. (1982). 15, 65-71    [doi:10.1107/S0021889882011364]

Two-dimensional antiphase structure of Au4Mg studied by high-voltage-high-resolution electron microscopy

O. Terasaki, Y. Mikata, D. Watanabe, K. Hiraga, D. Shindo and M. Hirabayashi



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J. Appl. Cryst. (1982). 15, 72-78    [doi:10.1107/S0021889882011376]

Second harmonic generation and orientational order in connective tissue: a mosaic model for fibril orientational ordering in rat-tail tendon

S. Roth and I. Freund



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J. Appl. Cryst. (1982). 15, 79-81    [doi:10.1107/S0021889882011388]

Refinement of the crystal orientation matrix for the flat-cone diffractometer

A. Wlodawer, L. Sjölin and A. Santoro



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J. Appl. Cryst. (1982). 15, 82-88    [doi:10.1107/S002188988201139X]

Energy-dispersive measurements of diffracted synchrotron radiation as a function of pressure: applications to phase transitions in KCl and KI

E. F. Skelton, J. Kirkland and S. B. Qadri



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J. Appl. Cryst. (1982). 15, 89-93    [doi:10.1107/S0021889882011406]

A multi-channel solid-state detector

Y. Nakano, T. Fukamachi, H. Kotani, H. Hirata, S. Hosoya and Y. Iitaka



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J. Appl. Cryst. (1982). 15, 94-97    [doi:10.1107/S0021889882011418]

Equipping a three-circle single-crystal diffractometer with an Si(Li) solid-state detector and a low-temperature cryostat (80 K) to measure X-ray diffuse intensity

M. Bessière, S. Lefebvre, Y. Calvayrac, F. Bley and M. Fayard


short communications



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J. Appl. Cryst. (1982). 15, 98-99    [doi:10.1107/S002188988201142X]

The resolving capability of the NaI(Tl) scintillation detector

A. M. Mathieson



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J. Appl. Cryst. (1982). 15, 99-100    [doi:10.1107/S0021889882011431]

A comment on attenuator factors and the dead time of counter systems

A. M. Mathieson



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J. Appl. Cryst. (1982). 15, 100-101    [doi:10.1107/S0021889882011443]

Precise lattice parameter determination of PtHg4

S. K. Lahiri, J. Angilello and M. Natan


crystal data



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J. Appl. Cryst. (1982). 15, 102-103    [doi:10.1107/S0021889882011455]

Crystal data for lanthanum chromate(V)

S. G. Manca and E. J. Baran



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J. Appl. Cryst. (1982). 15, 103-104    [doi:10.1107/S0021889882011467]

Powder data for the solid electrolyte [alpha]-RbCu4Cl3I2

A. Turkovic, B. Grzeta-Plenkovic and B. Etlinger



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J. Appl. Cryst. (1982). 15, 104-105    [doi:10.1107/S0021889882011479]

Crystal data for the decavanadates of pyridine, 2-ethlpyridine and 3-ethylpyridine

J. M. Arrieta, J. M. Amigó and P. Gili



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J. Appl. Cryst. (1982). 15, 106-107    [doi:10.1107/S0021889882011480]

Paramètres, groupe d'espace et diagramme de poudre de l'amino-2 thiazole-1,3

C. Caranoni et L. Capella



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J. Appl. Cryst. (1982). 15, 107-111    [doi:10.1107/S0021889882011492]

An X-ray diffraction study of the system Al2S3-In2S3 in the In-rich region

S. Popovic, B. Grzeta-Plenkovic and B. Etlinger



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J. Appl. Cryst. (1982). 15, 112-114    [doi:10.1107/S0021889882011509]

Crystal data for deacetylpaniculine

M. T. Garland and O. Muñoz



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J. Appl. Cryst. (1982). 15, 114-116    [doi:10.1107/S0021889882011510]

The polymorphism of silver tungstate Ag2WO4

A. J. van den Berg and C. A. H. Juffermans



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J. Appl. Cryst. (1982). 15, 116-119    [doi:10.1107/S0021889882011522]

Crystal data for a new family of phases, Li3Mg2XO6:X=Nb, Ta, Sb

M. Castellanos, J. A. Gard and A. R. West



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J. Appl. Cryst. (1982). 15, 119-120    [doi:10.1107/S0021889882011534]

Crystal data for the monohydrated uranyl bis(dihydrogen phosphate), UO2(H2PO4)2.H2O, and uranyl bis(dihydrogen arsenate), UO2(H2AsO4)2.H2O

H. Barten


computer programs



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J. Appl. Cryst. (1982). 15, 121-122    [doi:10.1107/S0021889882011546]

TERRIG, a computer program for analysing thermal ellipsoids and rigid-body motions

N. Armagan and A. Yücel



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J. Appl. Cryst. (1982). 15, 122-125    [doi:10.1107/S0021889882011558]

A generalized library program for texture calculations with even and odd coefficients

F. Wagner, E. Bechler-Ferry, C. Esling and R. Baro



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J. Appl. Cryst. (1982). 15, 126-129    [doi:10.1107/S002188988201156X]

Indexing asymmetrical Laue photographs: application to echinoid calcite

H. V. Hart and E. A. Rietman



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J. Appl. Cryst. (1982). 15, 129-132    [doi:10.1107/S0021889882011571]

HELP: a Fortran V computer program for obtaining the Cartesian coordinates of a single molecule from its chemical formula

A. Di Nola and E. Brosio



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J. Appl. Cryst. (1982). 15, 132-135    [doi:10.1107/S0021889882011583]

Rapid analytic approximations for disorientation integrals in fiber diffraction

S. W. Provencher and J. Glöckner



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J. Appl. Cryst. (1982). 15, 135-136    [doi:10.1107/S0021889882011595]

A molecular plotting program

R. Radhakrishnan


laboratory notes



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J. Appl. Cryst. (1982). 15, 137    [doi:10.1107/S0021889882011601]

A quick and simple method for orienting cubic single crystals from Laue back-reflection photographs

A. S. Cheng and C. Laird



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J. Appl. Cryst. (1982). 15, 138-139    [doi:10.1107/S0021889882011613]

A fail-safe design for X-ray safety shutters

W. E. Cramer, S. Guggenheim and E. A. Port


crystallographers



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J. Appl. Cryst. (1982). 15, 139    [doi:10.1107/S0021889882011625]

Crystallographers


international union of crystallography



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J. Appl. Cryst. (1982). 15, 139    [doi:10.1107/S0021889882011637]

Division of Acta Crystallographica



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J. Appl. Cryst. (1982). 15, 139    [doi:10.1107/S0021889882011649]

Deposition of Crystal Data


book reviews



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J. Appl. Cryst. (1982). 15, 139-140    [doi:10.1107/S0021889882011650]

Scanning electron microscopy/1980. Parts I and II edited by R. P. Becker and Om. Johari



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J. Appl. Cryst. (1982). 15, 140-141    [doi:10.1107/S0021889882011662]

Characterisation of crystal growth defects by X-ray methods. NATO Advanced Study Institutes Series, Series B: Physics edited by B. K. Tanner and D. K. Bowen



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J. Appl. Cryst. (1982). 15, 141-142    [doi:10.1107/S0021889882011674]

Current topics in materials science, Vols. 5 and 6 edited by E. Kaldis


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