Journal of Applied Crystallography
Volume 15, Part 6 (December 1982)
J. Appl. Cryst. (1982). 15, 581-589 [doi:10.1107/S0021889882012722]
Rietveld refinement with spallation neutron powder diffraction data
R. B. Von Dreele, J. D. Jorgensen and C. G. Windsor
J. Appl. Cryst. (1982). 15, 590-593 [doi:10.1107/S0021889882012734]
Etude cristallographique de la phase de transition M'' dans Al-8%Zn-1%Mg
C. Régnier, J. Bouvaist et J. P. Simon
J. Appl. Cryst. (1982). 15, 594-601 [doi:10.1107/S0021889882012746]
Determination of notch-tip plasticity by X-ray diffraction and comparison to continuum mechanics analysis
H. Y. Liu, G. J. Weng and S. Weissmann
J. Appl. Cryst. (1982). 15, 602-604 [doi:10.1107/S0021889882012758]
Accurate separation of X-ray ![[alpha]](/logos/entities/alpha_rmgif.gif)
1-2 doublets by the `substitution method'
F. Pompa and S. Zirilli
J. Appl. Cryst. (1982). 15, 605-610 [doi:10.1107/S002188988201276X]
An approach to the isotypical and solid solution problems in multiphase X-ray analysis
W. N. Schreiner, C. Surdukowski and R. Jenkins
J. Appl. Cryst. (1982). 15, 611-614 [doi:10.1107/S0021889882012771]
Time-of-flight neutron small-angle scattering from a superconducting composite wire
K. Osamura, H. Tsunekawa, Y. Murakami, M. Ono, H. Yoshida, S. Okamoto, Y. Monju and T. Fukuzuka
J. Appl. Cryst. (1982). 15, 615-620 [doi:10.1107/S0021889882012783]
The approximation of asymmetric neutron powder diffraction peaks by sums of Gaussians
C. J. Howard
J. Appl. Cryst. (1982). 15, 621-625 [doi:10.1107/S0021889882012795]
The sulphate ion in aqueous solution: an X-ray diffraction study of a ZnSO4 solution
A. Musinu, G. Paschina, G. Piccaluga and M. Magini
J. Appl. Cryst. (1982). 15, 626-631 [doi:10.1107/S0021889882012801]
A coordinate X-ray diffractometer based on a two-dimensional proportional chamber and a two-circle goniometer
M. E. Andrianova, D. M. Kheiker, A. N. Popov, V. I. Simonov, Y. S. Anisimov, S. P. Chernenko, A. B. Ivanov, S. A. Movchan, V. D. Peshekhonov and Y. V. Zanevsky
J. Appl. Cryst. (1982). 15, 632 [doi:10.1107/S0021889882012825]
Ultra-high-vacuum heating camera for in situ synchrotron radiation X-ray topographic studies: erratum
J. Gastaldi, C. Jourdan, P. Marzo, C. Allasia and J. N. Jullien
J. Appl. Cryst. (1982). 15, 632-635 [doi:10.1107/S0021889882012813]
New crystal data of some solid transition-metal complexes
M. M. Abou Sekkina, T. M. Salem, M. F. El-Shazly and A. El-Dissouky
J. Appl. Cryst. (1982). 15, 635-636 [doi:10.1107/S0021889882012837]
Crystal data for high-temperature dicalcium lead propionate, Ca2Pb(CH3CH2COO)6
A. M. Shaikh and V. Dhar
J. Appl. Cryst. (1982). 15, 636-637 [doi:10.1107/S0021889882012849]
Simple stereoscopic representation of protein active sites using van der Waals potential contour levels
E. Surcouf, A. Rimsky and J.-P. Mornon
J. Appl. Cryst. (1982). 15, 638 [doi:10.1107/S0021889882012850]
Crystallographers
J. Appl. Cryst. (1982). 15, 638-639 [doi:10.1107/S0021889882012862]
Prices of Acta Crystallographica and Journal of Applied Crystallography
J. Appl. Cryst. (1982). 15, 639 [doi:10.1107/S0021889882012874]
Notes and News
J. Appl. Cryst. (1982). 15, 639 [doi:10.1107/S0021889882012886]
Crystals: growth, properties and applications. Vol. 5. Silicon edited by J. Grabmaier
J. Appl. Cryst. (1982). 15, 640-676 [doi:10.1107/S0021889882012898]
Current Crystallographic Books 1970 through 1981
J. Appl. Cryst. (1982). 15, 677-682
Subject index to volume 15 (1982)
J. Appl. Cryst. (1982). 15, 683-688
Author index to volume 15 (1982)
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