Journal of Applied Crystallography
Volume 15, Part 2 (April 1982)
J. Appl. Cryst. (1982). 15, 143-147 [doi:10.1107/S0021889882011686]
Determination of the correlation function directly from slit-smeared small-angle X-ray scattering curves
T. Gerber, G. Walter and R. Kranold
J. Appl. Cryst. (1982). 15, 148-153 [doi:10.1107/S0021889882011698]
A uniaxial stress apparatus for single-crystal X-ray diffraction on a four-circle diffractometer: application to silicon and diamond
H. d'Armour, W. Denner, H. Schulz and M. Cardona
J. Appl. Cryst. (1982). 15, 154-159 [doi:10.1107/S0021889882011704]
Determination of internal strain tensors by energy-dispersive X-ray diffraction: Results for Si using the 006 forbidden reflection
C. S. G. Cousins, L. Gerward, J. Staun Olsen, B. Selsmark and B. J. Sheldon
J. Appl. Cryst. (1982). 15, 160-166 [doi:10.1107/S0021889882011716]
Crystallographic computing on an array processor
W. Furey Jnr, B. C. Wang and M. Sax
J. Appl. Cryst. (1982). 15, 167-173 [doi:10.1107/S0021889882011728]
The Cambridge Crystallography Subroutine Library
J. C. Matthewman, P. Thompson and P. J. Brown
J. Appl. Cryst. (1982). 15, 174-181 [doi:10.1107/S002188988201173X]
Lattice modulation in the hexagonal-type antiphase domain structure of Au-33at.%Cd alloy
Y. Watanbe and H. Iwasaki
J. Appl. Cryst. (1982). 15, 182-189 [doi:10.1107/S0021889882011741]
Examination of errors in the determination of phase boundary thickness by small-angle X-ray scattering
R.-J. Roe
J. Appl. Cryst. (1982). 15, 190-198 [doi:10.1107/S0021889882011753]
Profile separation in complex powder patterns
S. V. N. Naidu and C. R. Houska
J. Appl. Cryst. (1982). 15, 199-205 [doi:10.1107/S0021889882011765]
Two new SiC polytypes belonging to the [(44)n43]3 structure family
C. L. Kuo, J. Zhou, H. Q. Ye and K. H. Kuo
J. Appl. Cryst. (1982). 15, 206-210 [doi:10.1107/S0021889882011777]
A structural study of amorphous Fe4.7Co70.3Si15B10
D. E. G. Williams, H. Fujimori and D. S. Brown
J. Appl. Cryst. (1982). 15, 211-215 [doi:10.1107/S0021889882011789]
Experimental and computed HREM images of the structure and defects in gadolinium silicate
H.-U. Nissen, A. Kumao, J. Ylä-Jääski and R. Wessicken
J. Appl. Cryst. (1982). 15, 216-226 [doi:10.1107/S0021889882011790]
Laue photography of fine crystalline particles
I. T. Steinberger, U. Asaf, W. Graeff and Z. H. Kalman
J. Appl. Cryst. (1982). 15, 227-231 [doi:10.1107/S0021889882011807]
Crystal cooling for protein crystallography with synchrotron radiation
H. D. Bartunik and P. Schubert
J. Appl. Cryst. (1982). 15, 232-235 [doi:10.1107/S0021889882011819]
An N-pattern display for an SSD X-ray diffractometer
S. Hosoya, T. Sakamaki, Y. Nakano and T. Fukamachi
J. Appl. Cryst. (1982). 15, 236-240 [doi:10.1107/S0021889882011820]
An X-ray camera for single-crystal studies at high temperatures under controlled atmosphere
W. Aldhart, N. Tzafaras, S. Sueno, H. Jagodzinski and H. Huber
J. Appl. Cryst. (1982). 15, 241-244 [doi:10.1107/S0021889882011832]
A low-temperature X-ray Weissenberg goniometer with closed-cycle cooling to about 28 K
W. Adlhart and H. Huber
J. Appl. Cryst. (1982). 15, 245-246 [doi:10.1107/S0021889882011844]
Crystal data for two cis-o,o'-azodioxytoluene modifications
M. Azoulay and L. Trysberg
J. Appl. Cryst. (1982). 15, 247-248 [doi:10.1107/S0021889882011856]
Crystal data for NH(CH3)3GeCl3
A. Möller and J. Felsche
J. Appl. Cryst. (1982). 15, 248 [doi:10.1107/S0021889882011868]
Crystal powder data of MoGa5(CuS2)0.0556
R. Horyn and R. Andruszkiewicz
J. Appl. Cryst. (1982). 15, 248-249 [doi:10.1107/S002188988201187X]
Crystallographers
J. Appl. Cryst. (1982). 15, 249 [doi:10.1107/S0021889882011881]
Commission on Journals. Chemical Formulae and Nomenclature
J. Appl. Cryst. (1982). 15, 249-250 [doi:10.1107/S0021889882011893]
Commission on Journals. Decisions taken at meetings in Ottawa, August 1981
J. Appl. Cryst. (1982). 15, 250 [doi:10.1107/S002188988201190X]
Fifty Years of Electron Diffraction
J. Appl. Cryst. (1982). 15, 250 [doi:10.1107/S0021889882011911]
Molecular Structures and Dimensions
J. Appl. Cryst. (1982). 15, 250 [doi:10.1107/S0021889882011923]
Structure Reports
J. Appl. Cryst. (1982). 15, 250 [doi:10.1107/S0021889882011935]
Seventh Euopean Crystallographic Meeting. Book of Abstracts
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