Journal of Applied Crystallography

Volume 15, Part 4 (August 1982)

• lead articles
• research papers
• short communications
• crystal data
• computer programs
• laboratory notes
• crystallographers
• international union of crystallography
• book reviews

lead articles

J. Appl. Cryst. (1982). 15, 361-374    [doi:10.1107/S0021889882012187]

The Rietveld method in neutron and X-ray powder diffraction

A. Albinati and B. T. M. Willis

research papers

J. Appl. Cryst. (1982). 15, 375-377    [doi:10.1107/S0021889882012199]

Precise lattice-constant determinations using measured beam and crystal tilts

M. Nemiroff

J. Appl. Cryst. (1982). 15, 378-381    [doi:10.1107/S0021889882012205]

The cation-atom distribution in a (Cr, Fe, Al, Mg)₃O₄ spinel as revealed from the channelling effect in electron-induced X-ray emission

J. Taftø

J. Appl. Cryst. (1982). 15, 382-387    [doi:10.1107/S0021889882012217]

A microprocessor-controlled continuous-flow cryostat for single-crystal X-ray diffraction in the range 10-300 K

S. Allen, J. Cosier, A. M. Glazer, T. J. Hastings, D. T. Smith and I. G. Wood

J. Appl. Cryst. (1982). 15, 388-390    [doi:10.1107/S0021889882012229]

Noise level and resolution effects in EXAFS spectra

T. I. Morrison, G. K. Shenoy and D. Niarchos

J. Appl. Cryst. (1982). 15, 391-395    [doi:10.1107/S0021889882012230]

Ultra-high vacuum heating camera for in situ synchrotron radiation X-ray topographic studies

J. Gastaldi, C. Jourdan, P. Marzo, C. Allasia and J. N. Jullien

J. Appl. Cryst. (1982). 15, 396-398    [doi:10.1107/S0021889882012242]

On the topography of chemically etched (00) surfaces of ZnO

J. O. Cope

J. Appl. Cryst. (1982). 15, 399-401    [doi:10.1107/S0021889882012254]

Kinetic measurement of autoxidation in carotenoids by X-ray diffraction: a new, rapid, and reliable method

E. Abad

J. Appl. Cryst. (1982). 15, 402-405    [doi:10.1107/S0021889882012266]

Specimen preparation of low-melting-point solidified gases for low-temperature powder diffractometry

E. Arzi

J. Appl. Cryst. (1982). 15, 406-411    [doi:10.1107/S0021889882012278]

The evaluation of crystal perfection by means of the asymmetric Bragg reflections

M. Wolcyrz and K. Lukaszewicz

J. Appl. Cryst. (1982). 15, 412-416    [doi:10.1107/S002188988201228X]

A high-temperature deformation stage for X-ray synchrotron topography. Applications to dislocation mechanisms in silicon

A. George and G. Michot

J. Appl. Cryst. (1982). 15, 417-422    [doi:10.1107/S0021889882012291]

Sur l'origine des canaux dans les cristaux

E. Scandale et A. Zarka

J. Appl. Cryst. (1982). 15, 423-429    [doi:10.1107/S0021889882012308]

Determination of the strain concentration factors around holes and inclusions in crystals by X-ray topography

J. Chaudhuri, Z. H. Kalman, G. J. Weng and S. Weissmann

J. Appl. Cryst. (1982). 15, 430-438    [doi:10.1107/S002188988201231X]

Profile shape functions in Rietveld refinements

R. A. Young and D. B. Wiles

J. Appl. Cryst. (1982). 15, 439-442    [doi:10.1107/S0021889882012321]

Interactive computer display and analysis of small-molecule crystal structures

S. M. Swanson, R. E. Rosenfield Jnr and E. F. Meyer Jnr

J. Appl. Cryst. (1982). 15, 443-448    [doi:10.1107/S0021889882012333]

Small-angle scattering at a pulsed neutron source: comparison with a steady-state reactor

C. S. Borso, J. M. Carpenter, F. S. Williamson, G. L. Holmblad, M. H. Mueller, J. Faber Jnr, J. E. Epperson and S. S. Danyluk

J. Appl. Cryst. (1982). 15, 449-451    [doi:10.1107/S0021889882012345]

Addenda to the optimization of quantitative X-ray diffraction analysis

P. Szabó

J. Appl. Cryst. (1982). 15, 452-460    [doi:10.1107/S0021889882012357]

Structural ordering in amorphous TbFe₂ and YFe₂

P. D'Antonio, J. H. Konnert, J. J. Rhyne and C. R. Hubbard

short communications

J. Appl. Cryst. (1982). 15, 461-462    [doi:10.1107/S0021889882012369]

Thermal expansion of -HgI₂

S. Gauthier and I. F. Nicolau

crystal data

J. Appl. Cryst. (1982). 15, 462-463    [doi:10.1107/S0021889882012370]

Etude de la solution solide (CH₃)₄N.Mn_1-xCu_xCl₃ (x=0-0,5)

A. Cheikh-Rouhou and A. Daoud

computer programs

J. Appl. Cryst. (1982). 15, 464-467    [doi:10.1107/S0021889882012382]

Computer program for the derivation of symmetry operations from the space-group symbols

H. Burzlaff and A. Hountas

J. Appl. Cryst. (1982). 15, 467-468    [doi:10.1107/S0021889882012394]

Interactive dynamic molecular display

C. L. Nix and B. Rubin

laboratory notes

J. Appl. Cryst. (1982). 15, 469    [doi:10.1107/S0021889882012400]

A goniometer for large single crystals

H. Shaham

crystallographers

J. Appl. Cryst. (1982). 15, 469-470    [doi:10.1107/S0021889882012412]

Crystallographers

international union of crystallography

J. Appl. Cryst. (1982). 15, 470    [doi:10.1107/S0021889882012424]

Bibliography of Mathematical Crystallography

book reviews

J. Appl. Cryst. (1982). 15, 470    [doi:10.1107/S0021889882012436]

Nondestructive evaluation of materials edited by J. J. Burke and V. Weiss

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