Journal of Applied Crystallography

Volume 15, Part 3 (June 1982)



research papers



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J. Appl. Cryst. (1982). 15, 251-254    [doi:10.1107/S0021889882011947]

Characterization of Brazilian high-ash coals by small-angle X-ray diffraction methods

H. J. González, I. L. Torriani and C. A. Luengo



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J. Appl. Cryst. (1982). 15, 255-259    [doi:10.1107/S0021889882011959]

The derivation of the axes of the conventional unit cell from the dimensions of the Buerger-reduced cell

Y. Le Page



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J. Appl. Cryst. (1982). 15, 260-265    [doi:10.1107/S0021889882011960]

Studies of the cation atom distribution in ZnCrxFe2-xO4 spinels using the channeling effect in electron-induced X-ray emission

J. Taftø and Z. Liliental



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J. Appl. Cryst. (1982). 15, 266-274    [doi:10.1107/S0021889882011972]

On `spike' diffuse reflections in electron diffraction patterns of diamonds

N. Sumida and A. R. Lang



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J. Appl. Cryst. (1982). 15, 275-278    [doi:10.1107/S0021889882011984]

Absolute lattice parameter measurements of epitaxial layers

P. F. Fewster



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J. Appl. Cryst. (1982). 15, 279-281    [doi:10.1107/S0021889882011996]

Etude des composés à chaînes aliphatiques. I. Synthèse et caractérisation cristallographique des bis(n-alcanoates) de pipérazinium, 2[CxH2x-1O2-].[C4H12N22+]

F. Brisse, J. Denault et J.-P. Sangin



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J. Appl. Cryst. (1982). 15, 282-288    [doi:10.1107/S002188988201200X]

Study of the ordered structures of the Au-Mn system by high voltage-high-resolution electron microscopy. III. Two-dimensional antiphase structure of Au3Mn type

O. Terasaki and D. Watanabe



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J. Appl. Cryst. (1982). 15, 289-300    [doi:10.1107/S0021889882012011]

Information content and retrieval in solution scattering studies. I. Degrees of freedom and data reduction

D. Taupin and V. Luzzati



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J. Appl. Cryst. (1982). 15, 301-307    [doi:10.1107/S0021889882012023]

Study of adsorption on powders by surface differential diffraction measurements. Argon on Co3O4

J. P. Beaufils and Y. Barbaux



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J. Appl. Cryst. (1982). 15, 308-314    [doi:10.1107/S0021889882012035]

Use of the Voigt function in a single-line method for the analysis of X-ray diffraction line broadening

Th. H. de Keijser, J. I. Langford, E. J. Mittemeijer and A. B. P. Vogels



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J. Appl. Cryst. (1982). 15, 315-322    [doi:10.1107/S0021889882012047]

The variance as a measure of line broadening: corrections for truncation, curvature and instrumental effects

J. I. Langford



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J. Appl. Cryst. (1982). 15, 323-329    [doi:10.1107/S0021889882012059]

Reduction in a niobium tungsten bronze, 2Nb2O5.7WO3, studied by 1 MV HRTEM

S. Horiuchi



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J. Appl. Cryst. (1982). 15, 330-337    [doi:10.1107/S0021889882012060]

Macromolecular crystallography with synchrotron radiation: photographic data collection and polarization correction

R. Kahn, R. Fourme, A. Gadet, J. Janin, C. Dumas and D. André



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J. Appl. Cryst. (1982). 15, 338-351    [doi:10.1107/S0021889882012072]

Oscillation camera data processing: reflecting range and prediction of partiality. I. Conventional X-ray sources

T. J. Greenhough and J. R. Helliwell


short communications



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J. Appl. Cryst. (1982). 15, 352    [doi:10.1107/S0021889882012084]

Absorption effects from surface miscut in reflection diffractometry

C. B. Walker


crystal data



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J. Appl. Cryst. (1982). 15, 353-354    [doi:10.1107/S0021889882012096]

Crystal data for 3Al2O3.4SO3.8H2O

J. Ossaka, J. Hirabayashi, K. Okada and J. Harada



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J. Appl. Cryst. (1982). 15, 354-355    [doi:10.1107/S0021889882012102]

Données cristallographiques de la dihydro-10,11 (quinuclidinyl 3)-5-5H-dibenzo[b, f]azépine (quinupramine)

J. P. Reboul, B. Cristau, C. Caranoni et L. Capella


laboratory notes



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J. Appl. Cryst. (1982). 15, 356-357    [doi:10.1107/S0021889882012114]

Conception et réalisation d'un dispositif de refroidissement par effet Peltier destiné à la diffractométrie X de poudres cristallines

R. Auby, P. Bregeaut et M. Massaux



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J. Appl. Cryst. (1982). 15, 357    [doi:10.1107/S0021889882012126]

A technique for loading glass capillaries used in X-ray powder diffraction

F. F. Foit Jnr


letters to the editor



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J. Appl. Cryst. (1982). 15, 357-359    [doi:10.1107/S0021889882012138]

Suggested guidelines for the publication of Rietveld analyses and pattern decomposition studies

R. A. Young, E. Prince and R. A. Sparks


crystallographers



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J. Appl. Cryst. (1982). 15, 359    [doi:10.1107/S002188988201214X]

Crystallographers


international union of crystallography



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J. Appl. Cryst. (1982). 15, 359    [doi:10.1107/S0021889882012151]

Structure Reports


book reviews



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J. Appl. Cryst. (1982). 15, 359-360    [doi:10.1107/S0021889882012163]

Advances in X-ray analysis, Vol. 24 edited by D. K. Smith, C. S. Barrett, D. E. Leyden and P. K. Predecki



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J. Appl. Cryst. (1982). 15, 360    [doi:10.1107/S0021889882012175]

Quantitative X-ray spectrometry by R. Jenkins, R. W. Gould and D. Gedcke


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