Journal of Applied Crystallography

Volume 15, Part 2 (April 1982)



research papers



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J. Appl. Cryst. (1982). 15, 143-147    [doi:10.1107/S0021889882011686]

Determination of the correlation function directly from slit-smeared small-angle X-ray scattering curves

T. Gerber, G. Walter and R. Kranold



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J. Appl. Cryst. (1982). 15, 148-153    [doi:10.1107/S0021889882011698]

A uniaxial stress apparatus for single-crystal X-ray diffraction on a four-circle diffractometer: application to silicon and diamond

H. d'Armour, W. Denner, H. Schulz and M. Cardona



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J. Appl. Cryst. (1982). 15, 154-159    [doi:10.1107/S0021889882011704]

Determination of internal strain tensors by energy-dispersive X-ray diffraction: Results for Si using the 006 forbidden reflection

C. S. G. Cousins, L. Gerward, J. Staun Olsen, B. Selsmark and B. J. Sheldon



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J. Appl. Cryst. (1982). 15, 160-166    [doi:10.1107/S0021889882011716]

Crystallographic computing on an array processor

W. Furey Jnr, B. C. Wang and M. Sax



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J. Appl. Cryst. (1982). 15, 167-173    [doi:10.1107/S0021889882011728]

The Cambridge Crystallography Subroutine Library

J. C. Matthewman, P. Thompson and P. J. Brown



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J. Appl. Cryst. (1982). 15, 174-181    [doi:10.1107/S002188988201173X]

Lattice modulation in the hexagonal-type antiphase domain structure of Au-33at.%Cd alloy

Y. Watanbe and H. Iwasaki



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J. Appl. Cryst. (1982). 15, 182-189    [doi:10.1107/S0021889882011741]

Examination of errors in the determination of phase boundary thickness by small-angle X-ray scattering

R.-J. Roe



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J. Appl. Cryst. (1982). 15, 190-198    [doi:10.1107/S0021889882011753]

Profile separation in complex powder patterns

S. V. N. Naidu and C. R. Houska



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J. Appl. Cryst. (1982). 15, 199-205    [doi:10.1107/S0021889882011765]

Two new SiC polytypes belonging to the [(44)n43]3 structure family

C. L. Kuo, J. Zhou, H. Q. Ye and K. H. Kuo



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J. Appl. Cryst. (1982). 15, 206-210    [doi:10.1107/S0021889882011777]

A structural study of amorphous Fe4.7Co70.3Si15B10

D. E. G. Williams, H. Fujimori and D. S. Brown



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J. Appl. Cryst. (1982). 15, 211-215    [doi:10.1107/S0021889882011789]

Experimental and computed HREM images of the structure and defects in gadolinium silicate

H.-U. Nissen, A. Kumao, J. Ylä-Jääski and R. Wessicken



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J. Appl. Cryst. (1982). 15, 216-226    [doi:10.1107/S0021889882011790]

Laue photography of fine crystalline particles

I. T. Steinberger, U. Asaf, W. Graeff and Z. H. Kalman



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J. Appl. Cryst. (1982). 15, 227-231    [doi:10.1107/S0021889882011807]

Crystal cooling for protein crystallography with synchrotron radiation

H. D. Bartunik and P. Schubert



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J. Appl. Cryst. (1982). 15, 232-235    [doi:10.1107/S0021889882011819]

An N-pattern display for an SSD X-ray diffractometer

S. Hosoya, T. Sakamaki, Y. Nakano and T. Fukamachi



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J. Appl. Cryst. (1982). 15, 236-240    [doi:10.1107/S0021889882011820]

An X-ray camera for single-crystal studies at high temperatures under controlled atmosphere

W. Aldhart, N. Tzafaras, S. Sueno, H. Jagodzinski and H. Huber



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J. Appl. Cryst. (1982). 15, 241-244    [doi:10.1107/S0021889882011832]

A low-temperature X-ray Weissenberg goniometer with closed-cycle cooling to about 28 K

W. Adlhart and H. Huber


crystal data



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J. Appl. Cryst. (1982). 15, 245-246    [doi:10.1107/S0021889882011844]

Crystal data for two cis-o,o'-azodioxytoluene modifications

M. Azoulay and L. Trysberg



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J. Appl. Cryst. (1982). 15, 247-248    [doi:10.1107/S0021889882011856]

Crystal data for NH(CH3)3GeCl3

A. Möller and J. Felsche



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J. Appl. Cryst. (1982). 15, 248    [doi:10.1107/S0021889882011868]

Crystal powder data of MoGa5(CuS2)0.0556

R. Horyn and R. Andruszkiewicz


crystallographers



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J. Appl. Cryst. (1982). 15, 248-249    [doi:10.1107/S002188988201187X]

Crystallographers


international union of crystallography



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J. Appl. Cryst. (1982). 15, 249    [doi:10.1107/S0021889882011881]

Commission on Journals. Chemical Formulae and Nomenclature



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J. Appl. Cryst. (1982). 15, 249-250    [doi:10.1107/S0021889882011893]

Commission on Journals. Decisions taken at meetings in Ottawa, August 1981



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J. Appl. Cryst. (1982). 15, 250    [doi:10.1107/S002188988201190X]

Fifty Years of Electron Diffraction



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J. Appl. Cryst. (1982). 15, 250    [doi:10.1107/S0021889882011911]

Molecular Structures and Dimensions



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J. Appl. Cryst. (1982). 15, 250    [doi:10.1107/S0021889882011923]

Structure Reports


notes and news



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J. Appl. Cryst. (1982). 15, 250    [doi:10.1107/S0021889882011935]

Seventh Euopean Crystallographic Meeting. Book of Abstracts


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