Journal of Applied Crystallography

Volume 15, Part 4 (August 1982)



lead articles



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J. Appl. Cryst. (1982). 15, 361-374    [doi:10.1107/S0021889882012187]

The Rietveld method in neutron and X-ray powder diffraction

A. Albinati and B. T. M. Willis


research papers



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J. Appl. Cryst. (1982). 15, 375-377    [doi:10.1107/S0021889882012199]

Precise lattice-constant determinations using measured beam and crystal tilts

M. Nemiroff



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J. Appl. Cryst. (1982). 15, 378-381    [doi:10.1107/S0021889882012205]

The cation-atom distribution in a (Cr, Fe, Al, Mg)3O4 spinel as revealed from the channelling effect in electron-induced X-ray emission

J. Taftø



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J. Appl. Cryst. (1982). 15, 382-387    [doi:10.1107/S0021889882012217]

A microprocessor-controlled continuous-flow cryostat for single-crystal X-ray diffraction in the range 10-300 K

S. Allen, J. Cosier, A. M. Glazer, T. J. Hastings, D. T. Smith and I. G. Wood



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J. Appl. Cryst. (1982). 15, 388-390    [doi:10.1107/S0021889882012229]

Noise level and resolution effects in EXAFS spectra

T. I. Morrison, G. K. Shenoy and D. Niarchos



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J. Appl. Cryst. (1982). 15, 391-395    [doi:10.1107/S0021889882012230]

Ultra-high vacuum heating camera for in situ synchrotron radiation X-ray topographic studies

J. Gastaldi, C. Jourdan, P. Marzo, C. Allasia and J. N. Jullien



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J. Appl. Cryst. (1982). 15, 396-398    [doi:10.1107/S0021889882012242]

On the topography of chemically etched (00\overline{1}) surfaces of ZnO

J. O. Cope



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J. Appl. Cryst. (1982). 15, 399-401    [doi:10.1107/S0021889882012254]

Kinetic measurement of autoxidation in carotenoids by X-ray diffraction: a new, rapid, and reliable method

E. Abad



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J. Appl. Cryst. (1982). 15, 402-405    [doi:10.1107/S0021889882012266]

Specimen preparation of low-melting-point solidified gases for low-temperature powder diffractometry

E. Arzi



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J. Appl. Cryst. (1982). 15, 406-411    [doi:10.1107/S0021889882012278]

The evaluation of crystal perfection by means of the asymmetric Bragg reflections

M. Wolcyrz and K. Lukaszewicz



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J. Appl. Cryst. (1982). 15, 412-416    [doi:10.1107/S002188988201228X]

A high-temperature deformation stage for X-ray synchrotron topography. Applications to dislocation mechanisms in silicon

A. George and G. Michot



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J. Appl. Cryst. (1982). 15, 417-422    [doi:10.1107/S0021889882012291]

Sur l'origine des canaux dans les cristaux

E. Scandale et A. Zarka



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J. Appl. Cryst. (1982). 15, 423-429    [doi:10.1107/S0021889882012308]

Determination of the strain concentration factors around holes and inclusions in crystals by X-ray topography

J. Chaudhuri, Z. H. Kalman, G. J. Weng and S. Weissmann



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J. Appl. Cryst. (1982). 15, 430-438    [doi:10.1107/S002188988201231X]

Profile shape functions in Rietveld refinements

R. A. Young and D. B. Wiles



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J. Appl. Cryst. (1982). 15, 439-442    [doi:10.1107/S0021889882012321]

Interactive computer display and analysis of small-molecule crystal structures

S. M. Swanson, R. E. Rosenfield Jnr and E. F. Meyer Jnr



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J. Appl. Cryst. (1982). 15, 443-448    [doi:10.1107/S0021889882012333]

Small-angle scattering at a pulsed neutron source: comparison with a steady-state reactor

C. S. Borso, J. M. Carpenter, F. S. Williamson, G. L. Holmblad, M. H. Mueller, J. Faber Jnr, J. E. Epperson and S. S. Danyluk



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J. Appl. Cryst. (1982). 15, 449-451    [doi:10.1107/S0021889882012345]

Addenda to the optimization of quantitative X-ray diffraction analysis

P. Szabó



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J. Appl. Cryst. (1982). 15, 452-460    [doi:10.1107/S0021889882012357]

Structural ordering in amorphous TbFe2 and YFe2

P. D'Antonio, J. H. Konnert, J. J. Rhyne and C. R. Hubbard


short communications



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J. Appl. Cryst. (1982). 15, 461-462    [doi:10.1107/S0021889882012369]

Thermal expansion of [alpha]-HgI2

S. Gauthier and I. F. Nicolau


crystal data



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J. Appl. Cryst. (1982). 15, 462-463    [doi:10.1107/S0021889882012370]

Etude de la solution solide (CH3)4N.Mn1-xCuxCl3 (x=0-0,5)

A. Cheikh-Rouhou and A. Daoud


computer programs



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J. Appl. Cryst. (1982). 15, 464-467    [doi:10.1107/S0021889882012382]

Computer program for the derivation of symmetry operations from the space-group symbols

H. Burzlaff and A. Hountas



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J. Appl. Cryst. (1982). 15, 467-468    [doi:10.1107/S0021889882012394]

Interactive dynamic molecular display

C. L. Nix and B. Rubin


laboratory notes



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J. Appl. Cryst. (1982). 15, 469    [doi:10.1107/S0021889882012400]

A goniometer for large single crystals

H. Shaham


crystallographers



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J. Appl. Cryst. (1982). 15, 469-470    [doi:10.1107/S0021889882012412]

Crystallographers


international union of crystallography



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J. Appl. Cryst. (1982). 15, 470    [doi:10.1107/S0021889882012424]

Bibliography of Mathematical Crystallography


book reviews



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J. Appl. Cryst. (1982). 15, 470    [doi:10.1107/S0021889882012436]

Nondestructive evaluation of materials edited by J. J. Burke and V. Weiss


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