Journal of Applied Crystallography

Volume 15, Part 5 (October 1982)



research papers



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J. Appl. Cryst. (1982). 15, 471-475    [doi:10.1107/S0021889882012448]

X-ray powder diffraction of [beta]-aluminas

V. Massarotti, G. Campari-Vigano, G. Flor, A. Marini, G. C. Farrington and M. Villa



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J. Appl. Cryst. (1982). 15, 476-481    [doi:10.1107/S002188988201245X]

The three-dimensional structure of a human IgGl immunoglobulin at 4 Å resolution: a computer fit of various structural domains on the electron density map

R. Sarma and A. G. Laudin



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J. Appl. Cryst. (1982). 15, 482-487    [doi:10.1107/S0021889882012461]

X-ray diffraction study of aqueous SrCl2 solutions

R. Caminiti, A. Musinu, G. Paschina and G. Pinna



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J. Appl. Cryst. (1982). 15, 488-492    [doi:10.1107/S0021889882012473]

Polymorphism in silver thiocyanate: preparation of a new phase and its chaacterization by X-ray powder diffraction

D. L. Smith, J. E. Maskasky and L. R. Spaulding



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J. Appl. Cryst. (1982). 15, 493-508    [doi:10.1107/S0021889882012485]

Oscillation camera data processing: reflecting range and prediction of partiality. 2. Monochromatized synchrotron X-radiation from a singly bent triangular monochromator

T. J. Greenhough and J. R. Helliwell



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J. Appl. Cryst. (1982). 15, 509-512    [doi:10.1107/S0021889882012497]

Recording and calculation of hk rod intensities in case of diffraction by highly oriented powders of lamellar samples

A. Plançon, F. Rousseaux, D. Tchoubar, C. Tchoubar, G. Krinari and V. A. Drits



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J. Appl. Cryst. (1982). 15, 513-523    [doi:10.1107/S0021889882012503]

A new minicomputer search/match/identify program for qualitative phase analysis with the powder diffractometer

W. N. Schreiner, C. Surdukowski and R. Jenkins



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J. Appl. Cryst. (1982). 15, 524-530    [doi:10.1107/S0021889882012515]

A probability-based socring technique for phase identification in X-ray powder diffraction

W. N. Schreiner, C. Surdukowski and R. Jenkins



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J. Appl. Cryst. (1982). 15, 531-536    [doi:10.1107/S0021889882012527]

A test for the computer-aided generation of the Cambridge Connectivity Files

T. Higashi and K. Osaki



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J. Appl. Cryst. (1982). 15, 537-539    [doi:10.1107/S0021889882012539]

A computer program for refinement of crystal orientation matrix and lattice constants from diffractometer data with lattice symmetry constraints

R. L. Ralph and L. W. Finger



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J. Appl. Cryst. (1982). 15, 540-541    [doi:10.1107/S0021889882012540]

Non-centrosymmetry tests for potassium feldspars: an application of the second-harmonic generator technique

J. A. Zilczer and G. M. Loiacono



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J. Appl. Cryst. (1982). 15, 542-545    [doi:10.1107/S0021889882012552]

Indexation automatique des diagrammes de poudre par dichotomies successives

D. Louër et R. Vargas



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J. Appl. Cryst. (1982). 15, 546-557    [doi:10.1107/S0021889882012564]

The use of continuous diffraction data as a phase constraint. II. Application to fiber diffraction data

L. Makowski



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J. Appl. Cryst. (1982). 15, 558-563    [doi:10.1107/S0021889882012576]

Microdeformation of [111] iron whiskers

M. Surowiec and G. Champier



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J. Appl. Cryst. (1982). 15, 564-566    [doi:10.1107/S0021889882012588]

Aggregation of clay particles as indicated by indirect transforms of small-angle scattering data

C. W. Dwiggins Jnr



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J. Appl. Cryst. (1982). 15, 567-569    [doi:10.1107/S002188988201259X]

Interpretation of small-angle scattering curves proportional to a negative power of the scattering vector

P. W. Schmidt


short communications



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J. Appl. Cryst. (1982). 15, 570-571    [doi:10.1107/S0021889882012606]

A novel method for indexing multiple diffraction peaks

F.-S. Han and S.-L. Chang



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J. Appl. Cryst. (1982). 15, 571-573    [doi:10.1107/S0021889882012618]

A method to increase protein-crystal lifetime during X-ray exposure

S. V. L. Narayana, M. S. Weininger, K. L. Heuss and P. Argos


crystal data



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J. Appl. Cryst. (1982). 15, 573-574    [doi:10.1107/S002188988201262X]

Crystal chemical data on RbLn(SeO4)2, where Ln=La, Ce, Pr or Nd

M. A. Nabar and V. R. Ajgaonkar



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J. Appl. Cryst. (1982). 15, 574-576    [doi:10.1107/S0021889882012631]

Crystal data for the fluoroalleghanyite series nMn2SiO4MnF2(1,n<4)

T. J. White


laboratory notes



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J. Appl. Cryst. (1982). 15, 577    [doi:10.1107/S0021889882012643]

A systematic method for aligning double-focusing mirrors

W. C. Phillips and I. Rayment


crystallographers



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J. Appl. Cryst. (1982). 15, 577    [doi:10.1107/S0021889882012655]

Crystallographers


notes and news



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J. Appl. Cryst. (1982). 15, 577-578    [doi:10.1107/S0021889882012667]

Notes and News


book reviews



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J. Appl. Cryst. (1982). 15, 578    [doi:10.1107/S0021889882012679]

Diffraction for materials scientists by J. M. Schulz



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J. Appl. Cryst. (1982). 15, 579    [doi:10.1107/S0021889882012680]

Mössbauer spectroscopy and its chemical applications edited by J. G. Stevens and G. K. Shenoy



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J. Appl. Cryst. (1982). 15, 579    [doi:10.1107/S0021889882012692]

Chemical vapor deposition 1960-1980, a bibliography edited by D. T. Hawkins



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J. Appl. Cryst. (1982). 15, 579-580    [doi:10.1107/S0021889882012709]

Neutron transmutation doped silicon edited by J. Guldberg


books received



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J. Appl. Cryst. (1982). 15, 580    [doi:10.1107/S0021889882012710]

Japan Annual Reviews in Electronics, Computers and Telecommunications


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